A non-volatile random access memory cell which, on a substrate surmounted by a stack of layers, comprises:
a first plurality of transistors situated at a given level of the stack of which at least one first access transistor and at least one second access transistor, which are arranged between a first bit line and a first storage node, and between a second bit line and a second storage node, respectively, the first access transistor and the second access transistor having a gate connected to a word line,
a second plurality of transistors forming a flip-flop and situated at, at least one other level of the stack, beneath said given level,
the transistors of the second plurality of transistors each comprising a gate electrode situated opposite a channel region of a transistor of the first plurality of transistors and separated from this channel region by means of an insulating region provided to enable coupling of said gate electrode and said channel region.