5 results about "Resonator mode" patented technology

A filter manufacturing method and a filter manufactured by the filter manufacturing method are disclosed. The filter manufacturing method includes designating a use mode in a resonator to a first resonance mode, in response to designating to the first resonance mode, setting a band selected from a designated first frequency band to a passband in the resonator, switching the use mode in the resonator from the first resonance mode to a second resonator mode, in response to switching to the second resonance mode, setting a band selected from the first frequency band except for the passband to a stopband in the resonator, and manufacturing a primary filter including the resonator to which the passband and the stopband are set.

The application discloses a passive optical resonant cavity mode matching method based on an additional external cavity, and comprises the following steps: establishing a resonant cavity theoretical model based on actual requirements of a required resonant cavity; the resonant cavity comprises an incident end cavity mirror and an emission end cavity mirror; the radius of collimated laser of the incident resonant cavity is determined according to the resonant cavity theoretical model; the image sensor is used to observe the light spot center of the transmitted light beam passing through the incident end cavity mirror, and the incident end cavity mirror is adjusted to be coaxial with the incident light beam; a resonant cavity is built by a partial mirror and the incident end cavity mirror to obtain an additional external cavity; the position of the incident end cavity mirror is adjusted by using the additional external cavity to realize the matching of the wavefront of the incident light beam and the surface curvature of the incident end cavity mirror; the image sensor is used to observe the resonant cavity transmission light mode image, and the position of the emission end cavity mirror is adjusted to realize the resonant cavity mode matching. The method can accurately judge the wavefront matching condition of the resonant cavity mirror surface by constructing an additional resonant cavity; the sequence of optical path adjustment is clear, and the mode matching process is simple and efficient.

Described herein is Complex Dielectric Constant Sensor (CDCS) incorporating microstrip based radial stub and open circuit stub pair structures that utilize interference coupling between degenerate EIT modes to detect CDC of sample-under-test (SUT). In at least one embodiment, CDCS generates two distinct EIT modes when sensor is unloaded. In at least one embodiment, coupling between resonator modes and interaction of electromagnetic fields with material is affected indicating presence of dielectric sample. In at least one embodiment, two EIT modes become degenerate, causing cancellation and suppressing transparency window when dielectric constant of SUT matches a specific value. In at least one embodiment, CDCS can detect slight changes in complex dielectric properties of SUT. In at least one embodiment, CDCS can characterize materials such as substrate samples based on their CDCs for design and characterization of microwave devices, antennas, and thin film devices.

A high-conversion-efficiency integrated frequency comb device (100; 200; 310a – 310c) comprises at least one micro-resonator (120; 220) configured to receive pump laser light from at least one pump laser source, convert at least partially the received pump laser light for generating a laser frequency comb, and output frequency comb light based on the produced laser frequency comb. The micro-resonator (120; 220) comprises at least one closed-circuit waveguide (122; 222) integrated in a semi-conductor topography of the micro-resonator (120; 220). The closed-circuit waveguide (122; 222) comprises at least one structure for producing periodic perturbation (124; 224) configured to produce mode hybridization via coupling of forwards and backwards travelling modes in the closed-circuit waveguide (122; 222) by means of rapid, in particular sub-wavelength, modulation of a propagation constant of light propagating in the closed-circuit waveguide (122; 222). The structure for producing periodic perturbation (124; 224) has been designed with respect to at least one of an intended width, in terms of comb lines, of the frequency comb and / or an intended intensity distribution within a target width, in terms of comb lines, of the frequency comb, based at least partially on the stipulation that a dispersion-loss operator to achieve an ideally flat microcomb according to an exact solution of a generalized Lugiato-Lefever Equation exists in the form [iD+K], and, as a function of resonator mode index μ, the dispersion-loss operator takes the following generic form: wherein a, b, c, d 3 ... d ∞ , h, p, q, r, s, u 3 , u ∞ are constants, and μ ≤ N / 2 for N being the number of intended comb lines apart from a potential comb line corresponding to the pump laser light.

The application provides a resonator capacitance medium charge accumulation effect characterization method and device, comprising obtaining a regular, stable frequency signal and angle signal output in a stable angular velocity self-precession state of a resonator mode shape; Fourier fitting is performed on the frequency signal and the change of the angle signal every fixed time to obtain a fitting waveform corresponding to the fixed time period; the highest frequency point and the lowest frequency point in the fitting waveform of each fixed time period are obtained to determine the frequency difference between the highest frequency point and the lowest frequency point in each fixed time period; the characterization of the stiffness change in the resonator is completed based on the change relationship between the frequency difference and the applied stiffness in the resonator dynamics model; and the relationship between the equivalent bias voltage generated by the charge accumulation and the equivalent electrostatic negative stiffness generated by the charge accumulation is obtained according to the negative stiffness effect. The method can accurately characterize the change characteristics of the charge accumulation in the charging and discharging process of the capacitance medium.