8results about How to "Solving undetectable" patented technology

The present application discloses a method, device and readable storage medium for detecting risks of rich text documents, which are used to solve the problem of inaccurate methods for detecting risks of rich text documents in the prior art. The method comprises: locating a first data stream in a rich text document; wherein the first data stream is data between a start symbol before a set first control word and an end symbol matching the start symbol; reading a read bit attribute of a control word in the first data stream, deleting or retaining data after the control word in the first data stream based on the read bit attribute, and obtaining first data; wherein, when the read bit attribute is deletion, it indicates deleting data after the corresponding control word to the next adjacent control word; and determining that the rich text document is at risk based on embedded objects or links in the first data.

This invention relates to the field of in-situ monitoring technology for semiconductor thin film growth and etching processes, and discloses an in-situ laser interferometry thickness monitoring method and apparatus for low-rate epitaxy processes. The invention acquires the reflected light intensity signal of the target thin film and obtains the dynamic envelope function of the reflected light intensity signal under the current measurement conditions. When the reflected light intensity signal is in the middle phase region of the dynamic envelope function, the low-rate etching or low-rate growth stage to be measured is entered. During the low-rate etching or low-rate growth stage, the original thickness sequence is obtained. Based on the monotonic physical constraint of film thickness change, the true thickness curve of the target thin film is obtained. Under low-rate epitaxy conditions, this invention achieves continuous thickness measurement and rate extraction when the film thickness change is less than one complete oscillation cycle through dynamic envelope inversion and monotonic physical constraint recovery.

The utility model provides an engineering nondestructive testing device, which relates to the technical field of engineering and comprises an integral structure and supporting structures, and the supporting structures are positioned at the front and rear positions of the two sides of the bottom of the integral structure; the overall structure comprises a bottom plate, supports are fixedly connected to the front position and the rear position of the top of the bottom plate, sliding blocks are connected to the centers of the inner surfaces of the supports in a sliding mode, connecting plates are fixedly connected to the opposite sides of the two sliding blocks, and frames are fixedly connected to the front position and the rear position of the bottom of the bottom plate. Through mutual cooperation of a control panel, a servo motor, a belt pulley, a belt body, a threaded rod and a sliding block, the height of the high-frequency radar can be reasonably controlled, the height can be adjusted, the problem that the middle of a high building cannot be detected can be solved, and in the up-and-down moving process, through cooperation of the high-frequency radar and the high-frequency radar, the height of the high-frequency radar can be adjusted. Multi-point detection can be carried out on the building.

The invention discloses a wave-absorbing honeycomb material arc on-machine detection device and method.The wave-absorbing honeycomb material arc on-machine detection device comprises a scanning device and a workpiece assembling device, the scanning device is provided with a laser transmitter and a data transmission system, the upper portion and the lower portion of the laser transmitter are each provided with a binocular camera and a light supplementing lamp, and the input end of the data transmission system is electrically connected with the cameras; the output end of the data transmission system is connected with the receiving end through a data transmission socket; and the workpiece assembling device is used for providing the workpieces subjected to shape numerical milling. Compared with a traditional honeycomb detection method, the three-dimensional scanning mode can be used for detecting some places which cannot be detected by the traditional detection method, such as areas with the arc tip radius smaller than 2 mm.

The utility model belongs to glass detection technical field relates to a glass surface stress measuring device, including stress analyzer, still include fixed plate, be equipped with with stress analyzer corresponding placement mouth, supporting block and baffle on fixed plate, be equipped with elastic assembly between baffle and fixed plate, fixed plate bottom is equipped with fixed component. The utility model's stress analyzer can be fixed on the facade glass, the inclined glass or the glass with the camber and carries out the detection, does not need manual hand to hold to press and waits for the detection analysis result to wait for the detection, thereby reduces the problem of the inaccurate detection caused by manual operation, when detecting the glass of higher position, only need to fix it on the glass to wait for the detection, solves the problem that a single person is inconvenient to detect the installed glass stress value and the higher position glass cannot detect.

This invention discloses an improved circuit structure for a USB-C interface device. The structure includes a CPU, a USB-C protocol chip, a USB-C connector, a non-standard detection circuit module, and a power switch SW1. The USB-C protocol chip determines whether the insertion / removal is in master or slave mode by detecting the voltages CC1 and CC2 in the USB-C connector, and communicates with the CPU via an I2C signal bus. After a non-standard USB-C cable is inserted, the non-standard detection circuit module provides additional logic for determining the voltages CC1 and CC2 in the USB-C connector and outputs a non-standard detection control signal to control the opening and closing of the power switch SW1. This structure allows non-standard USB-C cables to be recognized by the USB-C protocol chip just like standard USB-C cables, avoiding the need for customers to remember which specific terminal devices these outwardly identical but internally incompatible USB-C cables can only be used with.

The invention discloses a through-silicon-via measuring device based on white light interference technology, and particularly relates to the technical field of through-silicon-via measuring equipment.The through-silicon-via measuring device comprises a shell, a moving part is arranged at the bottom of an inner cavity of the shell, a mounting table is arranged on the upper portion of the moving part, and the upper end of the mounting table is flush with the top wall of the inner cavity of the shell; a plurality of fixing devices are arranged in the middle of an inner cavity of the mounting table, a mounting disc is arranged on the upper portion of the inner cavity of the mounting table, and a plurality of positioning devices are arranged in the middle of the mounting disc in an array mode. According to the through-silicon-via measuring device based on the white light interference technology, through the arrangement of the fixing device, when some objects with uneven surfaces are fixed, the objects can be fixed together through a plurality of fixing mechanisms on the two sides, so that the device can solve the problem that due to the fact that the appearances of the objects needing to be detected cannot be fixed, the detection accuracy is high. Therefore, the problem that the object with the uneven surface cannot be detected is solved, and the reliability of the device is improved.

The invention provides a double-BI OS starting system and method for a spatial high-performance processor, and the system comprises a controller which is used for reading a BIOS program before the processor is powered on, verifying the correctness of the BIOS program, correcting the data error of the BIOS program if the data error of the BI OS program exists, and starting the BIOS program if the data error of the BI OS program exists. After the processor is powered on, the BIOS program passing verification is forwarded to the processor through the interface converter; the controller is also used for controlling power supply and reset of the processor and monitoring the starting state and running state of the processor; and to update the memory based on an update indication; the memory comprises a first BIOS (Basic Input / Output System) memory and a second BIOS memory and is used for storing BIOS programs and a verification result of the controller; the processor is used for receiving a BI OS program of the controller; according to the method and the device, error detection and correction of a single bit error can be realized, and the single bit error can be timely found and corrected through updating, so that the requirement of a complex calculation task is met, and the stability and the reliability of a system are ensured.