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52 results about "Elastic anisotropy" patented technology

Elastic anisotropy occurs if there is a preferred alignment of a material’s fabric elements—crystals, grains, cracks, bedding planes, joints or fractures—on a scale smaller than the length of the wave. This alignment causes waves to propagate fastest in its direction. Elastic anisotropy is sometimes called seismic anisotropy, velocity anisotropy,...

Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method

Disclosed herein are an anisotropically conductive connector that conductivity of all conductive parts for connection is good, and insulating property between adjacent conductive parts for connection is surely achieved even when the pitch of electrodes as objects of connection is small, and good conductivity is retained over a long period of time even when it is used repeatedly under a high-temperature environment, and applications thereof.The above anisotropically conductive connector is a connector having an elastic anisotropically conductive film, in which a plurality of conductive parts for connection containing conductive particles and extending in a thickness-wise direction of the film have been formed, wherein supposing that the shortest width of each of the conductive parts for connection is W, and the number average particle diameter of the conductive particles is Dn, a value of a ratio W / Dn of the shortest width of the conductive part for connection to the number average particle diameter of the conductive particles falls within a range of 3 to 8, and a coefficient of variation of particle diameter of the conductive particles is at most 50%.
Owner:ISC CO LTD

Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method

Disclosed herein are an anisotropically conductive connector that conductivity of all conductive parts for connection is good, and insulating property between adjacent conductive parts for connection is surely achieved even when the pitch of electrodes as objects of connection is small, and good conductivity is retained over a long period of time even when it is used repeatedly under a high-temperature environment, and applications thereof. The above anisotropically conductive connector is a connector having an elastic anisotropically conductive film, in which a plurality of conductive parts for connection containing conductive particles and extending in a thickness-wise direction of the film have been formed, wherein supposing that the shortest width of each of the conductive parts for connection is W, and the number average particle diameter of the conductive particles is Dn, a value of a ratio W/Dn of the shortest width of the conductive part for connection to the number average particle diameter of the conductive particles falls within a range of 3 to 8, and a coefficient of variation of particle diameter of the conductive particles is at most 50%.
Owner:ISC CO LTD

Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method

Disclosed herein are an anisotropically conductive connector, by which positioning, and holding and fixing to a wafer can be conducted with ease even when the wafer has a large area of 8 inches or greater in diameter, and the pitch of electrodes to be inspected is small, and good conductivity is retained even upon repeated use, and applications thereof. The anisotropically conductive connector has a frame plate, in which a plurality of anisotropically conductive film-arranging holes have been formed correspondingly to electrode regions in all or part of integrated circuits on a wafer, and a plurality of elastic anisotropically conductive films arranged in the respective anisotropically conductive film-arranging holes. The elastic anisotropically conductive films each have a plurality of conductive parts for connection extending in a thickness-wise direction thereof and containing conductive particles, and an insulating part mutually insulating them. The conductive particles are obtained by coating core particles exhibiting magnetism with a high-conductive metal, a proportion of the high-conductive metal to the core particles is at least 15% by mass, and the following t is at least 50 nm: t=[1 / (Sw·ρ)]×[N / (1−N)], wherein Sw is a BET specific surface area (m2 / kg) of the core particles, ρ is a specific gravity (kg / m3) of the high-conductive metal, and N is (mass of the high-conductive metal / total mass of the conductive particles).
Owner:ISC CO LTD

Method for establishing FDTD (Finite Difference Time Domain) ultrasonic detection simulation model of coarse crystal material based on EBSD (Electron Back-Scattered Diffraction) spectrum

The invention discloses a method for establishing an FDTD (Finite Difference Time Domain) ultrasonic detection simulation model of a coarse crystal material based on an EBSD (Electron Back-Scattered Diffraction) spectrum and belongs to the technical field of ultrasonic nondestructive detection. The method comprises the following steps: obtaining a crystal orientation spectrum of the coarse crystal material by directly using the EBSD technology, selecting a threshold value for defining crystal grains in the spectrum according to an actual crystal grain structure in a macroscopic metallograph, packing the crystal grains with color corresponding to a principal orientation, and carrying out grey processing to obtain an image consisting of square pixel points, wherein the orientations of the crystal grains are represented by eulerian angles phi1, phi and phi2 corresponding to gray values and can be used for quantitatively calculating elastic anisotropic stiffness matrixes of the crystal grains. Compared with a previous model, the model has the advantages of being capable of accurately describing the structures and the orientations of the crystal grains, realizing high operation efficiency and the like; a model basis is provided for realizing purposes of defect quantification and location and quality determination in ultrasonic detection of the coarse crystal material. The method also can be used for establishing the ultrasonic simulation models of other elastic anisotropic polycrystalline materials such as austenitic welding lines and two-phase titanium alloys; the method has bright popularization and application prospects.
Owner:DALIAN UNIV OF TECH +1

Elastic anisotropic metal matrix thermal barrier coating thickness ultrasonic measurement method

An elastic anisotropic metal matrix thermal barrier coating thickness ultrasonic measurement method belongs to the technical field of ultrasonic nondestructive testing. The elastic anisotropic metal matrix thermal barrier coating thickness ultrasonic measurement method achieves measurement of samples to be tested and reference samples through an ultrasonic pulse echo method C-scan thickness measuring system composed of an ultrasonic C-scan device, a water penetration focusing probe, a digital oscilloscope and a computer and comprises, for elastic anisotropic metal matrix thermal barrier coating sample ultrasonic echo signals, extracting all the delta gamma & gt: 0 in the elastic anisotropic metal matrix thermal barrier coating sample ultrasonic echo signals through a defined correction factor delta gamma, computing the normalization power spectrum Gm (f) of the elastic anisotropic metal matrix thermal barrier coating sample ultrasonic echo signals, reading the resonant frequency fn in the effective frequency band of the Gm (f), and substituting a known thermal barrier coating longitudinal wave velocity c into a sound pressure reflection factor power spectrum resonant frequency expression to achieve elastic anisotropic metal matrix thermal barrier coating thickness measurement. The elastic anisotropic metal matrix thermal barrier coating thickness ultrasonic measurement method effectively overcomes the problem that ultrasonic waveform distortion and dominant frequency migration due to elastic anisotropy of a matrix results in large errors of thermal barrier coating thickness measurement results.
Owner:DALIAN UNIV OF TECH

Anisotropic conductive connector and inspection equipment of circuit device

Disclosed are an anisotropically conductive connector device, by which a good electrically connected state can be surely achieved even when the pitch of electrodes to be inspected is extremely small, and the good electrically connected state is stably retained even when used under a high-temperature environment, and an inspection apparatus for circuit devices, having this anisotropically conductive connector device. This anisotropically conductive connector device has an elastic anisotropically conductive film, in which a plurality of conductive path-forming parts each extending in a thickness-wise direction of the film are arranged mutually insulated by an insulating part, and a sheet-like connector composed of an insulating sheet, in which a plurality of through-holes each extending in a thickness-wise direction have been formed, and a plurality of electrode structures arranged in the respective through-holes in the insulating sheet so as to protrude from both surfaces of the insulating sheet. Each of the electrode structures is positioned on each of the conductive path-forming parts, the insulating sheet is integrally fixed to the insulating part, and each of the electrode structures is obtained by forming electrode parts having a diameter greater than the diameter of the through-hole on both ends of a body part inserted into the through-hole in the insulating sheet and is movable in the thickness-wise direction of the sheet.
Owner:ISC CO LTD

Elastic multi-link linear guide independent suspension

The invention relates to an elastic multi-link linear guide independent suspension which comprises a wheel, a frame, a spring shock absorber system and a steering knuckle, wherein the steering knuckle is connected with the wheel through a hub unit, and the spring shock absorber system is respectively connected with the steering knuckle and the frame through a bulb pair. The suspension also comprises four strip plate shaped elastic anisotropic members, wherein longitudinal axial lines of the first member at the upper side of the suspension and the first member at the lower side of the suspension are in a vertical plane, longitudinal axial lines of the second member at the upper side of the suspension and the second member at the lower side of the suspension are in the same vertical plane, and the two vertical planes are not parallel. The elastic multi-link linear guide independent suspension has the advantages of being capable of restraining the wheel to ensure that the wheel is always in the same straight line during bobbling, effectively reducing the abrasion of a tyre, and being capable of effectively improving control stability, the running smoothness and the riding comfort of the vehicle, and also has the remarkable advantages of simple structure, strong designability, convenience for assembly and regulation and the like.
Owner:WANXIANGQIANCHAO CO LTD +1

Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method

Disclosed herein are an anisotropically conductive connector, by which positioning, and holding and fixing to a wafer can be conducted with ease even when the wafer has a large area of 8 inches or greater in diameter, and the pitch of electrodes to be inspected is small, and good conductivity is retained even upon repeated use, and applications thereof. The anisotropically conductive connector has a frame plate, in which a plurality of anisotropically conductive film-arranging holes have been formed correspondingly to electrode regions in all or part of integrated circuits on a wafer, and a plurality of elastic anisotropically conductive films arranged in the respective anisotropically conductive film-arranging holes. The elastic anisotropically conductive films each have a plurality of conductive parts for connection extending in a thickness-wise direction thereof and containing conductive particles, and an insulating part mutually insulating them. The conductive particles are obtained by coating core particles exhibiting magnetism with a high-conductive metal, a proportion of the high-conductive metal to the core particles is at least 15% by mass, and the following t is at least 50 nm: t=[1 / (Sw·ρ)]×[N / (1−N)], wherein Sw is a BET specific surface area (m2 / kg) of the core particles, ρ is a specific gravity (kg / m3) of the high-conductive metal, and N is (mass of the high-conductive metal / total mass of the conductive particles).
Owner:ISC CO LTD

Sound ray tracing algorithm of fiber reinforced plastic composite material laminated plate

The invention discloses a sound ray tracing method of a fiber reinforced plastic composite material laminated plate, and belongs to the technical field of composite material ultrasonic inspection. The method comprises the following steps: taking a single ply as a unit to partition a computational domain, and utilizing an elastic stiffness matrix and the rotation transformation of the elastic stiffness matrix to quantitatively descript the elastic characteristic space distribution of FRP (Fiber Reinforced Plastic) composite materials; combining with a Christoffel equation to solve to independently obtain the function relational expressions, which are about a propagation direction angle, of quasi-longitudinal wave group speed values corresponding to different fiber orientation lays; and carrying out computational domain meshing, utilizing a Dijkstra shortest path search algorithm to search nodes through which ultrasonic wave passes when the ultrasonic wave is transmitted to a target point from a source point, and calculating corresponding sonic time. The method can realize the quick and accurate calculation of an ultrasonic wave propagation path and sonic time in the FRP composite material which has a multilayer structure, elastic anisotropy and different fiber laying sequences, and support is provided for researching ultrasonic wave propagation behaviors, optimizing a detection parameter and improving ultrasonic imaging quality and accuracy.
Owner:DALIAN UNIV OF TECH

Inter-salt shale oil reservoir rock physical mechanism and earthquake prediction method

The invention relates to an inter-salt shale oil reservoir rock physical mechanism and earthquake prediction method. The method defines the rock physical mechanism of an inter-salt shale oil reservoirsystem, establishes an anisotropic rock physical model, and on the basis, a borehole rock physical inversion and earthquake prediction method is developed for the laminated structure, horizontal seamand other physical parameters of the shale oil reservoir. The rock physical model considers the ratio of illite to montmorillonite in a clay mixture, and the problem of a high abnormal value of the shale longitudinal and transverse wave velocity ratio Vp / Vs is explained through the clay intergranular soft matter property, the method is applied to actual data of an inter-salt shale oil reservoir to predict the physical characteristics of a microscopic structure related to clay and cracks in shale and the elastic anisotropy of a clay mixture, a solid matrix and the whole shale; the method is used for quantitative interpretation of a seismic elastic inversion result and predicting the spatial distribution of reservoir stratification, cracks and other physical properties and anisotropy parameters. The spatial distribution of the key physical parameters of the shale oil reservoir can be used for identifying and predicting a favorable reservoir.
Owner:JILIN UNIV

Probe Member for Wafer Inspection, Probe Card for Wafer Inspection and Wafer Inspection Apparatus

Provided are a probe member, a probe card and a wafer inspection apparatus, by which a good electrically connected state can be surely achieved, positional deviation by temperature change can be prevented, and the good electrically connected state can be stably retained even when a wafer has a diameter of 8 inches or greater, and the pitch of electrodes to be inspected is extremely small. The probe member of the invention has a sheet-like probe, which is composed of a frame plate made of a metal, in which an opening has been formed, and a plurality of contact films arranged on and supported by a front surface of the frame plate so as to close the opening, wherein the contact film is obtained by arranging, in a flexible insulating film, a plurality of electrode structures, and an anisotropically conductive connector, which is composed of a frame plate, in which a plurality of openings have been formed, and a plurality of elastic anisotropically conductive films arranged on and supported by the frame plate so as to close the respective openings, and is arranged on a back surface of the sheet-like probe. The opening of the frame plate in the sheet-like probe has a size capable of receiving the external shape in a plane direction in the frame plate of the anisotropically conductive connector.
Owner:JSR CORPORATIOON

Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment

Disclosed herein are a probe member for wafer inspection, a probe card for wafer inspection and a wafer inspection apparatus, by which a good electrically connected state can be surely achieved, positional deviation by temperature change can be prevented, and the good electrically connected state can be stably retained even when a wafer has a diameter of 8 inches or greater, and the pitch of electrodes to be inspected is extremely small.
The probe member of the invention has a sheet-like probe, which is composed of a frame plate made of a metal, in which a plurality of openings have been formed, and a plurality of contact films arranged on and supported by a front surface of the frame plate so as to close the respective openings, wherein each of the contact films is obtained by arranging, in a flexible insulating film, a plurality of electrode structures, and an anisotropically conductive connector, which is composed of a frame plate, in which a plurality of openings have been formed, and a plurality of elastic anisotropically conductive films arranged on and supported by the frame plate so as to close the respective openings, and is arranged on a back surface of the sheet-like probe, wherein each of the openings of the frame plate in the sheet-like probe has a size capable of receiving the external shape in a plane direction in the elastic anisotropically conductive film.
Owner:ISC CO LTD

Anisotropic conductive connector for wafer inspection, production method and application therefor

A wafer inspection-use anisotropic conductive connector capable of positively ensuring a required electrical connection even if the electrodes to be inspected of the wafer are disposed at small pitches and high density, and being produced at low costs, and a production method and applications therefore. The connector comprises a frame plate formed with a plurality of openings corresponding to electrode areas where the electrodes to be inspected of the wafer are disposed, and a plurality of elastic, anisotropic conductive films so disposed as to close the respective openings, wherein the elastic, anisotropic conductive films comprise a plurality of connecting conductive units disposed in conjunction with the electrodes to be inspected, extending in the thickness direction, and being mutually insulated by insulating units, and can be obtained by laser-processing a conductive elastomer layer supported on a releasing type support plate to form a plurality of connecting conductive units, allowing the respective connecting conductive units to impregnate into a liquid insulating unit-use material layer formed so as to close the openings of the frame plate, and hardening the insulating unit-use material layer.
Owner:JSR CORPORATIOON
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