The present invention belongs to the technical field of
nanostructure manufacturing, and discloses a
metal nanoarray structure that can be in-situ controllably prepared on
graphene and a preparation method thereof. The present invention uses a
silicon wafer as a substrate, and prepares a
graphene layer on the
silicon substrate by mechanical exfoliation method; then installs a
silicon cantilever beam containing
raw material molecules on an atomic force
microscope to scan the prepared substrate to generate a high-resolution surface
topography image. After selecting a flat and defect-free position according to the
topography map, the tip of the
silicon cantilever beam is brought into contact with the surface of
graphene or the silicon substrate; subsequently, a positive
voltage is applied to the tip, and the
residence time and load are adjusted so that
metal nanomaterials are deposited near the tip to form a
metal nanoarray structure. Through this invention, in-situ controllable manufacturing of the size, morphology, composition, structure and position of metal particles on the graphene surface can be realized. It can be better promoted and applied in technical fields such as
electronics,
optics,
catalysis, sensing, field emission, display devices, etc.