The invention discloses a
system and a method for monitoring and controlling the temperature and the
optical power of an optical
waveguide device in situ. The
system comprises the steps of measuring the
admittance variation of an optical
waveguide at different frequencies through CLIPP, and simultaneously monitoring the
optical power and the temperature of an integrated optical
waveguide device in situ by combining with the function relation at different test frequencies; and enabling a
feedback control circuit to feed back and control the temperature and the
optical power of the integrated optical waveguide device according to the
admittance variation obtained by a
signal reading circuit. The method comprises the following steps: selecting a plurality of driving frequencies, and respectively fitting a binary function relationship among temperature, optical power and
admittance variation; reading the admittance variation of the CLIPP under the driving frequencies, and reversely deducing the temperature and the optical power of the integrated optical waveguide device; using the temperature and the optical power, obtained by the
signal reading circuit, of the integrated optical waveguide device, enabling a
PID regulator to feed back and adjust the current provided for the TEC by the temperature controller and the output optical power of a
laser, and adjusting the temperature and the optical power of the integrated optical waveguide device to set values.