The invention discloses a 
system and a method for monitoring and controlling the temperature and the 
optical power of an optical 
waveguide device in situ. The 
system comprises the steps of measuring the 
admittance variation of an optical 
waveguide at different frequencies through CLIPP, and simultaneously monitoring the 
optical power and the temperature of an integrated optical 
waveguide device in situ by combining with the function relation at different test frequencies; and enabling a 
feedback control circuit to feed back and control the temperature and the 
optical power of the integrated optical waveguide device according to the 
admittance variation obtained by a 
signal reading circuit. The method comprises the following steps: selecting a plurality of driving frequencies, and respectively fitting a binary function relationship among temperature, optical power and 
admittance variation; reading the admittance variation of the CLIPP under the driving frequencies, and reversely deducing the temperature and the optical power of the integrated optical waveguide device; using the temperature and the optical power, obtained by the 
signal reading circuit, of the integrated optical waveguide device, enabling a 
PID regulator to feed back and adjust the current provided for the TEC by the temperature controller and the output optical power of a 
laser, and adjusting the temperature and the optical power of the integrated optical waveguide device to set values.