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62results about How to "Reduce time expenditure" patented technology

Method for using a dynamic virtual articulator for simulating occlusion when designing a dental prosthesis for a patient, and data carrier

In the invention, a method for using a dynamic virtual articulator for simulating occlusion during a change in the initial position of the lower jaw or fragments thereof, and for modeling the position of the teeth in relation to one another and the position and shape of false teeth is described, said method being carried out with a computer. The method includes the following steps: providing a virtual articulator comprising a virtual three-dimensional model of the upper jaw and dental arch and a virtual three-dimensional model of the lower jaw and dental arch, resembling the upper jaw and upper teeth and the lower jaw and lower teeth, respectively, of the patient; and providing simulated movements of the virtual upper jaw and the virtual lower jaw in relation to one another for simulating dynamic occlusion, during which penetrating and non-penetrating contact may occur between teeth in the virtual upper and virtual lower jaw. Providing the virtual articulator further includes providing virtual three-dimensional models of the temporomandibular joints, resembling the heads of the lower jaw, the mandibular fossae, and the articular tubercles of the temporal bones, and carrying out simulated movements of the jaws in relation to one another is preceded by clinically or virtually setting initial and final positions. Furthermore, the virtual surfaces of the heads of the lower jaw and the virtual surfaces of the articular tubercles and the mandibular fossae of the temporal bones of the patient are disengaged. Also, a non-volatile machine-readable medium is described with a stored code containing instructions which, when executed, allow the proposed method to be carried out. The group of inventions makes it possible to provide a virtual articulator that simulates as closely as possible the actual processes occurring in the patient's mouth.
Owner:OBSCHESTVO S OGRANICHENNOI OTVETSTVENNOSTYU AVANTIS3D RU RU

Method and device for detecting chromosome

The invention discloses a method and device for detecting a chromosome. The method for detecting the chromosome comprises a receiving step, a dividing step, a comparing step and a determining step. In the receiving step, a reference sequence and a plurality of sequencing sequences are received; in the dividing step, each sequencing sequence is divided into a plurality of sequencing subsequences with the fixed length being an n2 basic group by using an n1 basic group as the step length, and the reference sequence is divided into a plurality of reference subsequences with the fixed length being an n2 basic group by using an n3 basic group as the step length; in the comparing step, the sequencing subsequences of each sequencing sequence are compared with the reference subsequences of the reference sequence, so that a target sequencing sequence is determined; in the determining step, according to the corresponding relation of a plurality of sequencing subsequences of the target sequencing sequence and the reference subsequences of the reference sequence, the name of the chromosome corresponding to the target sequencing sequence is determined. By means of the method and device for detecting the chromosome, the problem that the detecting speed of the chromosome is low in the prior art is solved, and therefore the effects for lowering the time spending and increasing the detecting speed are achieved.
Owner:BEIJING NOVOGENE TECH CO LTD

Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system

The invention relates to a method and to a device for examining a test sample using a scanning probe microscope. According to the method a first and a second measurement using a scanning probe microscope are carried out on the test sample using a measuring probe system in which a measuring probe and another measuring probe are formed on a common measuring probe receptacle. During the first measurement, in relation to the test sample, the measuring probe is held in a first measurement position and the other measuring probe is held in another non-measurement position, and the test sample is examined with the measuring probe using a scanning probe microscope. After the first measurement, by displacing in relation to the test sample, the measuring probe is displaced from the measurement position into a non-measurement position and the other measuring probe from the other non-measurement position into another measurement position. During the second measurement, in relation to the test sample, the measuring probe is held in the non-measurement position and the other measuring probe is held in the other measurement position, and the test sample is examined with the other measuring probe using a scanning probe microscope. The invention also relates to a measuring sensor system of a scanning probe microscope.
Owner:JPK INSTR +1
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