The invention belongs to the field of extraterrestrial object studying, and particularly relates to an extraterrestrial object sampling device and a sampling method thereof. Supporting legs, a telescoping grabbing device and a mechanical arm with many
degrees of freedom are arranged on the bottom of a
satellite main body, wherein the multiple supporting legs are evenly distributed in the circumferential direction, the upper end of the mechanical arm with many
degrees of freedom is connected with the bottom of the
satellite main body, and the lower end of the mechanical arm with many degrees offreedom is connected with
a diamond chain saw for
cutting an extraterrestrial object sample; the telescoping grabbing device is installed on the
satellite main body in a relatively-telescoping mode,the upper end of the telescoping grabbing device is connected with a power source installed in the satellite main body, and is driven to extend and retract by the power source, and capture jaws for capturing the sample are arranged at the lower end of the telescoping grabbing device. When the satellite main body lands, the supporting legs are used for supporting a
work space of the mechanical armwith many
degrees of freedom, then the
diamond chain saw installed on the mechanical arm with many degrees of freedom is used for conducting
cutting on the surface of a star, and a conical sample which is formed through
cutting is grabbed by the telescoping adsorbing and grabbing device, and is detached from the surface of the star. The extraterrestrial object sampling device is simple in structure and flexible to move, and control is ingenious, so that a success rate of sampling is guaranteed.