The invention belongs to the field of optical three-dimensional measurement, particularly relates to a calibration method of a line
structured light three-dimensional measurement
system, aims to solve the problems of small application range, high cost, large calculation amount, low efficiency and the like of the existing calibration method of the line
structured light three-dimensional measurement
system, and eliminates the influence of lens
distortion on
measurement precision. The method mainly comprises the following steps: building a plane calibration plate required by calibration; moving the plane calibration plate or the linear
structured light three-dimensional measurement
system, and taking a picture; moving the plane calibration plate or the linear structured light three-dimensional measurement system, projecting coding structured light, and taking a picture; calibrating the camera, and obtaining a
plane equation of the plane calibration plate in a
camera image plane coordinate system; and calculating three-dimensional coordinates of imaging points, fitting a curved
surface equation, and calibrating the
projector. According to the curved
surface equation, the calculated amount of curved
surface fitting is simplified, the
overfitting problem which is extremely prone to occurring in a conventional second-order curved
surface equation is avoided, and compared with the conventional second-order curved surface equation, the
spatial model of the structured light curved surface can be described more accurately.