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37results about How to "Capacitor area is small" patented technology

Analog counting circuit with high counting range applied to single photon avalanche diode (SPAD) detector

ActiveCN106656166ACapacitor area is smallLarge counting rangeCounting chain pulse counters using semiconductor devices with 2 electrodesElectrical resistance and conductanceCapacitance
The invention discloses an analog counting circuit with a high counting range applied to a single photon avalanche diode (SPAD) detector. The circuit is composed of a counting capacitor C, a resistor R and fifteen MOS transistors, wherein a Cascode biasing circuit is formed by the NMOS transistors MN3 and MN4, the PMOS transistors MP6, MP7, MP8 and MP9, and the resistor R for providing bias for the counting circuit; meanwhile, the biasing circuit also provides a current source load for an output follower of the counting circuit, so that linear output of a counter is ensured; the biasing circuit also provides a biasing voltage with high level for the current-limiting PMOS transistor, thus playing a role in preventing the breakover current from being excessive on a charging branch of the counting capacitor. The invention also provides a counting method by using the analog counting circuit with the high counting range applied to the SPAD detector. The method comprises three stages consisting of a resetting stage, a counting stage and a reading stage. The analog counting circuit provided by the invention can reduce capacitor area and is large in counting range, and also has the advantage of high filling coefficient of a pixel unit.
Owner:NANJING UNIV OF POSTS & TELECOMM

Analog-to-digital converter and three-level switching method applied to SAR ADC

The invention discloses an analog-to-digital converter and a three-level switching method applied to an SAR ADC. The method belongs to the technical field of capacitive DACs of SAR ADCs, the whole process is divided into a sampling stage and a conversion stage, and the sampling stage is connected to top polar plates of an upper capacitor array and a lower capacitor array through sampling switchesaccording to input signals VIP and VIN; in the conversion stage, the comparator performs MSB bit-to-LSB bit comparison on the voltages of the top polar plates of the upper and lower capacitor arrays to obtain corresponding digital codes, and controls the connection relationship of the capacitor bottom polar plates in the upper and lower capacitor arrays according to the digital codes; and obtaining an N-bit digital output code through N times of comparison. Different from most published three-level switching methods, a new third reference level Vaq is adopted, and the value of the new third reference level Vaq is equal to one fourth of the reference voltage Vref. Compared with a traditional switching algorithm, the method has the advantages that 99.61% of power consumption of the capacitorsplit type DAC can be reduced, 87.5% of capacitor area is saved, and good compromise between energy efficiency and area saving is achieved.
Owner:SOUTHEAST UNIV

High-speed switch time sequence for successive approximation type analog-digital converter

The invention provides a high-speed switch time sequence for a successive approximation type analog-digital converter. The analog-digital converter comprises N orderly connected capacitor banks, each capacitor bank comprises a first capacitor array and a second capacitor array; the first capacitor bank is in a second connection state, and other capacitor banks are in a first connection state; the first connection state is as follows: a lower pole plate of the first capacitor array is connected with low-level voltage, a lower pole plate of the second capacitor array is connected with high-level voltage; the second connection state is as follows: the lower pole plate of the first capacitor array is connected with the high-level voltage, and the lower pole plate of the second capacitor array is connected with the low-level voltage; the high-speed switch time sequence further comprises a comparator, upper pole plates of all first capacitor arrays are connected with a first input end of the comparator, the upper pole plates of all second capacitor arrays are connected with a second input end of the comparator; a logic module is connected with the comparator and used for controlling the connection states of the capacitor banks according to internally stored time slot instructions. According to the time sequence provided by the invention, the capacitance area of the analog-digital converter is smaller, and the conversion speed is faster.
Owner:XIDIAN UNIV

Capacitor array switching method applied to low-voltage SAR ADC

The invention discloses a capacitor array switching method applied to a low-voltage SAR ADC. An analog-to-digital converter based on the method comprises two N-bit sub analog-to-digital converters with the same structure, the method comprises the following steps: for the input signals VIP and VIN, after N comparisons, obtaining N-bit digital output codes, which are divided into a sampling stage and a conversion stage, wherein, in the sampling stage, the input signals VIP and VIN are respectively connected to top polar plates of an upper capacitor array and a lower capacitor array through sampling switches, and bottom polar plates of all capacitors of the upper capacitor array and bottom polar plates of all capacitors of the lower capacitor array are connected to corresponding voltages; and, in the conversion stage, the comparator performs MSB bit-to-LSB bit comparison on the voltages of the top polar plates of the upper and lower capacitor arrays to obtain corresponding digital codes,and the connection relationship of the capacitor bottom polar plates in the upper and lower capacitor arrays are controlled according to the digital codes, and the N-bit digital output codes are obtained through N times of comparison. According to the invention, the power consumption of the DAC part in the conversion process can be greatly reduced, only two reference levels are adopted, and the method is suitable for the design under the near threshold voltage.
Owner:SOUTHEAST UNIV

Successive approximation type analog-to-digital converter and three-level switching method thereof

The invention discloses a successive approximation type analog-to-digital converter and a three-level switching method thereof. The method comprises the steps that input signals VIP and VIN are compared N times to obtain an N-bit digital code, the N-bit digital code is divided into a sampling stage and a conversion stage, and in the sampling stage, the input signals VIP and VIN are connected to top polar plates of an upper capacitor array and a lower capacitor array through sampling switches respectively, and the bottom polar plate of each capacitor is connected to a corresponding voltage; inthe conversion stage, the comparator performs MSB bit-to-LSB bit comparison on the voltages of the top electrode plates of the upper capacitor array and the lower capacitor array to obtain corresponding digital codes, and the connection relation of the capacitor bottom electrode plates in the capacitor arrays is controlled according to the digital codes; and comparing for N times is performed to obtain an N-bit digital code. According to the invention, the voltage change of +/-Vref is generated on the top plate of the capacitor for the first time, so that the reference voltage Vref of the capacitor array is reduced to half of the reference voltage Vref of a common method. Compared with a traditional switching algorithm, the method has the advantages that 99.79% of DAC power consumption isreduced, 75% of capacitance area is saved, common-mode level offset is only 0.5 LSB, and compromise of energy efficiency, area and common-mode level is achieved.
Owner:SOUTHEAST UNIV

Two-level switching method applied to successive approximation type analog-to-digital converter

The invention discloses a two-level switching method applied to a successive approximation type analog-to-digital converter, which comprises the following steps of: comparing input signals VIP and VINfor N times to obtain an N-bit digital code, dividing the N-bit digital code into a sampling stage and a conversion stage, connecting the input signals VIP and VIN to top polar plates of an upper capacitor array and a lower capacitor array through a sampling switch in the sampling stage, and connecting each capacitor bottom polar plate to a corresponding voltage; in the conversion stage, enablingthe comparator to perform comparison from MSB bits to LSB bits on the voltages of the top polar plates of the upper and lower capacitor arrays to obtain corresponding digital codes so as to control the state of the bottom polar plate of each capacitor; and comparing for N times to obtain an N-bit digital code. The voltage change of +/-Vref is generated by switching for the first time, and the reference voltage Vref of the capacitor array is reduced to half of the reference voltage Vref of a common method; the introduced floating state is released within three-step conversion so as to simplifythe control logic; and only the LSB bit introduces a common mode level offset of 0.5 LSB. Compared with a traditional switching algorithm, the method has the advantages that the power consumption ofthe DAC is reduced by 99.51%, the capacitance area is saved by 75%, and the requirements on other modules of the ADC are not improved.
Owner:SOUTHEAST UNIV

Deep trench isolated anti-crosstalk photoelectric detector and manufacturing method thereof

The invention discloses a deep trench isolated anti-crosstalk photoelectric detector, comprising a P-i-N laminar structure formed by sequentially laminating a P-type diffusion layer, a substrate layer and an N-type diffusion layer, wherein an isolation region is formed on the P-i-N laminar structure and divides the photo-surface of the P-i-N laminar structure into a plurality of quadrants. The photoelectric detector is characterized in that the isolation region is realized by adopting the following structure: a deep trench is made in the photo-surface of the P-i-N laminar structure, the cross section contour of the deep trench is matched with the outer contours of the plurality of quadrants, the axial direction of the deep trench is the same as the laminating direction of the P-i-N laminar structure, the depth of the deep trench reaches the upper end surface of the N-type diffusion layer, and the deep trench is filled with an insulating material. The photoelectric detector has the advantages: each quadrant of the quadrant photoelectric detector is effectively isolated, the area of the depletion layer of the photoelectric detector is reduced, the internal junction capacitance area is reduced, the RC time constant is reduced, and the response speed of a device is improved; and the deep trench is positioned in the body of the quadrant photoelectric detector, so that the influence of surface defects on the device is avoided.
Owner:CHONGQING EAGLE VALLEY OPTOELECTRONICS

Successive approximation type analog-to-digital converter based on segmented differential capacitor array

The invention discloses a successive approximation type analog-to-digital converter based on a segmented differential capacitor array. The successive approximation type analog-to-digital converter comprises: a sampling switch; a sectional type differential capacitor array which is electrically connected with the sampling switch; a comparator which is electrically connected with the sectional type differential capacitor array; and a successive approximation control logic which is electrically connected with the sectional type differential capacitor array and the comparator. The sectional type differential capacitor array comprises a first capacitor array and a second capacitor array which are symmetrically arranged, an upper pole plate of the first capacitor array is connected with a positive input end of the comparator, and an upper pole plate of the second capacitor array is connected with a negative input end of the comparator; lower polar plates of the first capacitor array and the second capacitor array are selectively and electrically connected to a reference voltage end through a control switch; and each of the first capacitor array and the second capacitor array comprises two sub-capacitor arrays which are connected through a unit bridging capacitor. According to the successive approximation type analog-to-digital converter provided by the invention, the capacitance area is saved, the power consumption is reduced, and the quantization speed is improved.
Owner:XIDIAN UNIV

A DC blocking circuit and a switching circuit

The invention relates to a direct current blocking circuit and a switching circuit; the direct current blocking circuit is used for blocking a direct current bias; the direct current blocking circuit comprises a first MOS (Metal Oxide Semiconductor) tube, a first resistor, a second resistor and a first capacitor, wherein the first MOS tube, the first resistor and the second resistor are in serial connection; the first capacitor is in parallel connection with the first MOS tube; the grid electrode of the first MOS tube is coupled to the first end of the first resistor, the source electrode of the first MOS tube is coupled to the input end of the direct current blocking circuit and the first end of the first capacitor, and the drain electrode of the first MOS tube and the second end of the first capacitor are coupled to the output end of the direct current blocking circuit; the first end of the second resistor is coupled to the substrate end of the first MOS tube, and the second end of the second resistor is grounded; the second end of the first resistor is coupled to a first control signal; and when the first control signal is a power signal, the first MOS tube is in a conducting state. According to the direct current blocking circuit and the switching circuit disclosed by the invention, on the basis of keeping no degradation of the high-power linearity and the simple structure, the circuit area is decreased, and the degradation degree of insertion loss is reduced.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Conversion circuit, heartbeat current signal conversion device and method, and heartbeat detection system

A heartbeat current signal conversion device, comprising a converter for converting a modulated optical signal into a current signal and transmitting same; a mixer for performing frequency conversion of a heartbeat current signal and a background photocurrent signal in the current signal, and then transmitting the modulated photocurrent signal, the frequency-converted heartbeat current signal and the frequency-converted background photocurrent signal in the current signal; a fully differential integrator for performing both positive integration and inverse integration on the modulated photocurrent signal, the frequency-converted heartbeat current signal and the frequency-converted background photocurrent signal, which are inputted, and then outputting a voltage signal. The fully differential integrator can improve the suppression of the heartbeat current signal conversion device to the common mode noise, and the linearity and the dynamic output range of the circuit. Moreover, the heartbeat current signal conversion device loop always forms a closed loop, and thus a direct output to the next-stage circuit can be achieved, eliminating an output buffer circuit, thereby reducing power consumption.
Owner:SHENZHEN GOODIX TECH CO LTD

Successive Approximation Analog-to-Digital Converter Based on Asymmetric Differential Capacitor Array

The invention relates to a successive approximation register analog-to-digital converter based on an asymmetric differential capacitor array. The successive approximation register analog-to-digital converter comprises a sample hold circuit, a comparer and a logic control module. The sample hold circuit comprises an asymmetric differential capacitor array and a sample switch module. According to the asymmetric differential capacitor array, a first input end is selectively electrically connected with a common-mode voltage end and a grounding terminal through a single pole double throw switch, asecond input end is electrically connected with an output end of the sample switch module, a third input end is electrically connected with a first output end of the logic control module, and the output end is electrically connected with the comparer. The first input end and the second input end of the sample switch module are electrically connected with an analog signal negative input end and ananalog signal positive input end. The output end of the comparer is electrically connected with the input end of the logic control module. According to the successive approximation register analog-to-digital converter provided by the invention, the power consumption can be effectively reduced, a capacitor area can be reduced, and the design difficulty can be reduced.
Owner:XIDIAN UNIV

A Compact Time-to-Analog Conversion Circuit for Single Photon Detectors

The invention discloses a compact type time to analog conversion circuit applied to a single-photon detector. The compact type time to analog conversion circuit applied to the single-photon detector comprises an RS trigger, a timing capacitor C and eight MOS transistors, wherein the MP0 and the MP1 form a differential structure as an input stage; the MN1 and the MP1 form a complementary CMOS switch; the three MOS transistors including the MP0, the MN1 and the MP1 form a control logic together, so that discharging of the timing capacitor C is controlled; the MP2 and the MP3 are used as two PMOSswitches used for controlling the reset operation of the timing capacitor C; and the MN2 and the MN3 form a source-level follower used for reading voltage on the timing capacitor C. The compact typetime to analog conversion circuit applied to the single-photon detector in the invention is small in capacitance area, small in transistor number and simple in structure; the effect of greatly reducing the area of a circuit layout is achieved; the circuit density and integrity are improved; fill factors of picture elements are effectively increased; simultaneously, the overall power consumption ofthe circuit is also reduced; the manufacture cost is low; the performance consistence of various circuits is good; and the yield is high.
Owner:NANJING UNIV OF POSTS & TELECOMM
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