The invention provides a coaxial contact, a high-frequency
signal connector and a
semiconductor testing device. The coaxial contact comprises: a first inner conductor; the first annular
dielectric body is formed on the outer wall of the first inner conductor; the first outer conductor sleeves the outer wall of the first annular
dielectric body, and a first sleeving ring groove is formed in the outer
peripheral wall of the first outer conductor; the first outer conductor and the first inner conductor are coaxially arranged; the first floating elastic ring comprises a first elastic
ferrule and a first floating clamping piece, the first elastic
ferrule is located in the first sleeving ring groove and connected to the first outer conductor in a sleeving mode, the first floating clamping piece is arranged on the
peripheral wall of the first elastic
ferrule in a protruding mode, and the first floating clamping piece is used for being clamped into the clamping groove of the first shell when the coaxial contact piece is installed in the first shell; therefore, the coaxial
contact element has good floating performance in the first shell, and the butt-joint fault-tolerant capability of the coaxial
contact element is improved.