The invention discloses a 32-bit MCU chip test system and a test method thereof. The test system comprises an ATE test machine table and an embedded microprocessor, and the ATE test machine table is connected with the embedded microprocessor through a data transmission interface; a control module used for fulfilling core calculation and control functions, a storage module, a firmware updating module, a multi-power-supply management module, a self-adaptive interface module, a contact detection module, a scanning module, an index testing module and a yield control module are arranged in the embedded microprocessor. According to the invention, multi-platform cooperative processing is used; the chip simulation performance characteristics are tested and subjected to yield analysis, multiple simulation parameters can be tested at the same time, the multi-power-supply control and high-precision line scanning technology is adopted, manual participation is not needed in the whole testing and yield analysis control process, yield information of multiple batches of products can be automatically completed and analyzed, and convenience and high efficiency are achieved.