Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

174 results about "Gmr sensor" patented technology

Magnetoresistive flux focusing eddy current flaw detection

A giant magnetoresistive flux focusing eddy current device effectively detects deep flaws in thick multilayer conductive materials. The probe uses an excitation coil to induce eddy currents in conducting material perpendicularly oriented to the coil's longitudinal axis. A giant magnetoresistive (GMR) sensor, surrounded by the excitation coil, is used to detect generated fields. Between the excitation coil and GMR sensor is a highly permeable flux focusing lens which magnetically separates the GMR sensor and excitation coil and produces high flux density at the outer edge of the GMR sensor. The use of feedback inside the flux focusing lens enables complete cancellation of the leakage fields at the GMR sensor location and biasing of the GMR sensor to a location of high magnetic field sensitivity. In an alternate embodiment, a permanent magnet is positioned adjacent to the GMR sensor to accomplish the biasing. Experimental results have demonstrated identification of flaws up to 1 cm deep in aluminum alloy structures. To detect deep flaws about circular fasteners or inhomogeneities in thick multilayer conductive materials, the device is mounted in a hand-held rotating probe assembly that is connected to a computer for system control, data acquisition, processing and storage.
Owner:NASA

Current-perpendicular-to-plane sensor with dual keeper layers

InactiveUS20080144234A1Reduce couplingLower junction resistance-area productNanomagnetismMagnetic measurementsRough surfaceAmorphous phase
This invention provides a CPP TMR or GMR sensor with an amorphous ferromagnetic lower keeper layer and a crystalline ferromagnetic upper keeper layer. The amorphous ferromagnetic lower keeper layer strongly exchange-couples to an underlying antiferromagnetic pinning layer and planarizes its rough surface. The crystalline ferromagnetic upper keeper layer strongly antiparallel-couples to an adjacent ferromagnetic reference layer across a nonmagnetic spacer layer. The amorphous ferromagnetic lower keeper layer is preferably made of a Co—Fe—B alloy film with an Fe content high enough to ensure strong exchange-coupling to the underlying antiferromagnetic pinning layer, and with a B content high enough to ensure the formation of an amorphous phase for planarizing an otherwise rough surface due to the underlying antiferromagnetic pinning layer. The crystalline ferromagnetic upper keeper layer is preferably made of a Co—Fe alloy film with an Fe content low enough to ensure strong antiparallel-coupling to the adjacent ferromagnetic reference layer across the nonmagnetic spacer layer. The sensor is annealed at temperatures low enough to prevent the amorphous phase from transforming into a polycrystalline phase, but also high enough to maximize TMR.
Owner:WESTERN DIGITAL TECH INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products