The present invention provides an apparatus for indirectly measuring the
critical current of a
superconducting wire, the apparatus comprising: a
temperature control stage (210) in which a tape-shaped
high temperature superconducting (HTS) wire (10) is positioned and which can heat the
superconducting wire (10) in order to indirectly measure, without a power supply, a
critical current equal to or greater than the capacity of the power supply, for the
superconducting wire; a temperature sensor (250) and a
magnetic field sensor (240), which are provided in the
temperature control stage (210); a cryogenic
vacuum chamber (170) including therein the
temperature control stage (210) and a cooling device (180); an external
magnetic field generating coil (140) which is positioned around the cryogenic
vacuum chamber (170) and is capable of applying an external
magnetic field to the superconducting wire (10); a
simulation unit which calculates a distribution of a
critical current (Jc) area of a wire cross-section (15) of the superconducting wire (10) on the basis of output signals of the temperature sensor (250) and the magnetic field sensor (240); and a
control unit (270) for comparing whether the calculated current (I'c), which is capable of being conducted and is calculated by integrating the distribution of the critical current (Jc) area, matches an actual
conduction current (I), and outputting the matched current value as the critical current (Jc), wherein the
conduction current (I) is a current generated from the difference between an external magnetic field and a screening current-induced field (SCIF) of the superconducting wire (10).