35 results about "Industrial imaging" patented technology

New sensors, pixel detectors and different embodiments of multi-channel integrated circuit are disclosed. The new high energy and spatial resolution sensors use solid state detectors. Each channel or pixel of the readout chip employs low noise preamplifier at its input followed by other circuitry. The different embodiments of the sensors, detectors and the integrated circuit are designed to produce high energy and/or spatial resolution two-dimensional and three-dimensional imaging for different applications. Some of these applications may require fast data acquisition, some others may need ultra high energy resolution, and a separate portion may require very high contrast. The embodiments described herein addresses these issues and also other issues that may be useful in two and three dimensional medical and industrial imaging. The applications of the new sensors, detectors and integrated circuits addresses a broad range of applications such as medical and industrial imaging, NDE and NDI, security, baggage scanning, astrophysics, nuclear physics and medicine.

New sensors and different embodiments of multi-channel integrated circuit are provided. The new high energy and spatial resolution sensors use both solid state and scintillator detectors. Each channel of the readout chip employs low noise charge sensitive preamplifier(s) at its input followed by other circuitry. The different embodiments of the sensors and the integrated circuit are designed to produce high energy and/or spatial resolution two-dimensional and three-dimensional imaging for widely different applications. Some of these applications may require fast data acquisition, some others may need ultra high energy resolution, and a separate portion may require very high contrast. The embodiments described herein addresses all these issues and also other issues that may be useful in two and three dimensional medical and industrial imaging. The applications of the new sensors and integrated circuits addresses a broad range of applications such as medical and industrial imaging, NDE and NDI, security, baggage scanning, astrophysics, nuclear physics and medicine.

A method for reconstructing image data from measured sinogram data acquired from a CT system is provided. The CT system is configured for industrial imaging. The method includes pre-processing the measured sinogram data. The pre-processing includes performing a beam hardening correction on the measured sinogram data and performing a detector point spread function (PSF) correction and a detector lag correction on the measured sinogram data. The pre-processed sinogram data is reconstructed to generate the image data.

A readout electronics scheme is under development for high resolution, compact PET (positron emission tomography) imagers based on LSO (lutetium ortho-oxysilicate, Lu₂SiO₅) scintillator and avalanche photodiode (APD) arrays. The key is to obtain sufficient timing and energy resolution at a low power level, less than about 30 mW per channel, including all required functions. To this end, a simple leading edge level crossing discriminator is used, in combination with a transimpedance preamplifier. The APD used has a gain of order 1,000, and an output noise current of several pA/√Hz, allowing bipolar technology to be used instead of CMOS, for increased speed and power efficiency. A prototype of the preamplifier and discriminator has been constructed, achieving timing resolution of 1.5 ns FWHM, 2.7 ns full width at one tenth maximum, relative to an LSO/PMT detector, and an energy resolution of 13.6% FWHM at 511 keV, while operating at a power level of 22 mW per channel. Work is in progress towards integration of this preamplifier and discriminator with appropriate coincidence logic and amplitude measurement circuits in an ASIC suitable for a high resolution compact PET instrument. The detector system and/or ASIC can also be used for many other applications for medical to industrial imaging.

An X-ray sensitive coating (22) for a flat panel direct conversion X-ray detector for medical or industrial imaging. A composite particle-in-binder (PIB) material (22) may contain X-ray photoconductive particles (23) such as PbO (lead monoxide) in a binder of polyimide (23). This PIB material may be prepared in precursor paste form, and applied as a coating (22) onto a thin film transistor array (26) having a storage capacitor (31) at each pixel (30). The coating (22) is cured, and an electrically conducting layer (34) is applied to the exposed surface of the coating (22), to provide a bias voltage. X-ray photons striking the photoconductive particles (23) cause localized electrical conduction proportional to the number of photons. This charges respective capacitors (31) that provide image data input to a computer.

The invention relates to a material mechanical property in-situ three-point bending test platform with adjustable test environment temperature, and belongs to the field of in-situ mechanical property test. Test elements are heated up through resistance wires, and are observed by combining with a high-amplification-factor solid state CCD (charge coupled device) industrial imaging lens, and the microstructure variation as well as micromechanics behaviors of crack production, expanding and the like of materials at different environment temperatures under the bending load effect can be monitored dynamically. The material mechanical property in-situ three-point bending test platform with adjustable test environment temperature provided by the invention mainly comprises a precision driving transmission unit, a detecting unit, an imaging system unit, a temperature field control unit and an auxiliary support unit. The material mechanical property in-situ three-point bending test platform with adjustable test environment temperature has the advantages that the structure is simple and compact, the transmission is stable, and a temperature field and stress field are effectively combined, in-situ observation can be carried out on micro deformation, damage and cracking process of materials under a high-resolution imaging system, and thus a novel test method is provided for revealing the mechanical property and the damage mechanism of materials under different temperature fields.

An imaging device, including an optical channel, a lens at a distal end of the optical channel, a differentiating element in the optical channel receiving light from the lens and differentiating the light into different wavelengths, a first sensor at a proximal end of the optical channel, a second sensor at the proximal end of the optical channel, the second sensor oriented substantially perpendicular to the first sensor, and a selection element between the first and second sensors receiving the differentiated light from the differentiating element via the optical channel and transmitting a first portion of the differentiated light to the first sensor and a second portion of the differentiated light to the second sensor.

The invention relates to a method for quickly measuring wall thickness of an annular section based on an industrial CT, belongs to the technical field of nondestructive testing, and solves the problemthat the maximum value and the minimum value of the wall thickness of a rotary cavity component cannot be obtained in the wall thickness measurement process of the rotary cavity component in the prior art. The measuring method comprises the following steps: 1, acquiring the circular ring section of the rotary cavity component, and dividing an image area; 2, determining circle center coordinates of the circular ring section; 3, calculating the maximum radius Rmax of the circular ring section, and drawing a virtual circle; and 4, calculating the pixel distance of any point in the virtual circle, and calculating the actual wall thickness of any point. The circular ring section of the position to be measured is obtained through the industrial CT imaging equipment, the circle center coordinates of the circular ring section are obtained through the two chord lines, the maximum value and the minimum value of the wall thickness of the rotary cavity component are obtained on the premise that it is guaranteed that the measured component is not damaged, the principle is simple, the calculated amount is small, and the operation calculation speed is high.

The present invention relates to an industrial image motion blur suppression method, in particular, a cepstrum linear potential energy function-based industrial image motion blur suppression method. The objective of the invention is to solve the problem of motion blur degradation in an industrial imaging process. The method includes the following steps that: (1) a region of interest is determined; (2) a Fourier spectrum image is obtained; (3) a cepstrum image is obtained; (4) the estimated value phi <^> of the blur angle of an original ROI (region of interest) image is determined; (5) the estimated value lambda <^> of the blur length of the original ROI image is determined; and (6) a linear motion blur kernel is constructed for the blur angle phi <^> and blur scale lambda <^> of the ROI image which are obtained in the step (4) and the step (5), and image restoration is carried out through adopting Lucy-Richardson method, so that a clear ROI image is obtained. The method of the present invention is applied to the industrial image motion blur suppression field.

The invention discloses a large-view-field ultra-long lens cone monitoring lens for a high-temperature combustion furnace, and the lens comprises a lens body which is sequentially provided with an optical quartz glass flat plate 1, a negative meniscus lens 2, a negative meniscus lens 3, a biconcave lens 4, a positive meniscus lens 5, a fixed diaphragm A, a biconcave lens 6-1, a biconvex lens 6-2 and a plano-convex lens 7 along the incident direction of light, wherein the biconcave lens 6-1 and the biconvex lens 6-2 form a doublet lens group 6. According to the lens structure, the maximum fullfield of view is 90 degrees, the total length of the optical structure exceeds 250 mm when the focal length of the monitoring lens meets the object-image relationship of a limited distance according to actual needs, and the lens structure can be completely matched with an industrial imaging camera of a CMOS or CCD chip with the specification of 1/2 inch to 1 inch within the full field of view image height adjustment range.

The invention discloses an image reconstruction method for inhibiting industrial imaging ladder artifacts, which is characterized in that a conductivity distribution coefficient is processed by combining a novel processing function, and finally, an operator for reconstructing conductivity distribution is used for reconstructing an optimal conductivity distribution coefficient to obtain optimal conductivity distribution. The sparse regular term can restore the most real solution by using less data, an unconstrained problem in the optimization model is converted into a corresponding constrained problem, the sub-problems are iteratively solved, iteration can be ended until the specified number of iterations is met, and the optimal conductivity distribution coefficient at the moment is obtained. And finally, the optimal conductivity distribution is obtained by using the operator for reconstructing the conductivity distribution, and imaging is carried out. Step artifacts in the background of the image reconstructed by the TV regularization method are effectively reduced, the quality of the reconstructed image is improved, relatively good noise immunity is achieved, and new possibility is provided for the field of industrial imaging.

The invention belongs to the technical field of vision measurement, and particularly relates to a multi-axis vision measurement system and a calibration method for the rotation axis position of a pitching table. The measurement system comprises a base, a pitching table, an industrial imaging device, a three-dimensional linear motion mechanism and a calibration block. The three-dimensional linear motion mechanism is installed on the base, the industrial imaging device is installed on the three-dimensional linear motion mechanism, and the industrial imaging device can move in a three-dimensionalenvironment through the three-dimensional linear motion mechanism. The pitching table is installed on the base, and the calibration block is arranged on the pitching table. According to the invention, the space coordinates of the origin of the rotation axis of the pitching table in the machine coordinate system of the multi-axis vision measurement system can be accurately calibrated. The positionof the rotation axis of the pitching table is determined, the measurement precision and the measurement efficiency of parts with complex shapes can be improved, and the measurement system and the method have great practical application value.

The invention discloses a 9,10-diphenyl anthracene organic single crystal scintillator and a preparation method and application thereof. The preparation method comprises the following steps: under a protective atmosphere, treating raw materials by adopting a sublimation method to obtain yellow powder and 9,10-diphenyl anthracene micro single crystals; dissolving the yellow powder in p-xylene to prepare a saturated solution at 50-80 DEG C, putting the 9,10-diphenyl anthracene micro single crystals into a mold, putting the mold into the saturated solution and enabling the mold to be filled with the saturated solution, and obtaining the 9,10-diphenyl anthracene organic single crystal scintillator at 50-80 DEG C by adopting a gradient cooling method. The 9,10-diphenyl anthracene organic single crystal scintillator emits light after being irradiated by X-rays, the luminous intensity is linearly changed along with the X-ray dosage, and the 9,10-diphenyl anthracene organic single crystal scintillator can be used for quantitative detection and biological and industrial imaging of the X-rays and has good resolution, short decay time, high response speed and stable cycle performance.

The invention provides high-resolution industrial imaging equipment and an imaging method for a curved surface. The equipment comprises a computer, a curved-surface scanning motion subsystem, a scanning position sensor, an optical lens and a field curvature self-adaptive linear array detector module, wherein the curved-surface scanning motion subsystem is used for realizing relative motion of a curved surface relative to an optical lens according to a scanning path planned by a computer, and the scanning position sensor is used for detecting a current scanning position of the curved surface ofthe curved-surface scanning motion subsystem in real time; the computer calculates a curved image surface passing through the optical lens according to the real-time scanning position of the curved surface of the curved-surface scanning motion subsystem to obtain the position, matched with the curved image surface, of each linear array detector in the field curvature self-adaptive linear array detector module; and the field curvature self-adaptive linear array detector module controls each linear array detector to move to a position coinciding with the curved image surface, so high-resolutionimaging is realized. According to the invention, high-efficiency and high-resolution imaging of the curved surface can be realized.

The invention discloses a large-aperture multi-configuration near-infrared band industrial imaging lens. The large-aperture multi-configuration near-infrared band industrial imaging lens comprises a first lens, a second lens, a third lens, a fourth lens, a fifth lens, a sixth lens, a seventh lens, an eighth lens, a ninth lens and a tenth lens in sequence from an object side to an image side along an optical axis. The invention relates to a large-aperture optical industrial lens with the focal length of 16 mm, the wavelength of 900-1700 nm and the F of 0.9, and the lens can realize clear imaging by adjusting the back focal length and the distance between Ld and Le when the object distance is 150, 250, 350, 500 and 600.

The invention discloses a detection system and a detection method for foreign matters in CG and OCA interlayers of a display screen. The detection system and the detection method are used for improving the yield of finished display screens. The system comprises a light source control module, a first coaxial illumination module, a second coaxial illumination module, a first industrial imaging module, a second industrial imaging module, a motion control assembly, a CG supporting platform and an image processing workstation. The light source control module is connected with the first coaxial illumination module, the second coaxial illumination module and the image processing workstation; the first coaxial illumination module and the second coaxial illumination module are fixed to the upper portion and the lower portion of the CG supporting platform respectively. The image processing workstation is connected with the first industrial imaging module and the second industrial imaging module. The first industrial imaging module is fixed above the first coaxial illumination module, and the second industrial imaging module is fixed below the second coaxial illumination module; the motion control assembly is connected with the first industrial imaging module and the image processing workstation.

The invention discloses an intelligent image warning system which comprises four support legs, the lower parts of the four support legs are connected into a whole, a baffle plate is arranged in the middle of the support leg, an industrial personal computer is arranged above the baffle plate, the top end of the support leg is fixedly connected with the bottom of a working table, an energy meter placement area is arranged in the middle of the upper surface of the working table, the middle of the rear end of the working table is fixed with the bottom end of a column, a photoelectric sensor is arranged at the lower part of the column, a sensing end of the photoelectric sensor points to the energy meter placement area, the middle of the column is vertically fixedly connected with a support rod, the support rod is parallel with a rear frame of the working table, a display screen is fixedly arranged at the upper end of the support rod, the top end of the column is fixedly connected with a fixing rod, the fixing rod is located right above the energy meter placement area, an industrial imaging device is fixed at the bottom of the fixing rod, and a camera of the industrial imaging device vertically points to the energy meter placement area. The system is applied to the processes of lead sealing and inspection of appearance of a nameplate in the production process of an intelligent energy meter, whether the appearance is qualified is automatically detected, so that the working efficiency is improved, and potential quality hazards is reduced.