The present invention relates to a device (1) for determining the temperature of an
adhesive layer (3) applied on a surface (2), comprising a first temperature measuring unit (7, 7a) for detecting, in a non-contact manner, a first temperature (Ta) or temperature distribution (T), a first deflection means (6, 6a) which is configured to deflect heat
radiation from the applied
adhesive layer (3) to the first temperature measuring unit (7, 7a), and a
control unit (8) which is configured to process the detected first temperature (Ta) or temperature distribution (T). The present invention also relates to a method for estimating a temperature (Tf) of an
adhesive layer (3) applied on a surface (2) in a joining point, comprising the following steps: producing a relative movement with a relative speed (v) in an advancing direction (X) between the surface (2) and an application unit (12), which applies the adhesive (3) to the surface (2) with an application temperature (T0), and a temperature measuring unit (7, 7a, 7b) which is arranged downstream of the application unit (12) and upstream of the joining point in the advancing direction, determining a first temperature (Ta) of a point on the adhesive layer (3) at a first measuring time (ta) and a second temperature (Tb) of the same point on the adhesive layer (3) at a second measuring time (tb), calculating a
temperature difference (ΔT) on the basis of the first temperature (Ta) and the second temperature (Tb), calculating an estimated cooling function on the basis of the
temperature difference (ΔT) and a
time difference (Δt) between the first measuring time (ta) and the second measuring time (tb), and extrapolating an estimated temperature (Tf) in the joining point. The present invention also relates to a method for detecting the evenness of an adhesive layer (3) applied on a surface (2), comprising the following steps: producing a relative movement with a relative speed (v) in an advancing direction (X) between the surface (2) and an application unit (12), which applies the adhesive (3) to the surface (2) with an application temperature (T0), and a temperature measuring unit (7, 7a, 7b) which is arranged downstream of the application unit (12) in the advancing direction (X) and has a measuring frequency and a flat measuring region, determining a first temperature distribution in a portion (A1-A6) of the adhesive layer (3) at a first measuring time, and identifying defective points in the adhesive layer (3) on the basis of deviations in the temperature distribution.