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43results about How to "Control behavior" patented technology

Application of the invoke facility service to restrict invocation of compound wireless mobile communication services

The principal purpose of this invention is to provide the mechanism for enhancing the safe use of a wireless mobile terminal (smartphone) in a moving vehicle. The Invoke facility service's Boolean expression controls the conditions for which a smartphone app will be invoked into execution. Hence, smartphone apps, which create dangerous circumstances when executed in a moving vehicle, can be prevented from invocation. The total elimination of smartphone use in a moving vehicle is inadvisable. For example, an app that deploys an accelerometer to sense the impact of a vehicle's serious collision and thereby calls “911” to transmit a recorded message that includes the vehicle's GPS location should be allowed to execute when a vehicle is moving. This invention allows an app builder to select suitable invocation conditions for an app.
Significant and pertinent to the invention is the manner in which the Boolean logic operation “Not” is used. Whereas conventional apps are invoked by a positive assertion of an event; the use of the operation “Not” avails negative event assertions in the Boolean expression of an Invoke facility service. That is, the contradiction of an event is also an event; meaning that if an event is false, its contradictory event is true. Another important Boolean logic aspect of this invention is the conjunctive operation of “and then”. The “And Then” operation possesses the same functionality as the conjunctive operation of “And”, but “And Then” also possesses a sequential implication for determining the occurrence of events. The sequential implication provides an efficient means to evaluate the Boolean expressions of the Invoke facility service.
Owner:KOBYLARZ THADDEUS JOHN

Method for utilizing micro-channel for cryopreserving rat islet cells at low temperature

The invention provides a method for utilizing a micro-channel for cryopreserving rat islet cells at low temperature. Restricted space of the micro-channel is utilized for making a three-dimensional structure of supermolecule gel changed, so that the rat islet cells are well protected. Specifically, gelator with the low molecular weight is dissolved into a cell culture medium, after the gelator is dissolved, rat islet cell suspension liquid containing the gelator is prepared; the suspension liquid is guided into the micro-channel and placed into an ice-water bath at the temperature of 3 DEG C-5 DEG C to be gelatinized, then a cryopreserving protective agent is guided into the micro-channel, and slowly permeates into the cells, and finally, the micro-channel device is arranged in a programmed freezing box to be placed into a refrigerator at the temperature of minus 75 DEG C-minus 85 DEG C to be cryopreserved. The new method is provided for freezing the rat islet cells. The freezing point of a freezing system is lowered, freezing damage to the rat islet cells in the freezing process is reduced, the survival rate of the rat islet cells is increased, the activity and the function of the rewarmed rat islet cells are maintained, and the method has a wide application prospect.
Owner:WUHAN UNIV OF TECH

Wafer-level test structure and test method for a DRAM chip

A wafer-level test structure of a DRAM chip according to the present invention comprises a first power supply pad and a second power supply pad respectively connected to the internal power supply network of the DRAM chip; the second power supply pads are respectively connected to the internal power supply network through a power supply path The setting is to communicate with the internal voltage network through the voltage path, and the voltage path is set on the power path in parallel; the voltage path and the power path are respectively connected with the first transmission gate and the second transmission gate through the input and output terminals, and the first transmission gate and the second transmission gate are connected to each other. The control terminals of the two transmission gates have opposite polarities and are connected to the same control signal. The test method of the present invention is to connect the internal voltage network to the non-test power supply pad, and then respectively set transmission gates on the connection paths between the non-test power supply pad and the internal power supply network and the internal voltage network, two The control terminals of the transmission gate have opposite polarities and are connected to the same control signal; this power supply pad is used as a test pad during wafer-level testing.
Owner:XI AN UNIIC SEMICON CO LTD
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