The invention relates to the technical field of defect detection, and discloses an
integrated circuit mask plate defect multispectral cooperative detection method, which comprises the following steps: carrying out preliminary scanning on a
mask plate by using a multispectral camera, selecting an optimal
wave band combination, switching to a target
wave band through a
liquid crystal adjustable
optical filter, and obtaining a high-confidence
multispectral image; the
optical path offset is calculated through the
linear relation, the
deflection angle of the micro-mirror is dynamically adjusted, and images are collected for the second time after imaging offset is compensated; image filtering and registration are completed in the FPGA, and a high-contrast
fusion image is generated; if the confidence coefficient is insufficient, triggering a
wave band reselection mechanism to recheck; dynamically optimizing a defect type-spectrum mapping table based on real-time detection data; when the environment fluctuation exceeds the limit, an anti-interference mode is automatically switched, and micro-mirror calibration is triggered; and monitoring performance degradation of the optical
assembly in real time, switching redundant optical paths, cleaning damaged parts, triggering manual reinspection when conflicts occur, and finally generating a visual report. According to the invention, the detection accuracy of the
integrated circuit mask plate can be improved.