The invention discloses a high-voltage electronic static discharge (ESD) protection device with a positive-negative (PN) junction auxiliary trigger silicon controlled rectifier-laterally diffused metal oxide semiconductor (SCR-LDMOS) structure. The high-voltage ESD protection device comprises a P-type substrate, wherein a buried oxygen layer is arranged on the P-type substrate, a shift region is arranged on the buried oxygen layer, an N-buffer region, a P region and a P-body region are sequentially arranged on the shift region from left to right, a first drain heavily-doping N+ region and a first drain heavily-doping P+ region are sequentially arranged in the N-buffer region from left to right, a second source heavily-doping N+ region, a second source heavily-doping P+ region and a third source heavily-doping P+ region are sequentially arranged in the P-body region from left to right, and the P region and the second source heavily-doping P+ region are connected through a wire. When a drain of the ESD protection device encounters a positive ESD pulse, a reverse bias PN junction is used for helping improving the hole carrier concentration before trigger starting, and a trigger voltage V<t1> is reduced; and moreover, with the introduction of the reverse bias PN junction into the device, the positive and negative feedback effect of a parasitic SCR can be effectively prevented, thus, the maintaining voltage V<h> of the device can be effectively increased, and the latch-up effect of the device is prevented.