The invention discloses a preparing method of a parasitic vertical PNP in the BiCMOS process, which comprises steps of 1, ion implantation of a buried layer, N type epitaxial growth and formation of an active region, 2, ion implantation of a subsided connection layer, 3, P-well isolating ion implantation of a CMOS, 4, N-well ion implantation of the CMOS, 5, forming a layer of oxide thin film through the oxidizing annealing treatment, growing base polysilicon and implanting boron as a P-type emitter, and finally etching away the base polysilicon in the non-vertical PNP region. The invention further discloses a parasitic vertical PNP in the BiCMOS process, which utilizes the P-well isolating ion implantation to form a collector electrode, uses the N-well reverse-punch ion implantation to form a base electrode, and utilizes base polysilicon implanted with boron as an emitter. By adjusting the ion implantation conditions of the N-well and the P-well, the invention can prepare parasitic vertical PNP triodes without adding a photomask or other cost, thereby increasing amplifying coefficient and cutoff frequency.