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179results about How to "Reduce time and cost" patented technology

Service searching system

A service searching system for searching a service in a distributed system comprises a wireless server device and a wireless terminal device. The wireless server device is connected to a network and implements a master search service. On the other hand, the wireless terminal device implements a slave search service, and is capable of communicating with the server by wireless and utilizing the master search service. Besides, the wireless terminal device comprises a storage means that caches service objects obtained through the master search service. In addition, in searching the slave search service for a service, the wireless terminal device begins by searching the service objects cached in the storage means. In the case where the service is not detected, the wireless terminal device searches the master search service. The service objects are cached by being related to priority data. Thereby, there is provided a service searching system comprising a wireless terminal device, which is intended to search for a service in a distributed system in which a range of services are distributed in a network, wherein it is possible to cut down a service-searching time and costs, and further, it is possible to cut down communication interruptions by noise etc. in the wireless communication section compared to the conventional one.
Owner:NEC CORP

Methodology for improved semiconductor process monitoring using optical emission spectroscopy

In a semiconductor process which utilizes a plasma within a process tool chamber, a method of using optical emission spectroscopy (OES) to monitor a particular parameter of the process is disclosed. A first wavelength present in the plasma is determined which varies highly in intensity depending on the particular parameter by observing a statistically significant sample representing variations of the particular parameter. A second wavelength of chemical significance to the process is also determined which is relatively stable in intensity over time irrespective of variations of the particular parameter, also by observing a statistically significant sample representing variations of the particular parameter. These two wavelengths may be determined from test wafers and off-line physical measurements. Then, the intensity of the first and second wavelengths present in the plasma is measured on-line during normal processing within the process tool chamber, and the ratio between the first and second wavelength's respective intensities generates a numeric value which is correlated to the particular parameter. As an example, such a method may be used to generate a reliable alarm signal indicating the presence of etch stop conditions within a plasma oxide etcher, as well as to indicate the oxide etch rate.
Owner:ADVANCED MICRO DEVICES INC

Machine for aligning items in a pattern and a method of use

A machine for aligning items in a pattern and a method of using the machine. The machine includes a robotic assembly having four spaced apart joints. The joints including a base joint which is mounted to a stationary surface and a wrist joint onto which an effector is secured. A suction cup is mounted on the effector and is connected to a vacuum source. The suction cup is capable to picking up, positioning and releasing a new item relative to a first laid item and a second laid item. The first and second laid items each have an upper surface and each is aligned perpendicular to one another. The machine further includes three edge sensors and three height sensor. At least one of the edge and height sensors are secured to a first side of the effector and is capable of detecting an edge aligned along an X-X axis of the first laid item and the height of the upper surface of the first laid item, and at least one of the edge and height sensors are secured to a second side of the effector and is capable of detecting an edge aligned along a Y-Y axis of the second laid item and the height of the upper surface of the second laid item. The machine further includes a control mechanism for operating the robotic assembly, the vacuum source and the edge and height sensors. Lastly, the machine includes a power source for supplying power to the control mechanism.
Owner:DREW GARY LEE
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