4results about How to "Easy visual inspection" patented technology

The application relates to a carrier jig, which comprises a base for placing a carrier, an ejecting mechanism arranged on the base and used for pushing the carrier on the base, and a return mechanism arranged on the base and connected with the ejecting mechanism and used for automatically returning to the original position after the ejecting mechanism is in place after pushing the carrier. The carrier jig provided by the application can move the carrier in the rack out, facilitate visual inspection of an operator, and prevent the product from being damaged, overturned and the like during the taking-out process.

The application relates to an optical-electric device blister box with multi-tail fiber length compatibility, and relates to the technical field of optical communication device packaging. The blister box comprises a transparent protective upper cover and a black protective base, and the two are buckled to form an integrated structure, have good sealing and protection performance, and the black protective base is provided with symmetrical left and right buckles and outer upper and lower buckles, facilitating firm closure and stacked storage. The upper surface of the base is provided with a wavy tail fiber groove capable of accommodating tail fibers with different lengths; the left end of the tail fiber groove is provided with a device limiting groove, and the right end is provided with an adapter placing groove, the placing groove is provided with a tail rubber sleeve limiting buckle, and the tail end of the tail fiber is stably fixed. The left side of the device limiting groove is also provided with a device pin / soft plate placing groove, and the left side of the tail rubber sleeve limiting buckle is provided with a multi-point limiting convex point groove, thereby providing multi-section positioning support. The application can effectively avoid tail fiber bending damage and improve the safety of device transportation and storage.

The utility model relates to the technical field of semiconductor test, especially a test fixture for silicon substrate and bare chip, including base, movable lid is located the upper casing of base, and is located the compression mechanism on the upper casing, be equipped with test cavity on the base, the compression mechanism includes effort assembly and slow pressure subassembly, slow pressure subassembly lower part extends to the test cavity, slow pressure subassembly includes upper pressure plate and lower pressure plate, and upper pressure plate is movably arranged below the upper casing and is with effort assembly resistance, lower pressure plate is movably arranged below upper pressure plate, and at least one buffer layer is equipped between upper pressure plate and lower pressure plate, through multilayer flexible limiting and adjustable compression mechanism, realize the nondestructive test of chip, and compatible different thickness device.

This utility model relates to the field of cable branch box technology, specifically a photovoltaic energy storage cable branch box with fault alarm function, comprising: a box body with an alarm device installed on it; a cover plate that can be opened and closed on the box body; horizontal and vertical copper busbars installed inside the box body; and a detection component installed on the cover plate, which detects the temperature at the connection point of the horizontal and vertical copper busbars. The detection component includes: a plate detachably connected to the cover plate; and a sensor installed on the plate, the position and direction of which are adjustable. The detection component also includes: an inner ring; connecting beams connecting the inner ring and the plate; and mounting holes in the inner ring, in which the sensor is installed. The connecting beams are arc-shaped, and several connecting beams are evenly distributed around the outer periphery of the inner ring. It can monitor local overheating faults in real time and automatically issue an alarm when an abnormality is detected.