52results about How to "Increase turn-on current" patented technology

The invention provides a photomask, a thin film transistor element and a manufacturing method of the thin film transistor element. The photomask comprises a first shading pattern, a second shading pattern, a translucent single slit and a semi-translucent pattern, wherein the translucent single slit is positioned between the first shading pattern and the second shading pattern; the width of the translucent single slit is between 1.5 and 2.5 microns; and the semi-translucent pattern is connected with the first shading pattern and the second shading pattern. The photomask adopts a design of the translucent single slit and the semi-translucent pattern, wherein the translucent single slit can reduce the channel length making the thin film transistor element; and the semi-translucent pattern can define an extension part of a semiconductor layer. Therefore, the thin film transistor element has a higher starting current.

The invention discloses an array substrate, a manufacturing method of the array substrate, a display panel and a display device. The array substrate comprises multiple first thin film transistors which are arranged in a display area, wherein each first thin film transistor comprises a first active layer and the material of the first active layer includes amorphous silicon; and at least one multiplexer which is arranged in a non-display area. The multiplexer comprises multiple second thin film transistor, one input end and multiples control signal lines. The first electrode of each second thinfilm transistor is electrically connected with the input end, the second electrode of each second thin film transistor is electrically connected with different data lines in the display area, and thecontrol end of each second thin film transistor is electrically connected with different control signal lines. Each second thin film transistor comprises a second active layer, and the material of thesecond active layer includes polysilicon. The material of the second active layer includes polysilicon so that the number of leads connected with the data lines can be reduced on the basis of meetingthe signal transmission speed of the data lines and the frame can be reduced.

The invention provides an amorphous indium zinc oxide/carbon nanotube composite film transistor. A flexible indium zinc oxide/carbon nanotube composite film is taken as a semiconductor channel layer. In the composite film, a mass ratio of the carbon nanotube to the indium zinc oxide is between 0.027% and 2.74%. The carbon nanotube is added into an indium salt-zinc salt composite colloid solution so as to prepare a carbon nanotube/ indium salt-zinc salt composite colloid solution. A spin coating technology is used to prepare the indium zinc oxide/carbon nanotube composite film with high performance. And then through subsequent thermal annealing, photoetching, etching, photoetching, evaporation and stripping of an electrode, an indium zinc oxide/carbon nanotube composite film field effect transistor with high mobility can be prepared. Through optimizing some technologies, the indium zinc oxide/carbon nanotube with the high field effect and the mobility can be successfully prepared and the indium zinc oxide/carbon nanotube possesses a high mechanical property. Experimental costs are low. A requirement to an experiment condition is low. Repeatability of an experiment result is high. Large-scale batch production can be realized.

The invention provides an array substrate, a manufacture method of the array substrate, a liquid crystal display panel and a display device, and belongs to the field of liquid crystal display. A source electrode and a drain electrode of the array substrate are located at different layers. In the manufacture method of the array substrate, the source electrode and the drain electrode located at different layers are respectively formed through twice picture composition processes. By adopting the array substrate, the manufacture method of the array substrate, the liquid crystal display panel and the display device, the channel length between the source electrode and the drain electrode can be reduced as far as possible, and further starting current Ion of thin film transistors (TFTs) is greatly improved.

The present application provides a thin film transistor, a display substrate and a liquid crystal display device, so as to increase the turn-on current of the thin film transistor and reduce the turn-off current of the thin film transistor. The thin film transistor provided by the present application includes: a gate electrode, a gate insulating layer, and an active layer arranged on the substrate in sequence, and also includes: a source electrode arranged on the active layer, and an electrode arranged on the The drain between the gate insulating layer and the active layer.

The invention relates to a TFT-LCD array substrate and a manufacturing method thereof. The array substrate comprises a grid wire, a data wire, a pixel electrode and a thin film transistor. The array substrate is characterized in that the thin film transistor comprises a grid electrode connected with the grid wire and a source electrode connected with the data wire; at least one through hole is formed on the grid electrode or a through groove is formed on at least one side of the grid electrode; and a semiconductor layer which is connected with the pixel electrode and the source electrode respectively is filled in the through hole or the through groove. The array substrate changes a 'planar type' TFT structure which is universally adopted in the prior art, changes the planar structure into a spatial structure, and has the characteristics of simple and compact structure, good parameter property, simple manufacturing process and the like. The array substrate realizes the effect of increasing the starting current and has certain improvement on other electrical parameters, and the spatial structure of the array substrate reduces the planar size and increases the spatial utilization rate so as to increase the opening ratio.

The invention provides a semiconductor memory. The semiconductor memory is not provided with a control grid, wherein as a first erasure grid and a second erasure grid are respectively arranged on a first floating grid and a second floating grid, the semiconductor memory can directly conduct the erasure operation through the first erasure grid and the second erasure grid in the erasure stage, a higher erasure pressure does not need to be applied to a first bit line or a second bit line, therefore, the thickness of a word line oxidizing medium layer between the bit line and a semiconductor substrate can be reduced, the firing current is improved, the leak current can also be reduced at the same time, a lower closing current is kept, meanwhile, the reading current of the bit line is reduced during reading, so that the power consumption of the semiconductor memory is saved.

The invention discloses an asymmetric reconfigurable field effect transistor. The transistor includes a trench; a drain electrode arranged at one end of the trench; a source electrode which is arranged at the other end of the trench and extends into the trench; gate oxide which is arranged at the outer side of the channel; a control grid electrode and a polar grid electrode which are respectivelyarranged at the source electrode end and the drain electrode end and outside the grid electrode oxide; side walls which are respectively arranged outside the two ends of the trench and used for electrically isolating the control grid electrode, the polar grid electrode, the source electrode and the drain electrode; and the grid isolation part which is arranged outside the grid electrode oxide andused for isolating the control grid electrode from the polar grid electrode. The contact area between the source end extending into the trench and a nanowire trench is larger, the tunneling area of carriers is increased, and the starting current is increased. In a switching-off state, a drain electrode structure and a common RFET drain electrode structure have the same non-overlapping area, and aleakage current is basically kept unchanged, so that the current switch ratio is improved, and the operation delay time of a logic gate current is shortened under the condition that the static power consumption is not changed.

The invention relates to the technical field of liquid crystal display, and discloses a thin film transistor, an array substrate and a display device. The thin film transistor is arranged on a substrate base plate; in the direction vertical to the surface of the substrate base plate, the broadside outline of a channel of the thin film transistor comprises a curved section which changes up and down in a curved line, so that the width-to-length ratio of the channel can be increased under the condition that the projection area of the thin film transistor on the substrate base plate is fixed; the firing current of the thin film transistor is increased; and the performance of the thin film transistor is improved. Meanwhile, the performance of the thin film transistor can be ensured; the size of the thin film transistor is reduced; the resolution ratio of the display device is increased; and the display quality is ensured.

The invention discloses a display driving device and method, a shifting register and a display device. The display driving device comprises a time schedule controller and the shifting register, wherein the shifting register comprises a logical control unit and a power switching unit which are connected with each other; the power switching unit is configured with more than one group of high-voltage driving clock signals; the logical control unit is used for controlling the power switching unit to select and output one group of the more than one group of high-voltage driving clock signals according to a sub-pixel line position displayed by a current driver and/or current temperature information provided by the time schedule controller to serve as the high-voltage driving clock signal of the shifting register. By adopting the display driving device and method, the shifting register and the display device in the embodiment of the invention, proper high-voltage driving clock signals can be selected specific to different conditions, and the problem of defective grating line caused by insufficient charging is solved.

A semiconductor device and a forming method thereof are provided. The forming method of the semiconductor device comprises the following steps: providing a semiconductor substrate; performing first doping on the semiconductor substrate to form a first doped region; forming a patterned mask layer on the surface of the semiconductor substrate, wherein the patterned mask layer has an opening which exposes the surface of the semiconductor substrate; etching part of the semiconductor substrate in the thickness direction with the patterned mask layer as a mask to form a groove in the semiconductor substrate; and performing second doping on the semiconductor substrate to form a second doped region, wherein the first doping and the second doping are of the same doping type, the doping concentration of the second doping is greater than the doping concentration of the first doping, and the second doped region and the first doped region are connected. By adopting the method of the invention, the opening current of the semiconductor device is increased, the leakage current is reduced, and the electrical performance of the semiconductor device is improved.

The invention discloses a method for manufacturing a metal oxide semiconductor field effect transistor and a device thereof. The manufacturing method comprises the following steps: providing a semiconductor substrate; forming an insulating layer on the surface of the semiconductor substrate; forming a groove on the insulating layer; forming light dope drain regions in the semiconductor substrate below the lateral wall of the groove respectively; forming grid flank walls on the lateral wall of the groove respectively; forming grid dielectric layers on the groove surfaces between the grid flank walls; forming grids in an accommodating space encircled by the grid flank walls and the grid dielectric layers; removing the insulating layer; and forming a source region and a drain region respectively in the semiconductor substrates on two sides of the grid flank walls. The manufacturing method breaks through the limitation of the minimum grid length which can be achieved by a photoetching device, and reduces the length of a channel formed between the source region and the drain region; and the device formed according to the method is helpful for enhancing the firing current and reducing the electric leakage caused by short-channel effect.

The MOSFET features the channel inside the semiconductor substrate, the information channel area constituted with one doped semiconductor layer across the channel, the grid in and over the channel and around the information channel area with grid dielectric layer in between. The grid is separated from the side wall and bottom with one gapping wall and one insulating layer. The manufacture of the MOSFET includes following steps: forming channel filled with insulating layer on the substrate, eliminating the upper layer of the insulating layer, forming gapping wall on the side wall of channel,filling the channel with sacrificial layer; forming and defining one doped semiconductor layer on the substrate to form device area across the sacrificial layer; eliminating the sacrificial and forming grid dielectric layer on the surface of the device; forming conducting layer on the substrate filled into the channel and defining the conducting layer to form the grid; and forming source and drain on two sides of the grid.

The invention provides a thin film transistor device and a preparation method thereof. The thin film transistor device comprises a substrate, an active layer, a gate insulating layer, a conductive layer and a gate layer. The preparation method of the thin film transistor includes a shading layer preparation step, a buffer layer preparation step, an active layer preparation step and a gate layer preparation step. The technical effects of the invention lie in that the conductive layer exists at all positions on the upper surface of the gate insulating layer, the corresponding active layer belowthe whole gate insulating layer is enabled to be controlled, the turn-on current of the thin film transistor device is increased, the electrical characteristics of the thin film transistor device areenhanced, and the display effect of the display device is improved.

The present invention is MOSFET and its manufacture. The MOSFET features the semiconductor substrate with one channel, the passage area being one thin doped semiconductor layer across the channel, and the gate located inside and over the channel and around the passage area with gate dielectric layer in between. The manufacture process includes the steps of: providing one semiconductor substrate and forming one channel on the substrate; filling the channel with sacrificed layer, forming one doped semiconductor layer, defining one element area across the sacrificed layer and exposing partial sacrificed layer; removing the sacrificed layer to expose the lower element area surface over the channel and forming one gate dielectric layer on the surface of element area and the channel; forming one conducting layer on the gate dielectric layer, filling the channel and defining the conducting layer to form gate in and over the channel; and forming source and drain beside the gate.

The invention discloses a memory structure and a manufacturing method thereof. The memory structure includes a substrate, an isolation structure, a memory cell, a first transistor, a first contact window structure and a second contact window structure. The first transistor comprises a first gate structure, a first doped region, a second doped region, a first metal silicide layer and a second metal silicide layer. The first contact window structure is located on the first metal silicide layer. The second contact window structure is located on the second metal silicide layer. The first metal silicide layer is not in contact with the isolation structure. The second metal silicide layer is not in contact with the isolation structure. The top view area of the first metal silicide layer is larger than that of the first contact window structure. The top view area of the second metal silicide layer is larger than the top view area of the second contact window structure.