The invention discloses a high-performance self-test
external reference time-base circuit and an implementation method thereof. The high-performance self-test
external reference time-base circuit comprises an
external reference filtering and amplifying circuit, an external reference self-test circuit, an external reference
phase discrimination filtering circuit, an one-out-of-two switch and a constant-temperature
crystal oscillator, wherein an output end of the external reference self-test circuit is connected with a selection control end of the one-out-of-two switch; an output end of the external reference
phase discrimination filtering circuit is connected with one input end of the one-out-of-two switch; when an external reference
signal is input, the external reference filtering and amplifying circuit partitions the external reference
signal into two paths after filtering and amplifying the external reference
signal; one path of the external reference signal is connected with the external reference
phase discrimination filtering circuit; the other path of the external reference signal is connected with the external reference self-test circuit; and the one-out-of-two switch is controlled to be switched to an output end of the external reference phase discrimination filtering circuit in order to perform loop
phase locking on the external reference signal. The high-performance self-test external reference time-base circuit has the beneficial effects that a complete
machine can decide whether to use the external reference signal not under the control of an FPGA (
Field Programmable Gate Array) even when the external reference signal is input.