This invention discloses a method for designing a
radiation-resistant test
chip to evaluate various single-event effects, comprising:
design data preparation;
chip placement and routing: constructing test chain circuits based on the
design data, placing and routing each test chain circuit, exporting placement and routing data after passing preliminary design rule checks, and extracting parasitic parameter files based on the placement and routing data;
static timing analysis: performing timing analysis based on the current placement and routing data and parasitic parameter files to determine if there are timing violations. If so, return to the previous step for redeposition and routing; otherwise, proceed to the next step;
physical verification: using
physical verification tools to perform DRC design rule checks and LVS comparisons. If errors are found, return for redeposition and routing; otherwise, proceed to the next step;
formal verification: determining whether the logical functions of the
netlist files before and after placement and routing are completely equivalent. If not, return for redeposition and routing; if equivalent, the design ends.