47 results about "Refractive index dispersion" patented technology

A interferometer type polarization beam combiner and splitter, which can combine or split polarized light over a wide band, is provided. The interferometer type polarization beam combiner and splitter includes: an optical splitter; an optical coupler; an optical path length difference imparting unit, which includes a plurality of optical waveguides arranged between the optical splitting unit and the optical coupling unit; one or two input / output ports connected to the optical splitter; and two input / output ports connected to the optical coupler. A half-integer of a wavelength of λc is set as a normalized phase difference, for the optical path length difference imparting unit, between two polarization states, and means for generating a difference in refractive index dispersion is provided between the optical waveguides of the optical path length difference imparting unit, so that the change rate of the transmittance with respect to wavelength is suppressed for the two polarization states.

The invention discloses a transparent medium film refractive index and thickness on-line measuring method. The method comprises the following steps: obtaining a film surface reflection spectrum: using an on-line spectrum measuring apparatus for measuring a film surface reflection spectrum of a predetermined wavelength scope of a film sample to be measured; setting Cauchy optical model parameters: according to the characteristic of the film surface reflection spectrum and influence of the parameter in the Cauchy optical model to a refractive index dispersion relation, performing initial setting of the thickness and Cauchy optical model parameters to form an initial value; performing a genetic algorithm: by using the genetic algorithm and combining the film surface reflection spectrum, through the initial value, controlling a genetic process by setting the parameters of the genetic algorithm, and finally obtaining the film refractive index and film thickness. By establishing the film Cauchy optical model and fully combining the genetic algorithm, reasonable parameters can be set according to the spectrum characteristic of the practical films, so that analysis convergence speed can be faster, and result can be more accurate.

In one aspect of the present invention there is provided an optically anisotropic compensation panel with spectrally controllable dispersion of refractive indices. The compensation panel comprises at least one optically anisotropic layer based on an ordered guest-host system. The guest-host system comprises an anisotropic host matrix including an organic compound transparent to electromagnetic radiation in the visible spectral range, and guest component having guest particles. In another aspect the present invention provides a method of producing an optically anisotropic compensation panel disclosed. And in yet another embodiment the present invention provides a liquid crystal display with the compensation panel disclosed.

The invention discloses a detection system for refractive index refractive dispersion properties and a detection method thereof. The detection system for the refractive index dispersion properties comprises a transparent carrier (100) used for holding an object to be detected (110) and matching fluid (120), a temperature adjusting device (190) used for changing and acquiring the temperature of the transparent carrier (100), a broadband light source (200) used for emitting broadband light to the transparent carrier (100), an imaging device (300) used for forming a wavelength matching image of the transparent carrier (100) which at least contains two-dimensional information by the broadband light, and a computation processing device (400) used for converting the wavelength matching image of the transparent carrier (100) at least containing the two-dimensional information into a corresponding electric signal, and analyzing the electric signal by combining the temperature acquired by the temperature adjusting device (190) to obtain the refractive index refractive dispersion properties of the object to be detected (110).

The invention provides a dual-wavelength optical phase delayer. A single crystal wafer is a parallel plane mirror made of single-axis birefringence crystal, and the optical axis of the crystal is parallel to two optical planes. In the spectral range of the used single-axis birefringence crystal, the optical phase delayer meeting the requirements that two wavelengths are 1 / 4 or 1 / 2 or one wavelength is 1 / 4 and the other wavelength is 1 / 2 phase retardation is manufactured by using the single birefringence crystal wafer according to the concrete application requirements. The thickness conditions of the single crystal wafer which are necessarily met and the design steps based on the conditions are given: 1) the designed wavelengths lambda<1> and lambda<2> and the fractional values c<1> and c<2> of phase retardation are determined; 2) the used birefringence crystal is determined, and birefringence deltan<1> and deltan<2> are obtained according to the refraction index dispersion formula of the crystal; 3) when k<2> is natural numbers 1,2,3,......, the corresponding values of series k<1> are obtained through numerical calculation; and 4) the integers close to k<1> are represented by k<10>, and when the value of a certain k<1> meets the expression ||<=0.005, the thickness of the single crystal wafer is determined by the value of k<1>.

Disclosed are high refractive index, hydrophobic, acrylic materials. These materials have both high refractive index and a high Abbe number. This combination means the materials have a low refractive index dispersion and thus are especially suitable for use as intraocular lens materials. The materials are also suitable for use in other implantable ophthalmic devices, such as keratoprostheses, corneal rings, corneal implants, and corneal inlays.

Disclosed are high refractive index, hydrophobic, acrylic materials. These materials have both high refractive index and a high Abbe number. This combination means the materials have a low refractive index dispersion and thus are especially suitable for use as intraocular lens materials. The materials are also suitable for use in other implantable ophthalmic devices, such as keratoprostheses, corneal rings, corneal implants, and corneal inlays.

Three or more base optical materials are selectively combined into a trans-gradient index (GRIN) optical element (e.g., a lens). A wavelength-dependent index of refraction for light propagating perpendicular to the three or more optical materials equals: a volume fraction of a first optical material multiplied by a refractive index of the first optical material, plus a volume fraction of a second optical material multiplied by a refractive index of the second optical material, plus one minus the volume fraction of the first optical material and the volume of the second optical material all multiplied by the refractive index of a third optical material. The wavelength-dependent index of refraction distribution and a refractive index dispersion through the GRIN optical element may be independently specified from one another. A local refractive index at any point in the optical element is a fixed function of a refractive index of each individual optical material.

The invention provides an optical element that has a low refractive-index chromatic dispersion, a high degree of freedom in molding or forming as is the case with synthetic resins, and moldability or formability that lends itself to mass production. The optical element is obtained by molding or otherwise forming a composition containing a first material that is a fine particle having an Abbe number vd of 80 or greater indicative of a chromatic dispersion in a visible range and having a size of less than 400 nm, and a second material that is an organic / inorganic hybrid material comprising an organic polymer material having a carbon-carbon bond in a main chain and an inorganic component.

The invention provides a film quality detection method and device, electronic equipment and a storage medium, and relates to the field of film quality control. The film quality detection method comprises the following steps: according to a physical mathematical model of a film sample and an ellipsometry detection curve obtained by ellipsometry detection of the film sample, taking an intrinsic refractive index dispersion expression of a film material as a characteristic parameter, and performing inversion to generate an ellipsometry simulation curve of the film sample; calculating the fitting degree of the ellipsometry detection curve and the ellipsometry simulation curve; and when the fitting degree is close to or greater than a preset fitting degree threshold value, determining that the quality of the film sample reaches a preset standard. The problems that in the prior art, film quality detection precision is low, detection procedures are complex, and evaluation standards lack quantitative indexes can be solved.

The invention discloses a parallel plate optical parameter measuring method based on a sampling function, and the method comprises the steps: firstly carrying out phase-shifting sampling in a Fizeau wavelength phase-shifting interferometer, and respectively obtaining interference patterns for placing a to-be-tested parallel plate and a cavity; secondly, obtaining a feature map of a phase shift algorithm according to actual target requirements, writing a feature polynomial of the phase shift algorithm, expanding by utilizing a Taylor formula to obtain the sampling function of the algorithm, andsubstituting the acquired interference light intensity data into the algorithm for calculation; and finally, extracting phase information at different target frequencies by using different sampling functions, recovering the phase information into wave surface information, and calculating to obtain the surface shape, the optical thickness and the optical uniformity parameter of the to-be-tested parallel flat plate. By designing the sampling function of the phase shift algorithm, measurement errors caused by frequency shift due to refractive index dispersion and wavelength tuning nonlinearity are reduced, required interference patterns are few, operation is simple, and the method can be used for high-precision measurement of optical parameters of large-aperture optical materials.

A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference data base of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material is also disclosed.

The invention provides a zoom lens and an imaging apparatus including the zoom lens, wherein the zoom lens is miniaturized, variation of chromatic aberration on an axis from a wide-angle end to an intermediate region is well suppressed, and the zoom lens has high optical performance. The zoom lens consists of, in order from an object side: a positive first lens group that does not move during zooming; a middle group that consists of two or more movable lens groups moving during zooming; and a subsequent group that has a lens group including a stop at a position closest to the object side. Themiddle group has at least two negative movable lens groups. The subsequent group includes at least one positive LA lens that satisfies predetermined conditional expressions relating to the refractiveindex, the Abbe number, and the partial dispersion ratio.

The invention discloses low-softening-point optical glass as well as a prefabricated part thereof, an element and an apparatus, and solves the problem that glass production cost needs to be increasedfor overcoming influences caused by too high La2O3 content on performances such as a refractive index, chromatic dispersion and a crystallization upper limit temperature. The low-softening-point optical glass is prepared from the following components in percentage by weight (wt%): 25-45% of B2O3, 30-50% of La2O3, 0-10% of Gd2O3, 3-20% of Y2O3, and 0-8% of Li2O, wherein a ratio of Li2O to Gd2O3 is0.1 or above. According to the invention, composition and a proportion are reasonably optimized, so that usage amount of Gd2O3 and Ta2O5 is reduced while the refractive index can be increased or chromatic dispersion can be reduced; the cost is reduced; and a glass transition temperature can be effectively reduced; and meanwhile, glass transmittance is effectively increased; pigmentation degree isreduced; and lambada80 of the glass is controlled to be 390 nm or below, and lambada5 is controlled to be 300 nm or below.

The invention discloses colorless optical glass, a glass prefabricated part thereof, an element and an instrument. The problem is solved that in the prior art, in order to overcome the influence of high La2O3 content on refractive index, chromatic dispersion, crystallization upper limit temperature and other performance, the production cost of glass needs to be increased. The glass comprises, by wt%, 25-45t% of B2O3, 30-50t% of La2O3, 0-10t% of Gd2O3 and 3-20t% of Y2O3. The specific value of Gd2O3 to La2O3 is 0.01-0.3. According to the optical glass, through reasonable optimization of composition and matching, the refractive index is increased, the chromatic dispersion is reduced, the application amount of Gd2O3 and Ta2O5 is reduced, the cost is reduced, it is effectively guaranteed that the crystallization upper limit temperature of the glass is not increased, the glass formation performance is better, glass bubbles are not easily generated in the founding process, and good optical performance and formation performance are also guaranteed.

A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

The present invention relates to a conjugated aromatic compound represented by the Formula (1) in claim 1 (in the formula, Ar1 represents a hydrogen atom or an aryl group optionally having a substituent; Ar2 and Ar3 each represent a hydrogen atom or an aryl group optionally having a substituent but at least one of Ar2 and Ar3 represents an aryl group optionally having a substituent; and A represents an aromatic hydrocarbon group) and relates to an optical material containing the conjugated aromatic compound. The conjugated aromatic compound and the optical material have characteristics of a high chromatic aberration correction function, high refractive-index dispersion characteristics (Abbe number (vd)) and high secondary dispersion characteristics (θg,F) (anomalous dispersion characteristics).

The invention discloses a large-view field wide-spectrum afocal optical system. Incident light and emergent light are parallel light beams, and the system sequentially comprises, from an object side to an image side, a first lens group with a negative focal length, a second lens group with a negative focal length, and a third lens group with a positive focal length. Specifically, the lens of the first lens group is made of glass with a refractive index nd of greater than 1.6 and chromatic dispersion vd of smaller than 50, an incident surface of the first lens group closest to the object side is a convex surface, an emergent surface closest to the image side is a concave surface; the lens of the second lens group is made of glass with a refractive index nd of smaller than 1.6 and chromaticdispersion vd of greater than 50, and an incident surface of the second lens group closest to the object side is a convex surface, an emergent surface closest to the image side is a concave surface; the lens of the third lens group is made of glass with a refractive index nd of smaller than 1.6 and dispersion vd of greater than 50, an incident surface of the third lens group closest to the objectside is a convex surface, and an emergent surface of the third lens group closest to the image side is a convex surface. According to the invention, an ideal imaging quality is achieved in a relatively wide wave band and large view field range.

Disclosed are high refractive index, hydrophobic, acrylic materials. These materials have both high refractive index and a high Abbe number. This combination means the materials have a low refractive index dispersion and thus are especially suitable for use as intraocular lens materials. The materials are also suitable for use in other implantable ophthalmic devices, such as keratoprostheses, corneal rings, corneal implants, and corneal inlays.

The invention provides a compound sodium octaborate decafluoride, and a sodium octaborate decafluoride nonlinear optical crystal, a preparation method and application thereof, wherein the chemical formula of the compound is Na4B8O9F10, the molecular weight is 512.44, the compound is prepared by adopting a hydrothermal method or a vacuum packaging method, the compound belongs to an orthorhombic system, the space group is Pna2[1], the cell parameters are that a is 18.680(18)angstrom, b is 15.852 (16)angstrom, c is 4.816 (4) angstrom, alpha is 90 degrees, beta is 90 degrees, gamma is 90 degrees, the unit cell volume is 1425.9(7)angstrom<3>, the frequency doubling effect of the crystal is 0.7 * KH2PO4 (@1064 nm) and 0.1 * beta-BaB2O4 (@532 nm), the ultraviolet absorption edge is shorter than 200 nm, the crystal is grown through a melt method, a high-temperature melt method, a vacuum packaging method, a hydrothermal method or a room-temperature solution method, and the crystal is good in chemical stability and small in refractive index dispersion and can serve as a deep ultraviolet transmission nonlinear optical crystal to be applied to an all-solid-state laser.

The invention provides precision measurement device and method for an optical material refractive index. By adopting the device and the method, combination of a wide spectrum analysis method and a Fabry-Perot interference method can be achieved, accurate optical material thickness and refractive index are obtained by global residual analysis, and spectral analysis is carried out through a wide spectrum method Fabry-Perot interference system, so as to obtain a refractive index dispersion curve of the optical material under a continuous wave band. By adopting the device and the method, the measurement accuracy of the refractive index is improved, a stable interference cavity is formed by using parallel plate structures of most of optical materials, effects on the stability of an interference signal caused by air agitation are reduced, the optimal material is prevented from being processed into a special shape, and nondestructive measurement of the optical material is achieved.

The invention provides a dual-wavelength optical phase delayer. A single crystal wafer is a parallel plane mirror made of single-axis birefringence crystal, and the optical axis of the crystal is parallel to two optical planes. In the spectral range of the used single-axis birefringence crystal, the optical phase delayer meeting the requirements that two wavelengths are 1 / 4 or 1 / 2 or one wavelength is 1 / 4 and the other wavelength is 1 / 2 phase retardation is manufactured by using the single birefringence crystal wafer according to the concrete application requirements. The thickness conditions of the single crystal wafer which are necessarily met and the design steps based on the conditions are given: 1) the designed wavelengths lambda<1> and lambda<2> and the fractional values c<1> and c<2> of phase retardation are determined; 2) the used birefringence crystal is determined, and birefringence deltan<1> and deltan<2> are obtained according to the refraction index dispersion formula of the crystal; 3) when k<2> is natural numbers 1,2,3,......, the corresponding values of series k<1> are obtained through numerical calculation; and 4) the integers close to k<1> are represented by k<10>, and when the value of a certain k<1> meets the expression ||<=0.005, the thickness of the single crystal wafer is determined by the value of k<1>.

A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

A light source apparatus includes a laser oscillator equipped with a first optical resonator, a plurality of second optical resonators including input portions respectively connected in parallel to the first optical resonator, a plurality of light extraction units configured to extract a light beam from an output portion of each second optical resonator, and a light multiplexing unit configured to multiplex the light beam extracted from each light extraction unit, wherein the light source apparatus causes the light multiplexing unit to output a multiplexed light beam passed through the plurality of second optical resonators, an optical member having refractive index dispersion and an optical amplification medium are disposed in each of the plurality of second optical resonators, and the optical amplification media of the plurality of second optical resonators are different from each other in maximum gain wavelength.