26 results about "Refractive index dispersion" patented technology

The application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display.The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and clearly image the curved surface of an image on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens; the field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses; and the overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be designed as aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The application provides a nitride semiconductor laser with an optical field regulation layer, comprising, from bottom to top, a substrate, a lower limiting layer, a lower waveguide layer, an active layer, an upper waveguide layer, an electron blocking layer and an upper limiting layer, wherein the lower waveguide layer comprises a first lower waveguide layer and a second lower waveguide layer, the first lower waveguide layer is located below the second lower waveguide layer, a first optical field regulation layer is arranged between the first lower waveguide layer and the lower limiting layer, a second optical field regulation layer is arranged between the first lower waveguide layer and the second lower waveguide layer, the first lower waveguide layer, the second lower waveguide layer and the second optical field regulation layer all have an In element concentration variation trend, and the first optical field regulation layer has an Al element concentration variation trend. The application can inhibit the refractive index dispersion of the laser, reduce the influence of the high-concentration carrier concentration fluctuation of the lower waveguide layer on the refractive index variation of the active layer and the lower waveguide layer, improve the confinement factor of the laser and enhance the mode gain of the laser.

An effective nonlinear optical coefficient optimization method for langasite group solid solution crystals is disclosed. The langasite group crystal A3BC3D2O14 mainly includes langanite (LGN) crystal, langatate (LGT) crystal and langasite (LGS) crystal. The solid solution crystals are formed by adjusting a component proportion of langasite group crystals with the same structure, so that different ions mix and occupy sites in a polyhedral group, and a polyhedral lattice structure, distortion degree, refractive index and refractive dispersion of the solid solution crystal are changed. The reduction of the phase matching angle and the improvement of the nonlinear optical coefficient are realized, and the effective nonlinear optical coefficient is finally optimized.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

A method for measuring thickness distribution and refractive index dispersion curve of a liquid film, comprising: covering the liquid film on a SPR sensing module; irradiating a wide-spectrum linearly polarized parallel light beam on the SPR sensing module to obtain reflected light through total reflection, the wide-spectrum linearly polarized parallel light beam exciting SPR mode and / or PWR mode on the SPR sensing module through total reflection; receiving the reflected light carrying information of the liquid film by a hyperspectral imager to obtain a hyperspectral image, pixels in the hyperspectral image corresponding to positions on the liquid film one by one; determining at least three measured resonance wavelengths at a target position corresponding to a target pixel according to the hyperspectral image; obtaining the liquid film thickness at the target position and the refractive index dispersion curve of the liquid film according to the at least three measured resonance wavelengths at the target position; obtaining the liquid film thickness at other positions according to the refractive index dispersion curve of the liquid film at the target position and the measured resonance wavelengths at the other positions; and obtaining the thickness distribution of the liquid film according to the thickness of the liquid film at all positions.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The application provides a film thickness measurement method, a semiconductor device measurement method and a film thickness measurement device. The film thickness measurement method comprises the following steps: obtaining a measured transmittance spectrum of a to-be-measured thin film, a preset wavelength range, a preset optical constant range and an initial thickness value of the to-be-measured thin film; fitting a plurality of theoretical transmittance spectra corresponding to the to-be-measured thin film based on the initial thickness value, the preset wavelength range, the preset optical constant range and a refractive index dispersion model; obtaining an optimal optical constant set based on the measured transmittance spectrum and the plurality of theoretical transmittance spectra; and determining the thickness of the to-be-measured thin film based on a measured ellipsometric parameter spectrum, the preset wavelength range, the optimal optical constant set and the refractive index dispersion model. The scheme provided by the application can ensure a unique fitting effect and improve the measurement reliability.

The invention relates to a doped TiO2 metasurface integrated optical system. The simulation modeling doping subsystem is used for realizing material directional design through preposed atomic-scale precise simulation, simulating and driving a modified titanium dioxide material to optimize a doping system, and outputting a refractive index dispersion curve and an extinction coefficient curve of a full visible light wave band; the metasurface integration subsystem selectively transmits a set phase incident ray in an original optical ray based on light polarization, and realizes the integration effect of multiple types of functions of polarization conversion, polarization selective reflection and aberration correction through three-dimensional parameter cooperation; dynamic compensation polarization crosstalk and phase deviation are complementary with static regulation and control, residual stray light is filtered, high-contrast vertical-direction linearly polarized light imaging is formed, and a complete optical system is formed; a system light path follows a light path complete process of polarization screening, integrated regulation and control, dynamic compensation and purification; the characteristics of high imaging quality and low loss are kept in a wide view field range; and the light path control precision and accuracy are improved.

This invention discloses an online precision measurement method for the thickness of ultrathin multilayer co-extruded release films, belonging to the field of online multilayer film thickness detection technology. The method includes: acquiring the original spectral interference signal set of the online-running ultrathin multilayer co-extruded release film at multiple consecutive sampling times; performing frequency domain transformation processing on the original spectral interference signal set based on an improved Fourier transform algorithm, where the improved Fourier transform algorithm corrects the kernel function of the traditional Fourier transform based on the nonlinear relationship between the refractive index of the film material and wavelength, obtaining a frequency domain characteristic sequence of film thickness; and analyzing the total thickness value and the partial thickness values ​​of each sublayer based on the position distribution of each frequency peak in the frequency domain characteristic sequence of film thickness, generating an initial measurement result of the thickness distribution. This invention eliminates the influence of refractive index dispersion by correcting the Fourier transform kernel function and improves the analytical accuracy of multilayer film thickness through subsequent interlayer crosstalk correction.

The application provides a semiconductor laser element with a built-in topological flat band layer, and relates to the technical field of semiconductor optoelectronic devices, which comprises, from bottom to top, a substrate, a lower confinement layer, a lower waveguide layer, an active layer, an upper waveguide layer, an electron blocking layer, an upper confinement layer, and a topological flat band layer arranged between the upper waveguide layer and the electron blocking layer; the topological flat band layer is any one or any combination of KMn6Bi5, KAg(CN)2, Pb2SbO7, Rb2CaH4 and Ca2NCl; the topological flat band layer has unique magnetic and superconducting properties, has flat band orbital characteristics and quasi-planar energy band hybridization, forms a stable closed ring Dirac nodal line which is not easy to be destroyed, reduces energy dispersion, induces reduced refractive index dispersion, improves the confinement factor, enhances mode gain, and at the same time, generates in-plane anisotropy and vibrational anisotropy, reduces optical waveguide absorption loss, and reduces internal optical loss, so as to strengthen the stimulated emission of the laser element, and improve the lasing power and slope efficiency of the laser element.

This invention belongs to the field of optical material measurement technology, specifically a device and method for measuring the refractive index of curved optical lenses based on white light spectral interferometry. The invention employs a Michelson interferometer combined with a small-core fiber optic detection scheme. A 45-degree mirror folds the optical path vertically, allowing the curved lens sample to be placed horizontally on a sample holder. The small-core fiber collects interference signals only from the central region of the lens, enabling the curved interference to be approximated by an equivalent planar model. During measurement, the interference spectrum of the sample in place and the air reference spectrum after sample removal are collected separately. The group refractive index dispersion curve of the sample over a wide wavelength range is calculated by analyzing the fringe period. This invention eliminates the need for a flat sample, allowing direct measurement of curved lenses and spectacle lenses; it also eliminates the need for mechanical scanning components, offering a wide measurement range and high accuracy.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

This invention discloses a blue laser, which includes a substrate, a lower confinement layer, a lower waveguide layer, an active layer, an upper waveguide layer, and an upper confinement layer stacked sequentially from bottom to top, and further includes a first stress modulation layer and a second stress modulation layer; the lower confinement layer includes a first lower confinement layer and a second lower confinement layer; the lower confinement layer has the first lower confinement layer, the first stress modulation layer, and the second lower confinement layer disposed from bottom to top; the second stress modulation layer is disposed between the second lower confinement layer and the lower waveguide layer; the first stress modulation layer and the second stress modulation layer are used together to release the lattice mismatch stress between the substrate and the lower confinement layer and the thermal mismatch stress between the substrate and the lower confinement layer. Using the embodiments of this invention, by disposing of stress modulation layers in the lower confinement layer and between the lower confinement layer and the lower waveguide layer, dual stress modulation is achieved, thereby suppressing substrate mode leakage, improving laser refractive index dispersion, and enhancing the laser's electro-lasing gain.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The present application relates to the technical field of thickness detection, and particularly relates to a thickness uniformity detection method for VCSEL epitaxial wafer production. The method acquires a reference reflectance spectrum of a detection point of a VCSEL epitaxial wafer; acquires an interference degree according to the distribution characteristics of a reference layer and a resonant cavity layer; acquires a theoretical reflectance spectrum based on the preset thickness of each layer of the VCSEL epitaxial wafer and the refractive index dispersion relationship; acquires a deviation degree according to the difference in reflectance intensity between the theoretical reflectance spectrum and the reference reflectance spectrum and the interference degree; adjusts the preset thickness to acquire the corresponding deviation degree after each adjustment until the deviation degree meets a stop condition; and takes the preset thickness of the resonant cavity layer in the final adjustment as the reference thickness of the detection point to detect the thickness uniformity of the VCSEL epitaxial wafer production. The present application accurately acquires the reference thickness of each detection point, effectively improving the accuracy of the analysis of the thickness uniformity of the VCSEL epitaxial wafer.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The invention relates to the technical field of thickness detection, in particular to a thickness uniformity detection method for VCSEL epitaxial wafer production. The method comprises the following steps: acquiring a reference reflection spectrum chart of a VCSEL epitaxial wafer detection point; obtaining the interference degree according to the distribution characteristics of the reference layer and the resonant cavity layer; obtaining a theoretical reflection spectrogram based on the preset thickness of each layer of the VCSEL epitaxial wafer and the refractive index dispersion relation; obtaining a deviation degree according to a reflection intensity difference and an interference degree in the theoretical reflection spectrum chart and the reference reflection spectrum chart; and adjusting the preset thickness, obtaining the corresponding deviation degree after each adjustment until the deviation degree meets a stop condition, and detecting the thickness uniformity of the VCSEL epitaxial wafer production by taking the preset thickness corresponding to the resonant cavity layer in the final adjustment as the reference thickness of the detection point. According to the VCSEL epitaxial wafer thickness uniformity analysis method, the reference thickness of each detection point is accurately obtained, so that the accuracy of VCSEL epitaxial wafer thickness uniformity analysis is effectively improved.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The application provides a semiconductor laser element with an interlayer hot exciton conversion layer, and relates to the technical field of semiconductor optoelectronic devices, which comprises, from bottom to top, a substrate, a lower confinement layer, a lower waveguide layer, an active layer, an upper waveguide layer, an electron blocking layer, and an upper confinement layer; an interlayer hot exciton conversion layer is arranged between the upper confinement layer and the electron blocking layer and between the lower confinement layer and the lower waveguide layer; in the charge transport process of the laser element, the interlayer hot exciton conversion layer forms a mismatched momentum, generates a large number of interlayer hot excitons, and is converted into a tightly bound interlayer exciton after the release of extra energy, thereby improving the peak gain of the active layer of the laser element and improving thermal degradation, reducing non-radiative recombination centers, improving the refractive index dispersion of the laser element, improving the confinement factor of the laser element, improving the mode gain, improving the radiation recombination efficiency of the active layer of the laser element, reducing the excitation threshold of the laser element, and improving the optical power and the slope efficiency of the laser element.

A laser scattering detection system imaging objective lens comprises, from the object side to the image side, a first lens group with positive focal length, the lenses of the first lens group being made of glass material with refractive index n d <1.6, dispersion v d >50; a second lens group with negative focal length, the lenses of the second lens group being made of glass material with refractive index n d >1.6, dispersion v d >50; a third lens group with positive focal length, the lenses of the third lens group being made of glass material with refractive index n d <1.6, dispersion v d >50; and a fourth lens group with negative focal length, the lenses of the fourth lens group being made of glass material with refractive index n d >1.6, dispersion v d >50. The present application has good imaging quality, and the design result residual error is small, the optical modulation transfer function is close to the diffraction limit, and the energy concentration degree is close to the diffraction limit, so that a relatively ideal imaging quality is achieved.

This invention proposes a semiconductor laser with a biexciton quantum confinement layer, comprising, from bottom to top, a substrate, a lower confinement layer, a lower waveguide layer, an active layer, an upper waveguide layer, an electron blocking layer, and an upper confinement layer. The lower waveguide layer, the active layer, and the upper waveguide layer constitute the biexciton quantum confinement layer. The thickness of the well layer in the active layer is greater than the thickness of the barrier layer. The Si doping concentration and In content of the biexciton quantum confinement layer both reach their peak values ​​in the active layer. This invention can reduce In segregation in the active layer, improve In composition fluctuations, reduce valence band junction, enhance hole injection and hole transport efficiency, make the electron wavefunction amplitude of the active layer smaller than the Bohr exciton radius, limit low refractive index dispersion, generate quantum confinement effect and biexciton optical gain, enhance quantum state splitting and suppress Auger decay, enhance biexciton emission efficiency, thereby reducing the laser threshold, extending the laser gain lifetime, and increasing laser power.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.

The embodiment of the application discloses an optical imaging lens, a scanning display device and a near-eye display device, and relates to the technical field of scanning display. The optical imaging lens can reasonably disperse the optical power of the system, slow down the aberration generated by the lens, achieve the purpose of correcting various aberrations, and realize clear imaging of the image surface on the basis of improving the field of view by reasonably optimizing the focal lengths of five coaxial lenses of the optical imaging lens. The field of view and the imaging quality are further improved by limiting and optimizing the refractive index, the dispersion coefficient and the surface structure of the five coaxial lenses. The overall structure of the optical imaging lens can be more compact on the basis of further improving the imaging quality by limiting and optimizing the five coaxial lenses to be aspherical surface structures, so that the production demand of miniaturization of the lens product is met.