45 results about "Refractive index dispersion" patented technology

A interferometer type polarization beam combiner and splitter, which can combine or split polarized light over a wide band, is provided. The interferometer type polarization beam combiner and splitter includes: an optical splitter; an optical coupler; an optical path length difference imparting unit, which includes a plurality of optical waveguides arranged between the optical splitting unit and the optical coupling unit; one or two input/output ports connected to the optical splitter; and two input/output ports connected to the optical coupler. A half-integer of a wavelength of λc is set as a normalized phase difference, for the optical path length difference imparting unit, between two polarization states, and means for generating a difference in refractive index dispersion is provided between the optical waveguides of the optical path length difference imparting unit, so that the change rate of the transmittance with respect to wavelength is suppressed for the two polarization states.

The invention discloses a transparent medium film refractive index and thickness on-line measuring method. The method comprises the following steps: obtaining a film surface reflection spectrum: using an on-line spectrum measuring apparatus for measuring a film surface reflection spectrum of a predetermined wavelength scope of a film sample to be measured; setting Cauchy optical model parameters: according to the characteristic of the film surface reflection spectrum and influence of the parameter in the Cauchy optical model to a refractive index dispersion relation, performing initial setting of the thickness and Cauchy optical model parameters to form an initial value; performing a genetic algorithm: by using the genetic algorithm and combining the film surface reflection spectrum, through the initial value, controlling a genetic process by setting the parameters of the genetic algorithm, and finally obtaining the film refractive index and film thickness. By establishing the film Cauchy optical model and fully combining the genetic algorithm, reasonable parameters can be set according to the spectrum characteristic of the practical films, so that analysis convergence speed can be faster, and result can be more accurate.

The invention discloses a detection system for refractive index refractive dispersion properties and a detection method thereof. The detection system for the refractive index dispersion properties comprises a transparent carrier (100) used for holding an object to be detected (110) and matching fluid (120), a temperature adjusting device (190) used for changing and acquiring the temperature of the transparent carrier (100), a broadband light source (200) used for emitting broadband light to the transparent carrier (100), an imaging device (300) used for forming a wavelength matching image of the transparent carrier (100) which at least contains two-dimensional information by the broadband light, and a computation processing device (400) used for converting the wavelength matching image of the transparent carrier (100) at least containing the two-dimensional information into a corresponding electric signal, and analyzing the electric signal by combining the temperature acquired by the temperature adjusting device (190) to obtain the refractive index refractive dispersion properties of the object to be detected (110).

Disclosed are high refractive index, hydrophobic, acrylic materials. These materials have both high refractive index and a high Abbe number. This combination means the materials have a low refractive index dispersion and thus are especially suitable for use as intraocular lens materials. The materials are also suitable for use in other implantable ophthalmic devices, such as keratoprostheses, corneal rings, corneal implants, and corneal inlays.

The invention provides a film quality detection method and device, electronic equipment and a storage medium, and relates to the field of film quality control. The film quality detection method comprises the following steps: according to a physical mathematical model of a film sample and an ellipsometry detection curve obtained by ellipsometry detection of the film sample, taking an intrinsic refractive index dispersion expression of a film material as a characteristic parameter, and performing inversion to generate an ellipsometry simulation curve of the film sample; calculating the fitting degree of the ellipsometry detection curve and the ellipsometry simulation curve; and when the fitting degree is close to or greater than a preset fitting degree threshold value, determining that the quality of the film sample reaches a preset standard. The problems that in the prior art, film quality detection precision is low, detection procedures are complex, and evaluation standards lack quantitative indexes can be solved.

The invention discloses a parallel plate optical parameter measuring method based on a sampling function, and the method comprises the steps: firstly carrying out phase-shifting sampling in a Fizeau wavelength phase-shifting interferometer, and respectively obtaining interference patterns for placing a to-be-tested parallel plate and a cavity; secondly, obtaining a feature map of a phase shift algorithm according to actual target requirements, writing a feature polynomial of the phase shift algorithm, expanding by utilizing a Taylor formula to obtain the sampling function of the algorithm, andsubstituting the acquired interference light intensity data into the algorithm for calculation; and finally, extracting phase information at different target frequencies by using different sampling functions, recovering the phase information into wave surface information, and calculating to obtain the surface shape, the optical thickness and the optical uniformity parameter of the to-be-tested parallel flat plate. By designing the sampling function of the phase shift algorithm, measurement errors caused by frequency shift due to refractive index dispersion and wavelength tuning nonlinearity are reduced, required interference patterns are few, operation is simple, and the method can be used for high-precision measurement of optical parameters of large-aperture optical materials.

The invention provides a zoom lens and an imaging apparatus including the zoom lens, wherein the zoom lens is miniaturized, variation of chromatic aberration on an axis from a wide-angle end to an intermediate region is well suppressed, and the zoom lens has high optical performance. The zoom lens consists of, in order from an object side: a positive first lens group that does not move during zooming; a middle group that consists of two or more movable lens groups moving during zooming; and a subsequent group that has a lens group including a stop at a position closest to the object side. Themiddle group has at least two negative movable lens groups. The subsequent group includes at least one positive LA lens that satisfies predetermined conditional expressions relating to the refractiveindex, the Abbe number, and the partial dispersion ratio.