47 results about "Refractive index dispersion" patented technology

The present invention relates to hetero-coagulated silica-alumina mixed oxide compositions that have a sharp refractive index and narrow refractive index dispersion between about 1.46 and 1.60.

A interferometer type polarization beam combiner and splitter, which can combine or split polarized light over a wide band, is provided. The interferometer type polarization beam combiner and splitter includes: an optical splitter; an optical coupler; an optical path length difference imparting unit, which includes a plurality of optical waveguides arranged between the optical splitting unit and the optical coupling unit; one or two input / output ports connected to the optical splitter; and two input / output ports connected to the optical coupler. A half-integer of a wavelength of λc is set as a normalized phase difference, for the optical path length difference imparting unit, between two polarization states, and means for generating a difference in refractive index dispersion is provided between the optical waveguides of the optical path length difference imparting unit, so that the change rate of the transmittance with respect to wavelength is suppressed for the two polarization states.

A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference data base of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material is also disclosed.

Three or more base optical materials are selectively combined into a trans-gradient index (GRIN) optical element (e.g., a lens). A wavelength-dependent index of refraction for light propagating perpendicular to the three or more optical materials equals: a volume fraction of a first optical material multiplied by a refractive index of the first optical material, plus a volume fraction of a second optical material multiplied by a refractive index of the second optical material, plus one minus the volume fraction of the first optical material and the volume of the second optical material all multiplied by the refractive index of a third optical material. The wavelength-dependent index of refraction distribution and a refractive index dispersion through the GRIN optical element may be independently specified from one another. A local refractive index at any point in the optical element is a fixed function of a refractive index of each individual optical material.

A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

The present invention relates to a conjugated aromatic compound represented by the Formula (1) in claim 1 (in the formula, Ar1 represents a hydrogen atom or an aryl group optionally having a substituent; Ar2 and Ar3 each represent a hydrogen atom or an aryl group optionally having a substituent but at least one of Ar2 and Ar3 represents an aryl group optionally having a substituent; and A represents an aromatic hydrocarbon group) and relates to an optical material containing the conjugated aromatic compound. The conjugated aromatic compound and the optical material have characteristics of a high chromatic aberration correction function, high refractive-index dispersion characteristics (Abbe number (νd)) and high secondary dispersion characteristics (θg,F) (anomalous dispersion characteristics).

The invention provides a dual-wavelength optical phase delayer. A single crystal wafer is a parallel plane mirror made of single-axis birefringence crystal, and the optical axis of the crystal is parallel to two optical planes. In the spectral range of the used single-axis birefringence crystal, the optical phase delayer meeting the requirements that two wavelengths are 1 / 4 or 1 / 2 or one wavelength is 1 / 4 and the other wavelength is 1 / 2 phase retardation is manufactured by using the single birefringence crystal wafer according to the concrete application requirements. The thickness conditions of the single crystal wafer which are necessarily met and the design steps based on the conditions are given: 1) the designed wavelengths lambda<1> and lambda<2> and the fractional values c<1> and c<2> of phase retardation are determined; 2) the used birefringence crystal is determined, and birefringence deltan<1> and deltan<2> are obtained according to the refraction index dispersion formula of the crystal; 3) when k<2> is natural numbers 1,2,3,......, the corresponding values of series k<1> are obtained through numerical calculation; and 4) the integers close to k<1> are represented by k<10>, and when the value of a certain k<1> meets the expression ||<=0.005, the thickness of the single crystal wafer is determined by the value of k<1>.

A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

A light source apparatus includes a laser oscillator equipped with a first optical resonator, a plurality of second optical resonators including input portions respectively connected in parallel to the first optical resonator, a plurality of light extraction units configured to extract a light beam from an output portion of each second optical resonator, and a light multiplexing unit configured to multiplex the light beam extracted from each light extraction unit, wherein the light source apparatus causes the light multiplexing unit to output a multiplexed light beam passed through the plurality of second optical resonators, an optical member having refractive index dispersion and an optical amplification medium are disposed in each of the plurality of second optical resonators, and the optical amplification media of the plurality of second optical resonators are different from each other in maximum gain wavelength.