A
detector (110) for determining at least one material property of at least one object (112) is proposed. The
detector (110) comprises: - at least one
projector (116) configured to illuminate the object (112) with at least one illumination pattern (118) including a plurality of illumination features (120); - at least one first camera (122) having at least one first sensor element, the first sensor element having a matrix of first optical sensors, each first optical sensor having a photosensitive area, each first optical sensor designed to generate at least one sensor
signal in response to illumination of the respective photosensitive area by a reflected
light beam propagating from the object (112) to the first camera (122), the first camera (122) configured to capture at least one first reflected image comprising a plurality of first reflected features generated by the object (112) in response to illumination by the illumination features (120), the first camera (122) being arranged such that the first reflected image is captured in a first
line of sight direction relative to the object (112); at least one second camera (124) having at least one second sensor element, the second sensor element having a matrix of second optical sensors, each second optical sensor having a photosensitive area, each second optical sensor designed to generate at least one sensor
signal in response to illumination of the respective photosensitive area by a reflected
light beam propagating from the object (112) to the second camera (124), the second camera (124) being configured to capture at least one second reflected image comprising a plurality of second reflected features generated by the object (112) in response to illumination by the illumination features (120), the second camera (124) being arranged such that the second reflected image is captured in a second
line of sight direction relative to the object (112), the second camera being different from the first
line of sight direction and the second line of
sight direction; - at least one evaluation device (126) configured to evaluate the first and second reflected images, the evaluation comprising matching the first and second reflected features and determining combined material properties of the
matched pair of first and second reflected features by analysis of their beam profiles; Equipped with.