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148 results about "Reduced susceptibility" patented technology
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Memory elements and methods for making same
Annular, linear, and point contact structures are described which exhibit a greatly reduced susceptibility to process deviations caused by lithographic and deposition variations than does a conventional circular contact plug. In one embodiment, a standard conductive material such as carbon or titanium nitride is used to form the contact. In an alternative embodiment, a memory material itself is used to form the contact. These contact structures may be made by various processes, including chemical mechanical planarization and facet etching.
Owner:ROUND ROCK RES LLC
Method of forming a contact structure in a semiconductor device
InactiveUS6440837B1Solid-state devicesSemiconductor/solid-state device manufacturingProcess deviationsEtching
Annular and linear contact structures are described which exhibit a greatly reduced susceptibility to process deviations caused by lithographic and deposition variations than does a conventional circular contact plug. In one embodiment, a standard conductive material such as carbon or titanium nitride is used to form the contact. In an alternative embodiment, a memory material itself is used to form the contact. These contact structures may be made by various processes, including chemical mechanical planarization and facet etching.
Owner:ROUND ROCK RES LLC
Memory elements and methods for making same
InactiveUS20020160551A1Solid-state devicesSemiconductor/solid-state device manufacturingProcess deviationsEtching
Annular, linear, and point contact structures are described which exhibit a greatly reduced susceptibility to process deviations caused by lithographic and deposition variations than does a conventional circular contact plug. In one embodiment, a standard conductive material such as carbon or titanium nitride is used to form the contact. In an alternative embodiment, a memory material itself is used to form the contact. These contact structures may be made by various processes, including chemical mechanical planarization and facet etching.
Owner:ROUND ROCK RES LLC
Anti-calcification treatments for heart valves and vascular grafts
InactiveUS20060047343A1Reduces calcification potentialReduce calcificationSuture equipmentsHeart valvesCalcificationProsthesis
The present invention provides processes for fixation of biological tissue and / or post-fixation treatment of such tissue that result in modified tissues with reduced susceptibility to in vitro calcification when used in prosthetic devices. The invention also relates to calcification resistant biological tissue and to methods of using such tissue.
Owner:OVIATT HENRY W +1
Miniature microphone with balanced termination
ActiveUS7466835B2Improve dynamic rangeLess susceptible to EMIPiezoelectric/electrostrictive microphonesSignal processingAudio power amplifierSurface mounting
The present invention provides a miniature MEMS microphone comprising a single-ended transducer element connected to an amplifier providing a differential electrical output at terminals arranged at a substantially plane exterior surface. The differential or balanced output signal provides a miniature microphone exhibiting a high dynamic range and a reduced susceptibility to EMI. The microphone is adapted for surface mounting thus the extra output terminal required is still suitable for low cost mass production. In preferred embodiments the transducer element and amplifier are silicon-based. The microphone may have a plurality of separate single-ended transducer elements connected to separate amplifiers providing separate differential outputs. The microphones according to the invention are advantageous for applications within for example hearing aids and mobile equipment.
Owner:TDK CORPARATION
Display apparatus with pixel-aligned ground mesh
ActiveUS20140111442A1Reduce electromagnetic radiationReduce electromagnetic interferenceStatic indicating devicesInput/output processes for data processingElectricityElectromagnetic interference
Display apparatus with reduced susceptibility to electro-magnetic interference includes a display including an array of pixels and a ground mesh located in proximity to the display. The ground mesh includes a plurality of electrically connected ground lines located between the pixels, so that electro-magnetic radiation emitted or received by the display is reduced.
Owner:EASTMAN KODAK CO
Optical fiber laser, and components for an optical fiber laser, having reduced susceptibility to catastrophic failure under high power operation
ActiveUS20090080835A1Avoid damageReduce susceptibilityLaser using scattering effectsOptical fibre with graded refractive index core/claddingStimulated emissionInterconnection
Optical fiber lasers and components for optical fiber laser. An optical fiber laser can comprise a fiber laser cavity having a wavelength of operation at which the cavity provides output light, the cavity including optical fiber that guides light having the wavelength of operation, the fiber having first and second lengths, the first length having a core having a V-number at the wavelength of operation and a numerical aperture, the second length having a core that is multimode at the wavelength of operation and that has a V-number that is greater than the V-number of the core of the first length optical fiber at the wavelength of operation and a numerical aperture that is less than the numerical aperture of the core of the first length of optical fiber. At least one of the lengths comprises an active material that can provide light having the wavelength of operation via stimulated emission responsive to the optical fiber receiving pump light. Components include a mode field adapter and optical fiber interconnection apparatus, which can be used to couple the first and second lengths of optical fiber, or can couple the fiber laser to an optical fiber power amplifier, which can be a multimode or single mode amplifier.
Owner:NUFERN
Muteins of fibroblast growth factor 21
ActiveUS7622445B2Reduce sensitivityReduced O-glycosylationPeptide/protein ingredientsMetabolism disorderMutated proteinNucleic acid sequence
The present invention relates to novel muteins of human fibroblast growth factor-21 with reduced susceptibility for proteolytic degradation when expressed in yeast. Both protein and the respective encoding nucleic acid species are disclosed. The invention also embodies vectors and host cells for the propagation of said nucleic acid sequences and the production of said muteins. Also disclosed are methods for treating type 2 diabetes, obesity, or metabolic syndrome.
Owner:ELI LILLY & CO
Method and apparatus for detection of caries
ActiveUS8520922B2Reduced and minimized sensitivityReduced or minimized sensitivity to illumination variationImage enhancementImage analysisFluorescenceComputer science
A method for forming an enhanced image (60) of a tooth (20) making use of the tooth (20) fluorescence and / or reflectance effects, employs a morphological image processing technique, and reduces susceptibility to overall intensity variations in the image (60).
Owner:CARESTREAM DENTAL TECH TOPCO LTD
Phase-Changeable Memory Devices Having Reduced Susceptibility to Thermal Interference
ActiveUS20090127538A1Solid-state devicesBulk negative resistance effect devicesEngineeringNon-volatile memory
A non-volatile memory array includes an array of phase-changeable memory elements that are electrically insulated from each other by at least a first electrically insulating region extending between the array of phase-changeable memory elements. The first electrically insulating region includes a plurality of voids therein. Each of these voids extends between a corresponding pair of phase-changeable memory cells in the non-volatile memory array and, collectively, the voids form an array of voids in the first electrically insulating region.
Owner:SAMSUNG ELECTRONICS CO LTD
Muteins OF Fibroblast Growth Factor 21
ActiveUS20070299007A1Reduced O-glycosylationImprove drug stabilityPeptide/protein ingredientsMetabolism disorderYeastNucleic acid sequencing
The present invention relates to novel muteins of human fibroblast growth factor-21 with reduced susceptibility for proteolytic degradation when expressed in yeast. Both protein and the respective encoding nucleic acid species are disclosed. The invention also embodies vectors and host cells for the propagation of said nucleic acid sequences and the production of said muteins. Also disclosed are methods for treating type 2 diabetes, obesity, or metabolic syndrome. X-16816
Owner:ELI LILLY & CO
Arc fault detection technique
InactiveUS20070058304A1Improve reliabilityReduce sensitivityEmergency protective arrangement detailsArrangements responsive to excess currentInformation processingWave shape
An apparatus and a method of detecting arc faults that have reduced susceptibility to nuisance tripping. The apparatus includes a current sensor, a differential current input sense circuit, a differential current (di / dt) characteristics sense circuit, an absolute current input sense circuit, an absolute current characteristics sense circuit, a power supply, a tripping circuit, a processing unit, and an electromechanical interface. The di / dt characteristics sense circuit provides information relating to the characteristic di / dt signature of a power line current. The absolute current characteristics sense circuit provides information relating to the absolute current waveform characteristics of the power line current. The processing unit correlates the di / dt characteristics to the absolute current characteristics to distinguish between electrical arc faults and nuisance loads, thereby reducing the susceptibility of the apparatus to nuisance tripping.
Owner:SENSATA TECH MASSACHUSETTS INC
Flexible, formable conductive films
InactiveUS7261950B2Increased resistance to delamination and fracture and corrosionOvercome lack of conductivityEnvelopes/bags making machineryMagnetic/electric field screeningMetal alloyElectromagnetic interference
Electrically conductive films comprising a flexible support, an extensible metal or metal alloy layer, and a crosslinked polymeric protective layer have at least one permanently deformed curved region. The films can be light transmissive and can have regions of compound curvature, and the metal or metal alloy layer can be substantially continuous. The films have reduced susceptibility to fracture or corrosion compared to commercially available electromagnetic interference (EMI) shielding films.
Owner:3M INNOVATIVE PROPERTIES CO
Durable emi shielding film
InactiveUS20060035073A1Increased resistance to delamination and fracture and corrosionOvercome lack of conductivityMagnetic/electric field screeningRecord information storageMetal alloyElectromagnetic interference
A device or an enclosed area that can cause or is sensitive to electromagnetic interference (EMI) is shielded by at least partially surrounding the device or the area with a visible light-transmissive film comprising a flexible support, an extensible visible light-transmissive metal or metal alloy layer and a visible light-transmissive crosslinked polymeric protective layer, and optionally connecting at least one grounding electrode to the metal or metal alloy layer. The film has reduced susceptibility to fracture or corrosion compared to commercially available EMI shielding films, especially when bent or deformed.
Owner:3M INNOVATIVE PROPERTIES CO
Resistorless bias current generation circuit
ActiveUS20060103455A1Reduce sensitivityElectronic switchingPulse generation by opto-electronic devicesElectrical resistance and conductanceCurrent generation
A bias current generating circuit generates a reliable and consistent bias current, irrespective of variation in applied power, process and temperature. In one embodiment, the bias current generator generates a bias current using a PTAT current generator and an IPTAT current generator comprising exclusively active circuit elements, for example transistors. No passive elements, such as resistors, are employed. The generated bias current is substantially a function of the respective aspect ratios of transistors of current paths of the device. In this manner, the resulting generated bias current has greatly reduced susceptibility to variation in applied power, process and temperature.
Owner:SAMSUNG ELECTRONICS CO LTD
Electrostatic discharge protection for an integrated circuit
An ESD protection circuit (40) uses parasitic drain-body diodes (47, 49) of the output buffer transistors (46, 48) as the main, or dominant, ESD protection diodes. Specifically, butted source-body ties in the output buffer transistors (46, 48) provide the ESD diodes (47, 49). Using parasitic drain-body diodes of output buffer transistors with butted source-body ties as the dominant ESD diodes reduces the layout area required to implement the ESD protection circuit as compared to an ESD protection circuit having stand alone diodes. Also, the butted source-body ties reduce susceptibility to latch-up and reduce capacitive loading because there are no added diffusion regions tied to the pad.
Owner:FREESCALE SEMICON INC
Method for detecting arc faults
InactiveUS7190562B2Improve reliabilityReduce sensitivityEmergency protection data processing meansEmergency protective arrangements for automatic disconnectionCurrent sensorElectric power
An apparatus and method for detecting arc faults that have reduced susceptibility to nuisance tripping. The apparatus includes a current sensor, an input sense circuit, an arcing sense circuit, a power supply, a tripping (firing) circuit, a processor, and an electromechanical interface. The current sensor monitors a power input comprising an AC current, and provides high frequency components of the. AC current to the input sense circuit. The input sense circuit filters and rectifies the AC signal, and provides the rectified signal to the arcing sense circuit. The arcing sense circuit provides a voltage level accumulated over a predetermined time period, and digital signals indicative of possible electrical arcing occurring during the sampling period, to the processor. The processor measures the voltage level, stores information relating to measured voltages and the digital signals, and processes the stored information using one or more algorithms, thereby determining whether the signals resulted from an arc fault or a nuisance load. In the event the signals resulted from an arc fault, the processor activates the firing circuit to trip the electromechanical interface, thereby interrupting the power output to the load.
Owner:SENSATA TECH MASSACHUSETTS INC
Optical fiber laser, and components for an optical fiber laser, having reduced susceptibility to catastrophic failure under high power operation
InactiveUS8027557B2Avoid damageReduce susceptibilityLaser using scattering effectsOptical fibre with graded refractive index core/claddingStimulated emissionInterconnection
Owner:NUFERN
Flexible, formable conductive films
InactiveUS20050247470A1Increased resistance to delamination and fracture and corrosionOvercome lack of conductivityEnvelopes/bags making machineryMagnetic/electric field screeningMetal alloyElectromagnetic interference
Electrically conductive films comprising a flexible support, an extensible metal or metal alloy layer, and a crosslinked polymeric protective layer have at least one permanently deformed curved region. The films can be light transmissive and can have regions of compound curvature, and the metal or metal alloy layer can be substantially continuous. The films have reduced susceptibility to fracture or corrosion compared to commercially available electromagnetic interference (EMI) shielding films.
Owner:3M INNOVATIVE PROPERTIES CO
Method for detecting arc faults
InactiveUS20060050450A1Improve reliabilityReduce sensitivityEmergency protection data processing meansEmergency protective arrangements for automatic disconnectionCurrent sensorDigital signal
An apparatus and method for detecting arc faults that have reduced susceptibility to nuisance tripping. The apparatus includes a current sensor, an input sense circuit, an arcing sense circuit, a power supply, a tripping (firing) circuit, a processor, and an electromechanical interface. The current sensor monitors a power input comprising an AC current, and provides high frequency components of the. AC current to the input sense circuit. The input sense circuit filters and rectifies the AC signal, and provides the rectified signal to the arcing sense circuit. The arcing sense circuit provides a voltage level accumulated over a predetermined time period, and digital signals indicative of possible electrical arcing occurring during the sampling period, to the processor. The processor measures the voltage level, stores information relating to measured voltages and the digital signals, and processes the stored information using one or more algorithms, thereby determining whether the signals resulted from an arc fault or a nuisance load. In the event the signals resulted from an arc fault, the processor activates the firing circuit to trip the electromechanical interface, thereby interrupting the power output to the load.
Owner:SENSATA TECH MASSACHUSETTS INC
Resinous compositions and articles made therefrom
InactiveUS20080242779A1Reduce sensitivityIncreased durabilitySpecial tyresChemical recyclingWaxPolymer science
Disclosed is an article having reduced susceptibility to mar and scratch formation during abrasion of its surface, wherein the article is derived from a composition comprising: (i) at least one rubber modified thermoplastic resin; (ii) a second rigid thermoplastic polymer present in a range of between about 10 wt. % and about 80 wt. %, based on the weight of resinous components in the composition; and (iii) at least one additive selected from the group consisting of (a) a silicone oil and (b) a hydrocarbon wax, said additive being present in an amount in a range of about 0.3 parts per hundred parts resin (phr) to about 3 phr.
Owner:SABIC INNOVATIVE PLASTICS IP BV
Torque sensor with reduced susceptibility to failure
InactiveUS20100005909A1Less susceptibleImprove reliabilityWork measurementTorque measurementEngineeringReduced susceptibility
A sensor arrangement with relatively low disturbance susceptibility for measurement of a torque acting on a shaft, wherein the shaft has a first shaft section and a second shaft section and these two shaft sections can rotate with respect to one another, having at least one magnetic encoder which is arranged on the first shaft section, and having a stator which is arranged on the second shaft section, wherein the stator has two stator elements which each have projecting fingers, wherein at least one additional, second stator, likewise having two stator elements which each have projecting fingers, is arranged on the second shaft section, and these stators are associated with the magnetic encoder.
Owner:CONTINENTAL TEVES AG & CO OHG
Resistorless bias current generation circuit
ActiveUS7227401B2Reduce sensitivityElectronic switchingPulse generation by opto-electronic devicesElectrical resistance and conductanceEngineering
A bias current generating circuit generates a reliable and consistent bias current, irrespective of variation in applied power, process and temperature. In one embodiment, the bias current generator generates a bias current using a PTAT current generator and an IPTAT current generator comprising exclusively active circuit elements, for example transistors. No passive elements, such as resistors, are employed. The generated bias current is substantially a function of the respective aspect ratios of transistors of current paths of the device. In this manner, the resulting generated bias current has greatly reduced susceptibility to variation in applied power, process and temperature.
Owner:SAMSUNG ELECTRONICS CO LTD
Semiconductor device having a contact structure with a contact spacer and method of fabricating the same
InactiveUS20070281461A1Avoid formingSolid-state devicesSemiconductor/solid-state device manufacturingContact padDevice material
Methods of manufacturing a semiconductor device having reduced susceptibility to void formation between upper metal wiring layers and lower contact pads are provided. According to the methods, an etch shield layer is formed to protect contact pads from subsequent etch processes. Semiconductor devices manufactured according to the methods are also provided.
Owner:SAMSUNG ELECTRONICS CO LTD
Arc fault detection apparatus employing a comparator with a continuously variable threshold
ActiveUS20100027176A1Improve discriminationReduce sensitivityParameter calibration/settingEmergency protective arrangement detailsComparators circuitsThreshold voltage
An arc fault detection apparatus that provides for better discrimination of electrical arcing events from nuisance loads. The arc fault detection apparatus includes an arcing sense circuit having a comparator circuit with a variable threshold voltage that varies continuously with the line voltage. The arc fault detection apparatus has reduced susceptibility to nuisance tripping in the presence of sudden changes in the load current that occur outside of a specified time window centered on each zero crossing point of the line voltage.
Owner:SENSATA TECH MASSACHUSETTS INC
Methods and compositions for the correlation of single nucleotide polymorphisms in the vitamin k epoxide reductase gene and warfarin dosage
InactiveUS20060240440A1Decrease and increase sensitivitySugar derivativesMicrobiological testing/measurementWarfarinFhit gene
The present invention provides a method of identifying a human subject having increased or decreased sensitivity to warfarin, comprising detecting in the subject the presence of a single nucleotide polymorphism in the VKOR gene, wherein the single nucleotide polymorphism is correlated with increased or decreased sensitivity to warfarin, thereby identifying the subject having increased or decreased sensitivity to warfarin.
Owner:THE UNIV OF NORTH CAROLINA AT CHAPEL HILL
Secure and dense SRAM cells in EDRAM technology
Addition of capacitance to the storage nodes of static random access memory cells and other types of integrated circuits substantially increases Qcrit and substantially eliminates soft errors due to alpha particles; susceptibility to which would otherwise increase as integrated circuits are scaled to smaller sizes and manufactured at increased integration densities. Formation of the added capacitance as deep trench capacitors avoids any constraint on circuit or memory cell layout. Degradation of performance is avoided and performance potentially improved by permitting alteration of proportions of pull-down and pass gate transistors in view of the increased stability imparted by the added capacitors. One of the capacitor electrodes is preferably shorted to the supply voltage through an impurity well. Thus, the memory cell size can be reduced while greatly reducing susceptibility to soft errors; contrary to the effects of scaling at current and foreseeable feature size regimes.
Owner:IBM CORP
Methods of detecting arc faults characterized by consecutive periods of arcing
InactiveUS7408750B2Reduce generationPrevent trippingTesting dielectric strengthShort-circuit testingTime segmentCurrent sensor
An apparatus and method for detecting electrical arc faults that has reduced susceptibility to nuisance tripping. The apparatus includes a current sensor, an input sense circuit, an arcing sense circuit, a power supply, a tripping circuit, a processing unit, and an electromechanical interface. The processing unit measures multiple voltage levels provided by the arcing sense circuit during a specified number of consecutive time periods. Next, the processing unit determines the number of consecutive time periods during which the voltage levels exceeded a specified minimum value, take on successively lower or higher values, or fall outside a predetermined normal range of values. Based upon the results of this determination, the processing unit either trips the electromechanical interface to interrupt power to a load, or inhibits tripping of the electromechanical interface, thereby reducing the occurrence of nuisance tripping.
Owner:SENSATA TECH MASSACHUSETTS INC
High speed data communications cable having reduced susceptibility to modal alien crosstalk
A communications cable for use with a communications connector having eight contacts arranged in a series. The cable has first, second, third, fourth, fifth, sixth, seventh, and eighth wires configured to be connected to first, second, third, fourth, fifth, sixth, seventh, and eighth contacts, respectively, of the series. The fourth and fifth wires are twisted together to form a first twisted wire pair (“twisted pair”). The first and second wires form a second twisted pair. The third and sixth wires form a third twisted pair. The seventh and eighth wires form a fourth twisted pair. The twisted pairs extend alongside one another and are arranged such that the first twisted pair is closer to the second and third twisted pairs than to the fourth twisted pair, and the second twisted pair is closer to the first and fourth twisted pairs than to the third twisted pair.
Owner:LEVITON MFG
Foliarly applicable silicon nutrition compositions & methods
InactiveUS20100016162A1Reduce sensitivityBiocidePlant growth regulatorsSilicic acidBacterial disease
A foliarly applicable plant nutrient composition comprises, in aqueous solution, (a) a first component comprising an agriculturally acceptable source of foliarly absorbable silicon; (b) a second component selected from agriculturally acceptable sources of thiosulfate ions, agents effective to inhibit polymerization of silicic acid or silicate ions, and mixtures thereof; and (c) as a third component, an agriculturally acceptable mixture of compounds selected from the group consisting of organic acids, organic compounds having funtional groups capable of reversibly binding or complexing with inorganic anions, and mixtures thereof. The composition is useful for silicon nutrition of a plant and for reducing susceptibility of a plant to fungal or bacterial disease.
Owner:FBSCI HLDG
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