5results about How to "Reduced feedback time" patented technology

A rapid detection robot for environmental parameters of a pharmaceutical workshop comprises a mobile platform, and a detection workbench is arranged on the mobile platform; a mechanical arm is installed on the detection workbench, and a culture dish rack used for storing culture dishes is arranged in the working space range of the mechanical arm; the silicon wafer rack is used for storing a silicon wafer bracket; the pipette rack is used for storing a pipette; the pipette tip box is used for storing pipette tips; the centrifugal tube rack is used for storing centrifugal tubes; the uncovering device is used for uncovering operation; the reagent bin is used for storing a probe solution; the planktonic bacteria sampler is used for sampling planktonic bacteria; the shaking incubator is used for culturing planktonic bacteria; the Raman spectrometer is used for carrying out SERS test; the clamp bracket is used for storing the first clamp, the second clamp and the third clamp; the first clamp is used for clamping a culture dish and a silicon wafer bracket, and the second clamp is used for clamping a pipette; the third clamp is used for clamping the centrifugal tube. The invention further discloses a pharmaceutical workshop environment parameter rapid detection method.

The present invention provides a DRAM test machine and method based on embedded logic analysis. An embedded logic analyzer is integrated in an ATE test control chip. The embedded logic analyzer is integrated in an ATE test control chip having a main control unit, a test vector generator, and a test result processor. The defects in the prior art are overcome, and the signals of the DRAM chip can be captured and analyzed in real time, so as to help test engineers quickly find problems and improve test efficiency. A plurality of signal channels can be monitored at the same time, so as to improve in-depth analysis capability, and specific trigger conditions can be set to capture key data. The complex timing behaviors of various DRAMs can be decoded and analyzed, so as to save test time. The machine is compactly integrated, does not occupy additional space, reduces costs, and improves benefits. The machine can quickly provide test results and feedback, and is helpful to shorten the test time of the DRAM chip and accelerate the test progress.

The invention relates to the technical field of part manufacturing, and particularly discloses a section parameter optimization method for a sealing strip, which comprises the following steps of: S1, determining a section design concept of the sealing strip according to a preset requirement, and finishing a primary section outer contour; s2, parameterizing the wall thickness of each part of the section, and establishing a compression load analysis model; s3, establishing a DOE matrix by taking the wall thickness of each part of the section as an input parameter and the compression load of different contact positions as an output parameter, generating permutation and combination of a plurality of input parameters in a numerical value setting range of the parameters, and calculating a result of each combination to obtain a complete DOE matrix; s4, performing response surface analysis by using the established DOE matrix; s5, according to a response surface analysis result, performing optimization by using a multi-optimization target genetic algorithm; and S6, deriving an optimal design point, and completing optimization analysis. By means of the technical scheme, the design efficiency of the sealing strip section parameters can be improved, and meanwhile it is ensured that the product performance is close to the design target value to the maximum extent.

The utility model relates to electronic atomization technical field, specifically disclose an atomization device, include: casing, be equipped with liquid storage cavity, atomization air channel and detection air channel in casing, liquid storage cavity is connected with atomization air channel, and detection air channel is connected with atomization air channel, and airflow sensor, airflow sensor sets up in casing, and airflow sensor sets up in detection air channel, wherein, atomization device is in storage and transportation state, and the up and down direction is parallel with vertical direction, in the up and down direction, the position of airflow sensor in casing is higher than the bottom of liquid storage cavity. Make atomization device in warehousing, transportation, use process, airflow sensor is always in the position above the bottom of liquid storage cavity, if liquid leakage or condensate is produced when sucking occurs in liquid storage cavity, and liquid leakage and condensate flow according to gravity downwards, will not flow to the airflow sensor located above, can guarantee that liquid leakage will not enter airflow sensor, will not damage airflow sensor, and will not cause airflow sensor false start.

The invention discloses an elevator star sealing contactor contact adhesion test method, which comprises a display system, a control system, a driving system and an execution system, and is characterized in that the control system comprises a solid-state relay, and the display system comprises a switch; the test method comprises the following steps: S1, a variable voltage regulator is adopted to supply power to a system, and voltage is regulated to a voltage value matched with the load demand of a tested elevator star sealing contactor; s2, outputting a solid-state signal through a control system, controlling a solid-state relay to work in a random voltage switching SCR output mode, and shortening the link transmission time and controlling the detected star sealing contactor to act at high frequency by utilizing the high-speed response low-delay characteristic of the solid-state relay; meanwhile, feedback signals of a solid-state relay are collected, and the delay time of a control system of the system is obtained through calculation of a built-in algorithm of the control system, so that the contact feedback time of the star sealing contactor is accurately calculated. The testing process is transparent, data are clear, real-time monitoring is achieved, and results are judged in real time.