The application discloses a storage body self-test
system and method with extensible
programming, which comprises the following steps: a CPU is connected to a configurable storage body test controller through a CPU configuration interface and a configuration
bus for
bidirectional transmission of configuration instructions and parameters; the configurable storage body test controller is connected to each group of SRAM and ROM through a storage body
access bus; test results of the measured storage body are written into a state register through an internal
bus, and the state register is connected to a CPU data reading port for output; a fault
signal output end of the configurable storage body test controller is connected to an interrupt module, and the interrupt module sends an
interrupt request to the CPU; and an ATE test
multiplexing interface reserved in the configurable storage body test controller is directly connected to MBIST logic of
chip factory test for
multiplexing. The method is implemented based on the
system. The application has the advantages of simple principle, lower cost, better responsiveness, stronger compatibility, wider application range and the like.