The invention discloses a device for a double-
pulse test of an IGBT (insulated polar bipolar
transistor) driving module. The device comprises a
simulation controller, an
oscilloscope, a
high voltage power source and a load
inductor, wherein the
oscilloscope, the
high voltage power source and the load
inductor are integrated into a double-
pulse test cabinet, the interior of the
simulation controller is integrated with a test main board, and the test main board is used for controlling the test process. According to the practical test condition, negative and positive
bus conductive wires outputted by the
simulation controller and a U / V / W three-phase leading out wire are connected with a test conducting wire of the double-
pulse test cabinet. A method for the double-pulse test of the IGBT driving module comprises the following steps of sequentially testing the three phases of a
power unit through a measuring procedure, evaluating the properties of the IGBT and a driving board in the to-be-tested
power unit according to the
test data and the
wave shape displayed on the
oscilloscope, and meanwhile, correcting the
power unit. The device can actually capture the actual working condition of the power unit in an automobile
motor controller, the test result is accurate, the properties of the power unit are optimized, and the device is not only suitable for experiments, but also suitable for the ex-factory test of batched production.