The invention discloses a device for a double-pulse test of an IGBT (insulated polar bipolar transistor) driving module. The device comprises a simulation controller, an oscilloscope, a high voltage power source and a load inductor, wherein the oscilloscope, the high voltage power source and the load inductor are integrated into a double-pulse test cabinet, the interior of the simulation controller is integrated with a test main board, and the test main board is used for controlling the test process. According to the practical test condition, negative and positive bus conductive wires outputted by the simulation controller and a U/V/W three-phase leading out wire are connected with a test conducting wire of the double-pulse test cabinet. A method for the double-pulse test of the IGBT driving module comprises the following steps of sequentially testing the three phases of a power unit through a measuring procedure, evaluating the properties of the IGBT and a driving board in the to-be-tested power unit according to the test data and the wave shape displayed on the oscilloscope, and meanwhile, correcting the power unit. The device can actually capture the actual working condition of the power unit in an automobile motor controller, the test result is accurate, the properties of the power unit are optimized, and the device is not only suitable for experiments, but also suitable for the ex-factory test of batched production.