The invention relates to a
chip wafer level multi-
chip simultaneous test circuit,
system and method, and the circuit comprises a main
chip which is configured to respond to a first
signal, and carries out the detection operation of a storage unit through a
multiplexer and an internal
bus; and responding to the second
signal, sequentially transmitting the second
signal to each slave chip through off-chip wiring or a first
multiplexer, receiving test results of one or more slave chips, integrating the test results, and serially transmitting the test results to the
test board for sampling, and the plurality of slave chips are connected in series through off-chip wiring and configured to respond to the second signal, synchronously perform detection operation of the storage unit in a preset period, integrate a detection result step by step through the second
multiplexer and the off-chip wiring and return the detection result to the main chip. According to the invention, through off-chip wiring and a small number of logic gates, simultaneous testing of multiple chips at a
wafer level is realized, and the testing cost is saved.