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Copper alloy sheet

InactiveUS20110223056A1Reduce intensityMaintaining stress relaxation resistance characteristicContact member manufacturingCoupling contact membersX-rayStress relaxation
The present invention relates to a Cu—Ni—Sn—P-based copper alloy sheet having a specific composition, where (1) the copper alloy sheet is set to have an electrical conductivity of 32% IACS or more, a stress relaxation ratio in the direction parallel to the rolling direction of 15% or less, a 0.2%-proof stress of 500 MPa or more and an elongation of 10% or more; (2) the X-ray diffraction intensity ratio I(200)/I(220) in the sheet surface is set to be a given value or less and at the same time, anisotropy in the stress relaxation resistance characteristic is reduced by fining the grain size; (3) the texture of the copper alloy sheet is set to a texture such that the distribution density of B orientation and the sum of distribution densities of B orientation, S orientation and Cu orientation each is set to fall in a specific range and bendability is thereby enhanced; or (4) the dislocation density measured using the value obtained by dividing the half-value breadth of the X-ray diffraction intensity peak from {200} plane in the copper alloy sheet surface by the peak height is set to a given value or more and press punchability is thereby enhanced. The Cu—Ni—Sn—P-based copper alloy sheet of the present invention is excellent in the properties required for a terminal or connector and further (1) has excellent strength-ductility balance, (2) satisfies the stress relaxation resistance characteristic in the direction orthogonal to the rolling direction, (3) has excellent bendability, or (4) has excellent press punchability.
Owner:KOBE STEEL LTD

Header detect configuration within a DVD-RAM read device and methods of acquiring and maintaining phase lock in a wobble phase lock loop

In the context of a DVD-RAM read-type architecture in which an optical storage medium (20) makes use of an eccentric wobble (164) to attain synchronisation information, a wobble PLL (179) is held in an acquired state whenever header regions (32, 33) embossed at regular intervals across the optical storage medium (20) are detected. More specifically, large dc variations associated with voltage spikes caused by header regions (32, 33) are scaled (260) relative to a dynamically varying amplitude envelope of the extracted wobble signal (164), such as to identify a start location (300) for each header region. The wobble PLL (179) is effectively allowed to free-run and hold state during periods of header, thereby mitigating the likelihood that the wobble PLL will loose lock during the header regions. Also, with suspension of the wobble PLL triggered by a first spike (300), a counter is initiated to over-sample wobble clock periods to pre-empt a successive header and such that the PLL can be disabled immediately prior to the successive header region. Use of a bandpass filter (156) to extract the wobble signal (164) benefits from generation of a spike at each transition of the header dc level, which spike can be used as a definitive marker for a header region.
Owner:AVAGO TECH INT SALES PTE LTD
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