47results about How to "Reliable basis for judgment" patented technology

The present invention relates to a test method for testing fatigue characteristics of nanometer thickness films. The main practice of the present invention is as follows: an indentation device is utilized to continuously record the load F and displacement ht data of a nanometer thickness film in a fatigue test, and the numerical value of contact rigidity in every loading / unloading cycle; when thecontact rigidity drops continuously and rapidly, corresponding cycle number is judged as the fatigue life-span number of the film. The test method is simple to operate, accurate and reliable in test result, broad in applicability and capable of realizing the research on fatigue characteristics of various ultra-thin films, and can achieve the test effect and precision which macroscopic tests cannot achieve, so as to provide reliable basis for the research on the fatigue performance of nanometer thickness films.

The invention discloses a NAND flash memory error rate prediction method and system, belonging to the field of computer storage, comprising: obtaining M early interference features from historical data of NAND flash memory, and the original bit error rate corresponding to each early interference feature, and Pre-interference features and their corresponding original bit error rates are used as a prediction sample to obtain M prediction samples; the prediction samples are input into the trained error rate prediction model to predict the original bit error codes corresponding to N post-interference features Among them, the interference feature is the feature or feature combination that affects the original bit error rate of NAND flash memory; the error rate prediction model is a multi-input multi-output model, which is used to predict the later interference feature according to the previous interference feature and the corresponding original bit error rate The corresponding raw bit error rate. The invention can predict the error rate of the NAND flash memory, predict the change trend of the error rate of the NAND flash memory, and provide quantitative and reliable judgment basis for data storage safety.

The invention discloses a continuous annealing furnace gas cleanliness detecting system, which mainly comprises a furnace gas sampling master pipe, a gas pollutant collector branch and a metering and gas return master pipe, wherein the input end of the furnace gas sampling master pipe is communicated with the interior of an annealing furnace chamber through a pipeline, and the output end of the furnace gas sampling master pipe is connected with the input end of the gas pollutant gross collector branch through a pipeline and connected with the output end of a nitrogen blowing loop; the output end of the gas pollutant collector branch is connected with the input end of the metering and gas return master pipe through a pipeline; and the input end of the nitrogen blowing loop is communicated with a nitrogen station through a pipeline, the nitrogen blowing loop is connected in parallel on the pipelines of a gas distributor and an automatic switching valve of the furnace gas sampling masterpipe through two manual switching valves connected in series with the nitrogen blowing loop, and the output end of the metering and gas return master pipe is communicated with the interior of the annealing furnace chamber through a pipeline. The system can accurately detect pollutants in the furnace in time, and provides basis for improving product quality, reasonably arranging shutdown maintenance and clearing the furnace.