23 results about "Electrical capacitance meter" patented technology

The application discloses a lightning arrester phase-to-phase coupling capacitor determination method and device, medium and equipment, relates to the electrical measurement field, and mainly aims to improve the low accuracy of the existing lightning arrester phase-to-phase coupling capacitor determination. Including: obtaining the fundamental wave voltage effective value, the third harmonic voltage effective value, the fundamental wave current effective value and the third harmonic current effective value of each phase target lightning arrester; based on the fundamental wave voltage effective value, the third harmonic voltage effective value, the fundamental wave current effective value and the third harmonic current effective value, constructing a first capacitive current relationship of each phase target lightning arrester under the interference of the fundamental wave phase-to-phase capacitor and a second capacitive current relationship of each phase target lightning arrester under the interference of the third harmonic phase-to-phase capacitor; based on the phase-to-phase coupling capacitor calculation model, the fundamental wave voltage effective value, the third harmonic voltage effective value, the fundamental wave current effective value and the third harmonic current effective value are calculated to obtain the phase-to-phase coupling capacitor between each phase target lightning arrester.

The invention discloses a bus support capacitance calculation method and device, a medium and a product, and relates to the field of power electronics, and the method comprises the steps: firstly, calculating a neutral-point potential fluctuation allowable value according to a three-phase output voltage peak value and a load power factor angle of a three-level inverter; calculating the three-phase output current of the three-level inverter according to the three-phase output current peak value of the three-level inverter; capacitance current flowing through the subintervals is calculated; then calculating the charge cumulant of the bus capacitor in a charging period; and finally, calculating the minimum capacity of the bus capacitor according to the neutral-point potential fluctuation allowable value and the charge cumulant. The technical problem that the capacitance cost and the capacitance volume cannot be effectively reduced due to the fact that the existing method is low in calculation efficiency and difficult to accurately calculate the minimum capacitance capacity on the premise that the output waveform is not distorted is solved.

The invention relates to a charge capacity calculation device and method for an energy storage system. A method of calculating a charge capacity of an energy storage system according to one embodiment of the present invention. The method includes: a current application step of applying a predetermined current having a constant value to the energy storage system; a first voltage measurement step of measuring a voltage of the energy storage system while a predetermined current having a constant value is applied to the energy storage system; a second voltage measurement step of measuring a voltage of the energy storage system after blocking a predetermined current having a constant value applied to the energy storage system; and a resistance (R) and capacitance (C) calculation step for calculating the resistance (R) and capacitance (C) of the energy storage system on the basis of the voltage of the energy storage system measured in the first voltage measurement step, the voltage of the energy storage system measured in the second voltage measurement step, and a predetermined current having a constant value.

A method for performing guided self-examination of a subject's tissues is described. The method includes: positioning a handheld device comprising multiple electrodes and a certain amount of flexible material in general contact with a region of the subject's body; measuring the capacitance between two of the electrodes; calculating tissue parameters based on the capacitance; determining instructions for the subject in a controller based on the tissue parameters; and issuing instructions to the subject to guide the subject in manipulating the handheld device.

The invention provides a cable insulation dielectric constant extraction method, system and device, and belongs to the technical field of cable detection. The method comprises the steps of determining a cable additional capacitance value in a first preset frequency interval based on a cable length ratio corresponding to a to-be-detected cable group; and obtaining a first cable capacitance value and a second cable capacitance value, and determining an additional inductance value based on the cable additional capacitance value, the first cable inductance value and a preset impedance measurement equivalent relation. The preset impedance measurement equivalent relation is constructed by analyzing an impedance measurement result, the impedance measurement result is an impedance imaginary part obtained by measuring a preset cable based on a preset frequency signal, and the frequency of the preset frequency signal is in a second preset frequency interval; the lower bound of the second preset frequency interval is larger than the upper bound of the first preset frequency interval. And based on the additional inductance value, the second cable capacitance value, the second cable inductance value, the cable additional capacitance value and a preset coaxial capacitance calculation formula, determining a cable relative dielectric constant corresponding to the to-be-detected cable group.

A system and method for determining a piezoelectric property of a piezoelectric material are disclosed. The system includes a voltage source configured to apply a first voltage across the piezoelectric material during a first time period. A mass sensor is operatively coupled to the material to measure an apparent mass thereof, and a capacitance meter is configured to measure a capacitance of the material during the same time period. A processor, communicatively coupled to the mass sensor and the capacitance meter, is configured to calculate a first value indicative of a piezoelectric property, such as a piezoelectric coefficient (d33 or d31), based at least in part on the measured apparent mass and the measured capacitance. By utilizing these concurrent measurements, the system can determine an effective thickness of the material under an applied electric field, circumventing prior art assumptions and enabling a more direct and physically accurate characterization.

The application relates to the field of integrated circuit design, and discloses a method, device and equipment for extracting a capacitance value, wherein the method comprises the following steps: determining a combined capacitance matched with each sidewall offset based on the relative position relationship between adjacent first and second metal layers in a pre-generated capacitance query table; wherein the sidewall offset of one side of the two adjacent metal layers represents the offset of a group of sidewalls of one metal layer on the side of another metal layer; calculating the surface capacitance component of the first and second metal layers based on a preset unit surface capacitance and the projection overlap width between the first and second metal layers; and calculating the capacitance value between the first and second metal layers according to the surface capacitance component and the combined capacitance matched with each sidewall offset. The technical scheme provided by the application can improve the extraction efficiency of the parasitic capacitance of the metal layer.

This utility model discloses a real-time clock circuit and a Beidou receiver, relating to the field of electronic circuit technology. The disclosed real-time clock circuit includes an energy storage module and a timing module. The energy storage module includes at least one electrolytic capacitor, which has a porous anode substrate structure and a dielectric constant higher than a preset dielectric constant. The timing module is connected to both the electrolytic capacitor and a power supply. This utility model utilizes the electrolytic capacitor to store energy when connected to a power supply, receiving the output voltage from the power supply and outputting the stored energy voltage to the timing module when the power supply is disconnected. The porous anode substrate structure of the electrolytic capacitor, with a dielectric constant higher than a preset dielectric constant, enables the storage of more energy in a short time, ensuring longer time recording even after the Beidou receiver is powered off, thus providing a reliable time reference for the long-term operation of the Beidou receiver.

This system provides a DC insulation resistance monitoring system whose measurement results are less susceptible to external noise. [Solution] A DC insulation resistance monitoring system for a high-voltage distribution system, comprising: a neutral point switch for a grounded instrument transformer; an insulating capacitor switched on and off by the neutral point switch; a DC power supply for charging the insulating capacitor; a switch for switching the connection between the DC power supply and the insulating capacitor; and a voltage measuring unit for the insulating capacitor. The voltage measuring unit measures and holds the drift voltage Vd of the insulating capacitor, measures and holds the peak voltage Vp of the insulating capacitor, measures and holds the capacitor voltage Vt after a certain time t has elapsed since the DC power supply was turned off after charging the insulating capacitor with the DC power supply, calculates the voltage discharge time constant of the insulating capacitor as (Vp-Vd) / (Vp-Vt)×t, and calculates the insulation resistance R as T / c using the capacitance C of the insulating capacitor.

This invention relates to the field of electrical performance testing technology for nanoscale thin films, and in particular to a method for testing the dielectric constant and Q value of nanoscale thin films using a network analyzer. The method includes the following steps: S1: Preparing electrodes on the surface of the thin film to be tested, and forming a capacitor with the film; S2: Connecting the electrodes to the network analyzer using a probe station, and performing impedance matching on the circuit before connection; S3: Measuring the resonant frequency of the thin film under test at different frequencies and the S21 parameter at those resonant frequencies; S4: Calculating the capacitance and Q value of the thin film at different frequencies using the S parameters measured in S3; S5: Calculating the dielectric constant of the thin film at different frequencies using the capacitance obtained in S4. This invention has the advantage of simultaneously measuring the Q value of the thin film; and it can be tested at GHz frequencies, offering the advantage of high testing frequency. This invention achieves simultaneous testing of the dielectric constant and Q value of nanoscale thin film dielectrics, featuring accurate test results and high testing frequency.

Provided is an inspection device and an inspection method that easily correct a variation in electrostatic capacitance caused by a manufacturing variation in a substrate. The substrate inspection device is an inspection device that inspects a plurality of substrates on which wiring and reference wiring are formed, and includes: a measurement unit that measures electrostatic capacitance of the wiring and the reference wiring of each substrate as a measurement capacitance; an average capacitance calculation unit that calculates an average value of the measurement capacitance measured from the reference wiring that is designed to be the same wiring as the average capacitance; and a capacitance correction unit that, in a case where one of the plurality of substrates is taken as a target substrate, calculates a correction value of the measurement capacitance of a target wiring that is an inspection target of the target substrate, that is, a correction capacitance, and calculates the correction capacitance by multiplying a ratio of the average capacitance of the wiring of the target substrate to the measurement capacitance by the measurement capacitance of the target wiring.

The application provides a super capacitor internal resistance detection method, comprising the following steps: recording the cumulative charge and discharge capacity of two trigger points, the current value of two trigger points and the voltage value of two trigger points; when the difference of the current value of two trigger points exceeds the first threshold current, calculating the difference of the cumulative charge and discharge capacity of two trigger points, and calculating the voltage change value caused by the charge and discharge capacity of two trigger points through the rated capacity; according to the obtained voltage change value caused by the charge and discharge capacity of two trigger points and the voltage value of two trigger points, calculating the internal resistance voltage of the super capacitor; and according to the obtained internal resistance voltage of the super capacitor and the trigger current value, calculating the internal resistance of the super capacitor. The super capacitor internal resistance detection method provided by the application considers the influence of the capacitor change caused by the short-time large-current charge and discharge on the voltage change of the super capacitor single body, so that the detected internal resistance value of the super capacitor is more accurate.

The invention discloses a capacitance calculation method for power transmission line icing monitoring, and relates to the technical field of power transmission line on-line monitoring, and the method comprises the steps: obtaining a simulation model of an ice viewer device through building a basic model which enables a single three-electrode array to be equivalent to two circular ring capacitors connected in parallel; according to a parallel plate edge effect and an electric field theory, establishing an edge capacitance calculation model of the circular ring capacitor; combining the parallel plate capacitance calculation model and the edge capacitance calculation model to obtain a capacitance calculation model of the single circular ring capacitor; introducing the capacitance calculation model of the single circular ring capacitor and the mutual capacitance among the adjacent three-electrode arrays into the simulation model to obtain a capacitance calculation model of the cylindrical multi-electrode array; and substituting the dielectric constant into a capacitance calculation model of the cylindrical multi-electrode array to obtain a capacitance value of the cylindrical multi-electrode array, so that the capacitance value of the cylindrical multi-electrode array in the icing environment can be accurately calculated.

Wireless circuitry is provided that includes a transformer having a primary coil and a secondary coil, a first group of switchable capacitors coupled to a first terminal of the primary coil, a second group of switchable capacitors coupled to a second terminal of the primary coil, and capacitance measurement circuitry selectively coupled to a center tap of the primary coil during a measurement mode. The capacitance measurement circuitry can include a current source, a current sink, a comparator, a voltage generator for providing one or more threshold / reference voltages to the comparator, a frequency measurement circuit, and a capacitance calculation circuit configured to compute a capacitance of the first and second groups of switchable capacitors.

Provided is a capacitive non-contact input device capable of smoothly moving a position calculated for displaying a pointer in accordance with the position of an indicator.　The capacitive non-contact input device according to an embodiment of the present disclosure includes: a plurality of sensor electrodes disposed along a plane on a back surface side of an operation surface; a measurement circuit for measuring capacitance between each of the plurality of sensor electrodes and an indicator; and a control unit. The control unit: calculates a measurement position, which is a planar position of the indicator, and a variation in the measurement position, on the basis of the capacitance measured by the measurement circuit; calculates a moving average position, which is a planar position of the indicator, on the basis of the moving average of the measurement position at a plurality of points in time; and when calculating the moving average position, increases a weighting coefficient of the latest measurement position in the moving average as the variation decreases.

This invention discloses a method for evaluating the quality of solid electrolyte interphase (SEI) film formation in lithium-ion batteries. The method includes: applying an AC perturbation signal with an amplitude of 1-20 mV during the lithium-ion battery formation stage or cycling process, and real-time acquisition of electrochemical impedance spectroscopy (EIS) data across the entire frequency band; decoupling the mid-frequency EIS using the relaxation time distribution method; constructing an equivalent circuit model incorporating SEI film characteristics, which is then fitted to the decoupled EIS curve; calculating the SEI film compactness index based on the SEI film resistance and capacitance, and using the compactness index to determine whether the SEI film compactness meets the standard; and calculating the lithium-ion diffusion coefficient by combining charge transfer resistance and Warburg diffusion impedance to evaluate the SEI film ion transport efficiency. This invention supports non-destructive monitoring and enables quantitative assessment of SEI film compactness, ion conductivity, and short-circuit faults within the module, thereby improving the cycle life and safety of lithium-ion batteries.

The application provides a touch sensitivity self-adapting method, which comprises the following steps: estimating a finger capacitance Cf according to panel information of a touch product; calculating a key parasitic capacitance Cx according to collected key data; calculating a sensitivity when a finger is pressed according to the key parasitic capacitance Cx and the finger capacitance Cf; keeping the sensitivity of each key consistent to calibrate a sensitivity parameter of each key; and adjusting the sensitivity in real time during use of the touch product.

To provide a deterioration diagnosis system or the like of a capacitor mounted on a substrate for an elevator capable of accurately performing deterioration diagnosis of the capacitor mounted on the substrate for the elevator and suppressing malfunction of control based on deterioration of the capacitor.SOLUTION: A degradation diagnostic system includes a measuring circuit unit (41) including a switch unit (82) that selectively switches between charging and discharging of a capacitor mounted on a substrate, a storage unit (47) that records a voltage waveform of the capacitor in at least a part of discharging of the capacitor, a capacitance calculating unit (46c) that calculates a capacitance of the capacitor based on the voltage waveform, a degradation determining unit (46c) that determines presence or absence of degradation of the capacitor (7) based on a signal from the capacitance calculating unit (46d), and a communication unit (42) that outputs information capable of specifying the degradation of the capacitor when the degradation determining unit (46d) determines the degradation of the capacitor.SELECTED DRAWING: Figure 2

The invention discloses an equivalent circuit modeling method based on a truncated spherical micro Bump-CTSV interconnection structure. The method comprises the following steps: constructing the truncated spherical micro Bump-CTSV interconnection structure comprising a top truncated spherical micro Bump, a bottom truncated spherical micro Bump and a CTSV interconnection structure; inductance, resistance, dielectric capacitance, oxide layer capacitance and depletion layer capacitance of the CTSV interconnection structure are calculated, first capacitance and third capacitance are calculated according to the dielectric capacitance, and second capacitance and fourth capacitance are calculated according to the oxide layer capacitance and the depletion layer capacitance; respectively calculating the inductance and the resistance of the top and bottom truncated spherical micro Bump and the capacitance between the micro Bump and the substrate by adopting a segmentation summation thought; and modeling an equivalent circuit according to the inductor, the resistor, the first capacitor, the second capacitor, the third capacitor and the fourth capacitor of the CTSV interconnection structure, the inductor and the resistor of the top and bottom truncated spherical micro Bump and the capacitor between the top and bottom truncated spherical micro Bump and the substrate. The method is more applicable in a broadband range.

The invention provides a deterioration diagnosis system and a deterioration diagnosis method for a substrate-mounted capacitor for an elevator, and the elevator. A deterioration diagnosis system is provided with: a measurement circuit unit (41) including a switch unit (82) that selectively switches between charging and discharging of a capacitor mounted on a substrate; a storage unit (47) that records at least a portion of the voltage waveform of the capacitor when the capacitor is discharged; a capacitance calculation unit (46c) that calculates the capacitance of the capacitor on the basis of the voltage waveform; a deterioration determination unit (46d) that determines the presence or absence of deterioration of the capacitor (7) on the basis of a signal from the capacitance calculation unit (46c); and a communication unit (42) that, when the degradation determination unit (46d) determines the degradation of the capacitor, outputs information capable of specifying the degradation of the capacitor.

The application provides a method, system, device and medium for impedance optimization of complex single-ended TSV, comprising: performing quasi-static three-dimensional electromagnetic simulation on a target TSV loop to obtain total loop inductance and total capacitance of a TSV structure; constructing a transmission line profile model connected at both ends of the TSV to obtain unit length capacitance and unit length inductance of a transmission line at both ends of the TSV; based on the total loop inductance and the total capacitance of the TSV structure and the unit length capacitance and the unit length inductance of the transmission line at both ends of the TSV, obtaining loop inductance and capacitance of an intermediate TSV part, and calculating characteristic impedance of the target TSV loop based on the loop inductance and the capacitance of the intermediate TSV part; comparing the characteristic impedance of the target TSV loop with target characteristic impedance, and performing impedance matching optimization on an existing structure to obtain a new structure after optimization; the application can greatly reduce the optimization design time of complex single-ended TSV in 2.5D and 3D packaging products, and improve product design efficiency.

Embodiments of the present application disclose a kind of non-contact voltage measurement method, device, electronic equipment and storage medium, wherein the method comprises: by the distance sensor of uniform distribution on the probe of voltage measurement sensor, the distance of the probe to the surface point of measured object is measured, and measurement data is obtained;With the plane of the cross section where the probe is located as plane, space orthogonal coordinate system is established, the matrix equation is integrated out for calculation in combination with the measurement data, the position of the wire in the plane is determined;According to the position of the wire in the plane, coupling capacitance is obtained by calculation;According to the coupling capacitance, coupling voltage is obtained by calculation, the uniformity and accuracy of measurement data can be ensured, and the reliability and precision of voltage measurement are improved.

The invention relates to the field of integrated circuit design, and discloses a capacitance value extraction method, device and equipment, and the method comprises the steps: determining a combined capacitor matched with the offset of each side wall in a pre-generated capacitor look-up table based on the relative position relation between a first metal layer and a second metal layer which are adjacent; wherein the offset of the side walls of one sides of two adjacent metal layers represents the offset of one group of side walls of one metal layer and the other metal layer on the side; calculating surface capacitance components of the first metal layer and the second metal layer based on a preset unit surface capacitance and a projection overlapping width between the first metal layer and the second metal layer; and calculating a capacitance value between the first metal layer and the second metal layer according to the surface capacitance component and the combined capacitance matched with each side wall offset. According to the technical scheme provided by the invention, the extraction efficiency of the parasitic capacitance of the metal layer can be improved.