The present application provides a test method and a test device for a capacitive touch sensing circuit. The capacitive touch sensing circuit includes: a
dielectric layer, a touch sensing unit, and a capacitive touch sensing
electrode. The
dielectric layer is mounted on the capacitive touch sensing
electrode. The method includes: when there is no external
electric field, measuring, by the touch sensing unit, a reference charge required for the capacitive touch sensing
electrode to reach a preset
voltage; applying a preset external
electric field to the capacitive touch sensing circuit by an external test circuit, and measuring, by the touch sensing unit, a test charge required for the capacitive touch sensing electrode to reach the preset
voltage; calculating, according to the test charge, the reference charge, and the preset
voltage, a to-be-tested inductive
capacitance of the capacitive touch sensing circuit; measuring, in the same external
electric field, a standard inductive
capacitance of a preset capacitive touch sensing standard circuit; and calculating a comparison deviation value according to the to-be-tested inductive
capacitance and the standard inductive capacitance to determine whether the capacitive touch sensing circuit passes the test.