This invention discloses a two-dimensional
laser scanning
galvanometer device based on piezoelectric bicrystalline
wafer driving, belonging to the field of piezoelectric driven scanning
galvanometer technology. It includes a base with a circular hole on its side wall. A
laser emitting device, partially penetrating the interior of the base, is installed through this hole. A first deflecting lens group is mounted on the side of the base. Below the first deflecting lens group, a second deflecting lens group is fixed to the base and perpendicular to it. A top cover is mounted on the top of the base. This invention, employing the aforementioned two-dimensional
laser scanning
galvanometer device based on piezoelectric bicrystalline
wafer driving, solves the problems of dynamic performance contradictions, thermal drift, and reliability limitations inherent in existing electromagnetically driven scanning galvanometers. It fundamentally achieves high-bandwidth, low-heat-dissipation, and wear-free precision
beam scanning. Furthermore, it is compact, portable, and low-cost, making it suitable for
mass production and widespread civilian application.