30results about "Resistor trimming" patented technology

The present invention provides resistors having various arrangements of conductive parts and resistive elements, current sensing resistors, battery shunt resistors, and shunt resistors. [Solution] The resistor 610 has one or more resistive elements 611 and a plurality of conductive parts 612, 614. Openings or slots 672, 676 are formed within the resistive elements in a configuration that allows adjustment of the resistor's TCR (temperature coefficient of resistance). The shape, number, and orientation of the openings or slots are variable. In one embodiment, a header member is provided to fix or hold pins to the resistor.

The present disclosure relates to semiconductor structures and, more particularly, to resistor trimming structures and methods of use. The structure includes: a set of resistors each of which include an increasing resistance value; and a set of switches each of which are connected to a respective resistor of the set of resistors and each of which comprise a decreasing width dimension for each resistor of increasing resistance value.

The invention relates to a resistor (1) with a conductive material layer (3) made of a conductive material, a resistive material layer (2) made of a resistive material and joined to the conductive material layer (3), and with a groove (4) having a specific groove width (b), a specific groove depth (t) and a specific groove flank angle relative to the plane of the conductive material layer (3), wherein the groove (4) is arranged in the conductive material layer (3) and separates the conductive material layer (3) into two connection parts (5, 6) and projects into the resistive material layer (2). According to the invention, the groove flank angle is set such that the temperature coefficient of the resistance value is as close as possible to zero. The invention also relates to an associated production method.

To provide a method of easily, accurately and efficiently adjusting a temperature coefficient of resistance of a current sense resistor and a shunt resistor, and the resistors.SOLUTION: A resistor 10 has one or more resistive elements 11, 13 and a plurality of conductive portions 12, 14, 16. Openings or slots 72 allowing adjustment of temperature coefficient of resistance (TCR) values of the resistor are formed adjacently to a second side, namely an inner side 20, of the first conductive portion 12. The shape, quantity and orientation of the openings or slots can vary. In one aspect, header members 80a, 80b are provided for securing or holding pins 84 relative to the resistor.SELECTED DRAWING: Figure 1

In a chip resistor, a first trimming groove has: a first linear portion extending linearly from a first edge along an X-axis direction; and a second linear portion extending linearly along the Y-axis direction. The second trimming groove includes: a third linear portion disposed on a second upper surface electrode side of the first linear portion and extending linearly along the first linear portion 1 from the first edge; and a fourth linear portion disposed on the second edge side of the second linear portion and extending linearly along the second linear portion from the tip of the third linear portion. When viewed in the X-axis direction, the tip of the second trimming groove is positioned closer to the second upper surface electrode side than the tip of the first trimming groove.

The invention discloses a miniature low-resistance thick-diaphragm thermistor and a resistance value adjusting method thereof, and belongs to the technical field of production of thick-diaphragm thermistors. The miniature low-resistance thick diaphragm type thermistor comprises a ceramic substrate, a thermistor layer, a first end electrode, a second end electrode, a first interdigital electrode layer, a second interdigital electrode layer and a top electrode layer, wherein the first interdigital electrode layer, the second interdigital electrode layer and the top electrode layer are made of electric conductor materials; according to the resistance value adjusting method, the resistance value of the horizontal branch and the resistance value of the vertical branch are calculated firstly, and then the resistance value of the miniature low-resistance thick-diaphragm thermistor is calculated. According to the invention, the interdigital electrode layer and the top electrode layer are connected with the thermistor layer and are used as resistance adjusting assemblies, so that the low-resistance function and the resistance adjusting function of the thick film type thermistor are greatly realized through structure adjustment, and the use amount of noble metal can be reduced, so that the cost is reduced, and the product volume is reduced; and finally, the comprehensive functions of miniaturization, low resistance, low cost and convenience in resistance value adjustment are realized at the same time.

The invention relates to a resistor (1) with two plate-shaped terminal parts (4, 5) made of a conductor material and a plate-shaped resistive element (3) made of a resistive material arranged sandwich-like between them, such that the electric current (I) flows transversely to the plane of the plates through the plate-shaped resistive element (3). The invention provides that the upper and lower contact surfaces (6, 7) between the resistive element (3) and the upper and lower terminal parts (4, 5) are bounded by an upper and lower lacquer frame (10, 11) made of an electrically insulating solder mask, wherein the upper and lower lacquer frame (10, 11) is applied to the top and bottom surfaces of the resistive element (3) and frames the upper and lower terminal parts (4, 5), thereby defining the area of ​​the upper and lower contact surfaces (6, 7).Furthermore, the invention comprises a manufacturing unit with several non-isolated resistors (1) according to the invention, a printed circuit board arrangement with a resistor (1) according to the invention and a manufacturing method for producing a resistor (1) according to the invention.

The invention relates to a PTC heating element (1) with a three-dimensional base body (2) having at least two opposing main surfaces (3, 4), wherein the distance of the base body (2) between the main surfaces (3, 4) is the thickness D of the base body (2), and wherein the electrical resistance R of the PTC heating element (1) has a minimum at higher temperatures and a resistance characteristic that increases further at even higher temperatures, wherein the reference temperature Tref is the temperature at which the electrical resistance has twice the value at its minimum at Tmin, and wherein the following applies to Tref: Tref = ( 40 * D / mm + 107 ) * ° C with a tolerance of ±10 °C for 0.5 mm <= D <= 1.7 mm with a tolerance of D ± 0.25 mm 85 ° C < = Tref < = 175 ° C.

The invention relates to a PTC heating element having a three-dimensional main body (2) with at least two main surfaces (3, 4) facing away from each other, the distance of the main body (2) between the main surfaces (3, 4) being the thickness D of the main body (2), and wherein the resistance R of the PTC heating element (1) has a minimum value first as the temperature increases and has a resistance characteristic that continues to increase as the temperature continues to increase, the reference temperature Tref is the temperature at which the resistance has two times the minimum value at Tmin, and wherein for Tref, it is applicable: Tref = (40 * D / mm + 107) DEG C wherein the tolerance is + / -10 K, the applicable condition: 0.5 mm < = D < = 1.7 mm wherein the tolerance of D is + / -0.25 mm, 85 DEG C < = Tref < = 175 DEG C.

The present invention provides a thin-film thermistor, an electronic device, and a method for adjusting the resistance value of a thin-film thermistor, which allow for more flexible and appropriate adjustment of electrical characteristics. [Solution] The thin-film thermistor comprises an insulating substrate, a temperature-sensing layer (31), a first electrode (321), and a second electrode (322). The temperature-sensing layer (31) is located on the first surface of the insulating substrate. The first electrode (321) is located in contact with the temperature-sensing layer (31). The second electrode (322) is located in contact with the temperature-sensing layer (31) but at a distance from the first electrode (321). The first electrode (321) and the second electrode (322) each have a plurality of separated electrode portions, which are a main electrode (88) and a sub-electrode (89).

The invention relates to a PTC heating element (1) with a three-dimensional base body (2) having at least two opposing main surfaces (3, 4), wherein the distance of the base body (2) between the main surfaces (3, 4) is the thickness D of the base body (2), and wherein the electrical resistance R of the PTC heating element (1) has a minimum at higher temperatures and a resistance characteristic that increases further at higher temperatures, wherein the reference temperature Tref is the temperature at which the electrical resistance has twice the value at its minimum at Tmin, and wherein the following applies to Tref: Tref = ( 40 * D / mm + 75 ) °C with a tolerance of + − 10 °C for 0.625 mm <= D <= 2.5 mm and with a tolerance of D + − 0.25 mm . 100 <= Tref <= 175 °C .

A columnar resistor and a method of laser trimming for manufacturing the same are provided. The columnar resistor includes a resistance layer disposed on the surface of a columnar substrate and the resistive layer includes a resistance determining area, a first resistance adjustment area, and a second resistance adjustment area. The resistance determining area is configured to form a first laser-trimming line and achieve a first resistance value by a first laser-trimming. The first resistance adjustment area is configured to form a second laser-trimming line and achieve a second resistance value by a second laser-trimming. The resistance value is precisely adjusted by two laser-trimming processes of the resistive layer, thereby improving the stability of product manufacturing.

The invention provides a chip resistor which has excellent surge characteristics and is suitable for miniaturization. In this chip resistor (1), for a crank-shaped resistor (7) having a first resistor part (7a), a second resistor part (7b), and a third resistor part (7c), a first adjustment groove (12) and a second adjustment groove (13) are formed using substantially point-symmetric positions of the upper and lower sides of the first resistor part (7a) as starting end positions. The terminal positions of the first adjustment groove (12) and the second adjustment groove (13) are set so as not to exceed a first straight line (A) that passes through the center (O point) of the first resistor body section (7a) and extends in the X-axis direction, and so as not to overlap on the same Y-axis.

The invention relates to a PTC heating element having a three-dimensional main body (2) with at least two main surfaces (3, 4) facing away from each other, the distance of the main body (2) between the main surfaces (3, 4) being the thickness D of the main body (2), and wherein the resistance R of the PTC heating element (1) has a minimum value first as the temperature increases and has a resistance characteristic that continues to increase as the temperature continues to increase, the reference temperature Tref is the temperature at which the resistance has twice the minimum value at Tmin, and wherein for Tref: Tref = (40 * D / mm + 75) DEG C wherein the tolerance of Tref is + / -10 K, the condition of application: 0.625 mm < = D < = 2.5 mm wherein the tolerance of D is + / -0.25 mm, 100 DEG C < = Tref < = 175 DEG C.

The invention relates to a resistor (1) comprising a conductor material layer (3) made of a conductor material, a resistive material layer (2) made of a resistive material joined to the conductor material layer (3), and a groove (4) having a specific groove width (b), a specific groove depth (t), and a specific groove flank angle relative to the plane of the conductor material layer (3), wherein the groove (4) is arranged in the conductor material layer (3) and divides the conductor material layer (3) into two terminal parts (5, 6) and projects into the resistive material layer (2). The invention provides that the groove flank angle is set such that the temperature coefficient of the resistance value is as close to zero as possible. Furthermore, the invention includes an associated manufacturing process.

To provide a circuit substrate and a manufacturing method for the same, in particular, that can eliminate the need to check the appearance of patterns for resistance value adjustments, make work efficiency improved, and stabilize the resistance characteristics.SOLUTION: The circuit substrate includes a resistive element (1a) having a pattern for adjusting resistance values and a trimming start mark (20) indicating a position of a trimming start point with respect to the pattern for adjusting resistance values. The trimming start mark has a first mark (23) and a second mark (24) that is spaced with respect to the first mark and opposes the first mark on a side away from the pattern for adjusting resistance values.SELECTED DRAWING: Figure 3

A columnar resistor and a method of laser trimming for manufacturing the same are provided. The columnar resistor includes a resistance layer disposed on the surface of a columnar substrate and the resistive layer includes a resistance determining area, a first resistance adjustment area, and a second resistance adjustment area. The resistance determining area is configured to form a first laser-trimming line and achieve a first resistance value by a first laser-trimming. The first resistance adjustment area is configured to form a second laser-trimming line and achieve a second resistance value by a second laser-trimming. The resistance value is precisely adjusted by two laser-trimming processes of the resistive layer, thereby improving the stability of product manufacturing.

The invention discloses a three-electrode precision resistor which comprises a resistor element, a first end electrode connected with one end of the resistor element, a second end electrode connected with the other end of the resistor element, and an intermediate electrode located between the first end electrode and the second end electrode and connected with the surface of the resistor element. A first resistance value between the first end electrode and the middle electrode, a second resistance value between the middle electrode and the second end electrode and a third resistance value between the first end electrode and the second end electrode can be measured respectively; the invention also provides a manufacturing method of the three-electrode precision resistor, a test assembly comprising the three-electrode precision resistor and a test method.

Provided are a resistance circuit and a current detection circuit having the same, which have small temperature dependence, can adjust a resistance value in a wide range from a high resistance value to a low resistance value, and have a small area. A resistance circuit connected between a first terminal and a second terminal and having a variable resistance value, the resistance circuit having a reference resistance, a series variable resistance group, and a parallel variable resistance group, the series variable resistance group having N parallel variable resistance units (RP(1) to (N)) connected in series with each other, the N parallel variable resistance units each having a resistance and a trimming element connected in parallel with the resistance, the parallel variable resistance group having M series variable resistance units (RS(1) to (M)) connected in parallel with each other, the M series variable resistance units each having a resistance and a trimming element connected in series with the resistance.

A heating wire resistance adjusting device of a winding machine comprises a machine base, a supporting base and a hollow shaft are arranged on the left side of the upper surface of the machine base, a first transmission wheel is installed at the left end of the hollow shaft, and a driving wheel, a pay-off roller and a wire winding block are installed at the right end of the hollow shaft; supporting transverse bases are arranged on the right side of the machine base, and a first conical column and a second conical column are rotationally connected between the two supporting transverse bases through a first rotating shaft and a second rotating shaft. An adjusting transmission belt is arranged between the first conical column and the second conical column, a first guide roller is mounted at the front end of the first rotating shaft, and a second guide roller is mounted on the base; a transverse plate and a vertical rod are arranged in the middle of the supporting transverse seat, conductive shafts are arranged on the left and right sides of the transverse plate respectively, and the rear ends of the conductive shafts are connected with a resistance meter through conductive slip rings; a wire guide wheel is arranged on the vertical rod; a take-up assembly is arranged on the right side of the base. According to the utility model, through directly adjusting the position of the transmission belt in the axial direction of the first conical column and the second conical column, the effect of rapidly adjusting the resistance of the heating wire can be realized.

A chip resistor (1) comprises an insulating substrate (10), a first electrode (20), a second electrode (30), a resistor (16), a first heat transfer layer (40), a second heat transfer layer (41), and an insulating protective layer (43). The first heat transfer layer (40) has greater thermal conductivity than the insulating protective layer (43) and is in contact with the resistor (16) and a first front surface electrode (21). The second heat transfer layer (41) is at a distance from the first heat transfer layer (40). The second heat transfer layer (41) has greater thermal conductivity than the insulating protective layer (43) and is in contact with the resistor (16) and a second front surface electrode (31).

The invention relates to a method for determining a resistance value of a measuring resistor, comprising the following steps: a) providing an assembly for measuring a current intensity, said assembly comprising a measuring resistor and a reference resistor; b) defining a resistance ratio; c) measuring a resistance value of the measuring resistor by means of a first measuring device; d) measuring the resistance value of the reference resistor; e) adjusting the resistance value of the reference resistor such that the ratio of the resistance value of the reference resistor to the resistance value of the measurement resistor is equal to the defined resistance ratio; f) integrating the component into an application environment; g) measuring the resistance value of the reference resistor in the application environment by means of a second measuring device; and h) determining the resistance value of the measuring resistor according to the resistance value of the reference resistor measured in the step g) and the known resistance ratio in the step b). The invention also relates to an assembly for carrying out the method.

A resistor includes a resistive element including a first surface and a second surface facing opposite sides in a thickness direction; a protective film having electrical insulating properties disposed on the first surface; and a pair of electrodes disposed spaced apart from each other in a first direction perpendicular to the thickness direction, the pair of electrodes being configured to come into contact with the resistive element. The protective film includes a first outer edge and a second outer edge spaced apart from each other in the first direction and extending in a second direction perpendicular to both the thickness direction and the first direction. The resistive element includes a first slit and a second slit extending from the first surface through to the second surface and extending in the second direction. The first slit is located closest to the first outer edge; and the second slit is located closest to the second outer edge. As viewed in the thickness direction, a first distance from the first outer edge to the first slit and a second distance from the second outer edge to the second slit together have a length 15% or greater of a dimension of the protective film in the first direction.

A resistor trimming device comprising a resistor trimming unit is provided, which divides a single one adjustable resistor string into a plurality of adjustable resistor string groups, so that a resistance of the parallel resistor faced by a switch can be effectively reduced, and a design of the on-resistance and off-resistance of the switch can comply with a general design rule. In addition, the resistor trimming device provided further comprises a decoder. When trimming the overall resistance of an electronic device, a user can directly input a binary code or an original thermometer code used in the adjustable resistor string being not grouped, without knowing an encoding manner, and then, the decoder generates a trimming thermometer code and a group code to control a main switch and switches in the multiple adjustable resistor string groups being the grouped from the adjustable resistor string.

The invention relates to a method for determining the resistance value of a measurement resistor, comprising the following steps: a) providing an assembly for measuring the strength of an electric current, wherein the assembly comprises a measurement resistor and a reference resistor, b) defining a resistance ratio, c) measuring the resistance value of the measurement resistor by means of a first measurement device, d) measuring the resistance value of the reference resistor, e) adjusting the resistance value of the reference resistor such that the ratio of the resistance value of the reference resistor to the resistance value of the measurement resistor equals the defined resistance ratio, f) integrating the assembly in an application environment, g) measuring the resistance value of the reference resistor in the application environment by means of a second measurement device, h) determining the resistance value of the measurement resistor from the resistance value of the reference resistor measured in step g) and the resistance ratio known from step b). The invention also relates to an assembly for carrying out such a method.

A current detection device (30) is provided with a resistor (5) and a pair of electrodes (6, 7). The current detection device (30) includes a protruding portion (11). The protruding portion (11) includes a part of the resistor (5) and parts of the pair of electrodes (6, 7). The electrodes (6, 7) each has a first wall portion (66b, 67b) forming a part of the protruding portion (11), and a second wall portion (66a, 67a) forming a part of the protruding portion (11). The electrodes (6, 7) each have a detecting region (66, 67) defined by the first wall portion (66b, 67b), the second wall portion (66a, 67a), a start-end portion (66c, 67c), and a contact surface (6a, 7a). The electrodes (6, 7) each have a voltage detecting portion (20, 21) disposed in the detecting region (66, 67) with a gap from the start-end portion (66c, 67c).

To provide a shunt resistor capable of satisfying a desired TCR.SOLUTION: A shunt resistor 1 includes electrodes 6, 7 connected to both ends of a resistor 5. The electrodes 6, 7 include main-flow electrode parts 6A, 7A and shunt-flow electrode parts 6B, 7B. Voltage detection terminals 15A, 15B are provided in the shunt-flow electrode parts 6B, 7B.SELECTED DRAWING: Figure 1

Provided is an electronic component having a small change in characteristics due to moisture. Electronic component includes substrate, element part, and insulating protective layer. Element part is formed on substrate. Insulating protective layer covers element part. Element part includes trimming groove. Insulating protective layer includes cover part containing a cured product of polysilsesquioxane. Cover part includes surface cover layer covering a surface of element part and filling part filled in trimming groove.

The invention belongs to the technical field of thin-film resistors, and particularly relates to a laser resistance trimming method for improving the stability of a thin-film resistor. The method comprises the following steps: pre-testing; carrying out first laser resistance trimming; and carrying out oxidation treatment and secondary laser resistance trimming. According to the technical scheme provided by the invention, unstable factors are consumed through active oxidation treatment, so that main factors causing resistance drift are fundamentally inhibited; the stability treatment method can be simply and quickly added into the preparation process of the existing thin-film resistor, and the adjustment cost is low; the stability treatment time is relatively short, and other post-treatment does not need to be added; and the added oxidation process is safe and pollution-free, and normal production is not influenced.

To provide a chip resistor that can make the remaining width of a resistor after trimming longer, can dissipate heat from hot spots, can reduce the effect of printing bleeding when forming a top electrode on the top surface of the resistor, and can reduce an overlapping area between the resistor and the top electrode.SOLUTION: A top electrode 14 is formed on the top surface of a resistor 12, and in a side portion 12a and a side portion 12b, which are a pair of side portions formed between the pair of top electrodes 14 in the resistor 12, one side portion has a curved shape bulging toward the opposite side of the other side portion.SELECTED DRAWING: Figure 1