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103results about How to "Cost-effective fabrication" patented technology

RFID devices for verification of correctness, reliability, functionality and security

The present invention differs from the prior art in that the present invention provides one or a network of passive or active radio frequency identification (RFID) transceivers and antenna elements in different numbers, in various network sizes, in different configurations and on various substrates. The RFID transceiver can be co-located with standard semiconductor devices, for cost-effective circuit design and non-destructive fabrication test and analysis of integrated circuits and printed circuit boards after fabrication, and to locate, track and identify the integrated circuit, printed circuit boards and products in which they are implemented. The RFID transceivers can be coupled to substrates containing matter in gas, liquid, or solid form, such as medical devices like breast implants, for effective monitoring of the substrates to ensure that the substrate is in an unaltered state and the matter is still contained securely within. The RFID transceivers can be coupled to secure tapes of various lengths and widths and mesh bags or sheets of various sizes and they can be applied at the carton-level using them to locate, track and identify the integrated circuit, printed circuit boards and products in which they are implemented and/or the cartons in which they were placed.
Owner:EIGENT TECH

Thin film transistor array substrate for a liquid crystal display having repair lines

A thin film transistor array substrate for a liquid crystal display includes an insulating substrate with a display area and a peripheral area surrounding the display area. The peripheral area has an upper region above the display area and a lower region below the display area. Signal lines are formed on the substrate such that the signal lines are bundled into a plurality of blocks. Each block has a predetermined number of signal lines. A plurality of first upper repair lines is formed at the upper peripheral region of the substrate, crossing one or more blocks of the signal lines. A plurality of second upper repair lines is formed at the upper peripheral region of the substrate, crossing all of the signal lines. A plurality of first lower repair lines are formed at the lower peripheral region of the substrate, connected to the corresponding first upper repair lines. The first lower repair lines cross the signal lines crossed by the first upper repair lines. A plurality of second lower repair lines is formed at the lower peripheral region of the substrate, crossing all of the signal lines. A plurality of upper connection members crosses the first upper repair lines and the second upper repair lines. A plurality of lower connection members crosses the first lower repair lines and the second lower repair lines. In this structure, even though line breakage is concentrated at a particular area, such line breakage can be collectively repaired using the spare neighboring repair lines and interconnection lines interconnecting the repair lines efficiently.
Owner:SAMSUNG DISPLAY CO LTD
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