The invention discloses a
transistor-based
radiation effect on-line test
system and a test method thereof. The test
system comprises a test circuit, an industrial
personal computer, a shielding cableand an
irradiation board. Based on the
linear relation between the direct-current
gain of a
transistor and the injection amount of illuminated neutrons, the
transistor is adopted as an
irradiation effect parameter measurement
detector, and then an
irradiation effect parameter
online test system is built. Based on a CFBR-II reactor and a
cobalt source, the test system is verified by respectively performing the injury heterogeneity test in transient-state and steady-state different irradiation
modes and the injury equivalence test for different irradiation sequences of
neutron and gamma. In thisway, the real-time measurement of sample effect parameters under the transient-state irradiation condition and the steady-state irradiation condition is realized. According to the invention, the testsystem fully realizes the advantages of a
virtual instrument, such as flexibility, universality, expandability, powerful
software function and the like. The number of
peripheral hardware is reduced as much as possible. On the premise that hardware equipment and the wire connecting condition are not changed at all, the drawing of various transistor characteristic curves and the testing of parameters can be realized only through changing the
software program.