The invention relates to a transparent material internal defect detection method based on time-sharing exposure image synthesis, and the method is characterized in that bright field irradiation and dark field irradiation are respectively carried out on a to-be-detected object made of a transparent material in transmission, and a camera acquires a bright field image and a dark field image of the surface of the to-be-detected object in a time-sharing exposure mode; after suspected defects are extracted from a bright field, the suspected defects are converted into a dark field for re-judgment, complex and time-consuming filtering processing is not required to be designed in the bright field, and the overall operation time is shortened; comprehensive processing is carried out in the bright anddark field images, and discrimination for distinguishing defects and dust is achieved through dark field assistance, so that the defect detection rate is improved; complex frequency domain processingis not needed, the development period is shortened, and the later maintenance of developers is easy; and the whole logic design is simplified, the algorithm development period is shortened, the algorithm operation efficiency is improved, and the detection problem in the actual production process of the AOI equipment is improved.