2 results about "Noise matching" patented technology

This invention discloses a high-gain, miniaturized millimeter-wave low-noise amplifier. It includes an input matching network, a noise level circuit, a gain stage circuit, and an output matching network. The low-noise amplifier uses a series gate inductor for noise matching and wide-bandwidth input impedance matching. The gain stage employs a slow-wave transmission line feedback mechanism to achieve high gain and wide bandwidth, and miniaturization is achieved through a spiral inductor and a slow-wave transmission line. The output matching network uses an L-shaped matching network. Unlike traditional inductors or transmission lines, this invention uses a slow-wave transmission line for feedback, achieving high gain while also possessing foldable characteristics and allowing the same inductance value to be achieved with a shorter length, thereby reducing chip area and manufacturing costs.

This invention provides a method and system for testing high-frequency transformer winding coils, relating to the field of high-frequency transformer technology. The method includes the following steps: generating a standard calibration signal matching the target test frequency range, connecting it to an unloaded test link, a short-circuit test link, and a standard impedance load link respectively; collecting noise signal characteristics of each link; and establishing a noise database and calibration coefficient table. Through sensing units deployed around the winding coil, the method non-contactly collects electromagnetic field change data during coil operation in real time. This invention addresses interference problems caused by cable parasitic inductance, environmental electromagnetic noise, and instrument noise in high-frequency scenarios through pre-calibration and adaptive anti-interference compensation mechanisms. By establishing a noise database, it achieves accurate noise matching. Combined with adaptive filtering algorithms and dynamic adjustment of the excitation signal, it significantly improves the testing accuracy of sensitive parameters such as leakage inductance and distributed capacitance, ensuring test reliability.