The invention relates to a method for quickly measuring the precision of a reflection face of a radiotelescope. The method can effectively solve the problems that in the large-caliber radiotelescope reflection face precision measurement process, measurement time is long, measurement precision is low, the angle of pitch of measurement is fixed, and external hardware equipment is needed for assistance. According to the method as a special phase retrieval microwave holography method, it is only needed that the amplitude of an antenna aperture field is measured, and the retrieval of the phase of the antenna aperture field is carried out according to a certain method. In the method, any stable astronomical radio source can serve as a signal source, and beam patterns are scanned under the antenna focusing condition or the antenna out-of-focus condition through an astronomic receiving machine and a terminal (power radiometer); an antenna aperture phase model is built according to the Zernike polynomials function, iterative operation is carried out on the residual error of a model value and a measured value through the minimization algorithm, and therefore the optimal solution corresponding to the minimum residual error vector is obtained to obtain a Zernike polynomials coefficient, backstepping is carried out to obtain the hole aperture phase distribution of an antenna, and the precision of the reflection face of the radiotelescope can be obtained.