The present disclosure provides a simulation test method and device of a large model, electronic equipment and storage medium, relates to the technical field of computers, and particularly relates to the technical field of artificial intelligence such as deep learning and large models. The specific implementation scheme is as follows: obtaining inference performance data of a large model to be tested; determining a first mapping relationship of a pre-filling stage and a second mapping relationship of a decoding stage based on the inference performance data, the first mapping relationship at least including a corresponding relationship between pre-filling time consumption and input token quantity, and the second mapping relationship at least including a corresponding relationship between decoding time consumption and concurrency quantity; and performing simulated inference on the large model to be tested by using the first mapping relationship and the second mapping relationship to obtain a simulation test result. The present disclosure can improve the accuracy of the simulation test result.