The invention discloses a Mini
LED lamp panel needle mark defect detection method and
system, and the method comprises the following steps: S1, carrying out the preprocessing of a Mini
LED lamp panel surface image, suppressing high-
frequency noise, and enhancing the defect features; s2, extracting defect features by adopting a self-adaptive
convolution adjacency
analysis method: S21, dynamically adjusting the shape and size of a
convolution kernel through a deformable self-adaptive
convolution kernel, and matching the local form of the needle mark defect; and S22, carrying out
correlation analysis on the pixel points and neighborhoods thereof, and eliminating isolated
noise interference. According to the method, defect forms are dynamically matched through the self-adaptive convolution kernel, isolated
noise is eliminated through adjacency analysis, defects of different sizes are covered through multi-scale fusion,
wavelet filtering and a
parallel computing architecture are combined, the detection precision and the anti-jamming capability are remarkably improved, stable recognition of the tiny needle marks in the complex environment is achieved, meanwhile, high-speed real-
time processing is guaranteed, and the detection accuracy and the anti-jamming capability are improved. The method is suitable for diversified industrial scenes and
material requirements, reduces the
false detection and omission ratio, and promotes the intelligent upgrading of precision
manufacturing quality inspection.