7 results about "Wavefront coding" patented technology

The invention discloses a wavefront coding microscopic system depth-of-field expansion joint optimization method based on deep learning, and belongs to the field of microscopic medical imaging, and the method comprises the steps: collecting a clear focusing image for neural network model training and testing; a defocusing phase is calculated according to corresponding optical system parameters, and defocusing blurring simulation is carried out on the clear focusing image; correcting a mask matrix by utilizing learnable aberration, and updating data in a training process to correct out-of-focus aberration; calculating a joint point spread function through the out-of-focus correction mask, and generating an out-of-focus correction image; and training a generative model by using a pair of the defocus correction image and the clear focusing image and a point spread function quality and image quality evaluation loss function, and recovering the optical image with high quality. According to the method, the free surface type of the mask is optimized, an optical physical mechanism is introduced to be fused with an image similarity evaluation function to form a model gradient return loss function, the aberration correction effectiveness of wavefront coding is ensured, and the imaging quality and robustness are improved.

The invention discloses an industrial machine vision-oriented strong backlight environment imaging sharpening system and method. The method comprises the following steps: S10, performing optical coding imaging; s20, carrying out improved L-R iterative recovery and first-stage wavelet denoising; s30, carrying out secondary wavelet denoising and fine recovery; and S40, carrying out iterative convergence and output. According to the invention, a specific wavefront coding optical imaging module and an improved L-R image restoration algorithm module are integrated into a complete visual detection system for solving the problem of industrial strong backlight imaging. In the L-R iteration process, a staged denoising step based on wavelet transformation is introduced, and before each iteration, first-level high-threshold wavelet denoising is carried out on a residual error; and in a specific stage in the iteration process, carrying out secondary middle threshold wavelet denoising on the current estimation image.

The application discloses a high-resolution surface measurement method based on wide-spectrum laser and wavefront coding, which modulates the wavefront phase of a wide-spectrum laser light source, focuses the illumination light of different wavelengths on different heights of the normal direction of the surface of a measured object, receives the light radiation in the mirror normal direction of the normal of the surface of the measured object, determines the wavelength with the highest intensity according to the received light radiation, constructs a spectral dark spot distribution, successively illuminates the sample, performs one or more spectral dark spot positioning, determines the accurate central wavelength, and determines the height of the surface of the measured object according to the central wavelength. The light source uses wide-spectrum laser, so that the system light energy utilization is higher and the phase modulation is easier; the phase modulation is used to modulate the illumination light, which is beneficial to reducing the off-axis difference of the system to obtain higher resolution; and the spectral dark spot positioning method is beneficial to obtaining higher imaging positioning accuracy when the imaging signal is weak.

The utility model provides a camera lens device based on wavefront coding, and belongs to the technical field of optical detection. The camera lens device based on wavefront coding comprises a lens barrel and an industrial camera, the rear end of the lens barrel is connected with the industrial camera, an original infrared lens is installed in the lens barrel, a phase plate is fixed at the front end of the lens barrel, and a diaphragm is arranged between the phase plate and the original infrared lens. A phase plate is added, and the depth of field of the camera is expanded by using an encoding-decoding method, so that the measurement precision of the infrared deflection technology is improved; a wavefront coding method is adopted, so that the system is insensitive to defocus, and coding is realized by adding a phase plate into a camera lens; the phase plate is added, and the depth of field of the lens is expanded, so that in infrared deflection measurement, the camera can clearly image the measured lens and the light source, the position resolution and the angle resolution are improved, and the surface type reconstruction precision is improved.

The application discloses a wavefront coding microscopic system depth of field expansion joint optimization method based on deep learning, and belongs to the field of microscopic medical imaging. The application comprises the following steps: collecting clear focus images for neural network model training and testing; calculating defocus phases according to corresponding optical system parameters, and simulating defocus blur of the clear focus images; using a learnable aberration correction mask matrix, updating data to correct defocus aberration in the training process; calculating a joint point spread function through the defocus correction mask to generate a defocus correction image; using the defocus correction image and the clear focus image pair, and a point spread function quality and image quality evaluation loss function to train a generative model to generate a high-quality optical image. The application optimizes a mask free surface type, introduces an optical physics mechanism to fuse an image similarity evaluation function to form a model gradient back transmission loss function, ensures the effectiveness of wavefront coding aberration correction, and improves the imaging quality and robustness.

The application discloses an extended depth of field wavefront coding imaging system based on a cut-off sine mask. The system comprises a wavefront coding optical device, a detector and an image decoding device. The wavefront coding system introduces a new type of cut-off sine phase mask, and an object displays a coded image on the detector after passing through the wavefront coding optical device, and a clear image is obtained by decoding the coded image through the decoding device. The defocus phase is superimposed on a spatial light modulator to realize defocus measurement, and the method avoids high-precision manual displacement and can effectively expand the depth of field of an optical imaging system. A reflective spatial light modulator is arranged on a Fourier plane of the optical system to realize phase modulation of incident light waves. The system can reduce the center offset of a point spread function while expanding the depth of field range. Compared with a traditional cubic phase mask, the cut-off sine mask has significant advantages in reducing the center position offset, defocus stability and removing artifacts.

The invention provides a visible light near-infrared short wave refraction and reflection type wavefront coding athermalization imaging system, which belongs to the technical field of computer optical imaging, and comprises a primary mirror, a secondary mirror, a first lens, a second lens, an optical filter and a focal plane which are sequentially arranged from an object space to an image space, the primary mirror is used for realizing wavefront coding phase modulation of incident light, the secondary mirror is used for realizing wavefront coding phase modulation of incident light, the first lens and the second lens form a correction mirror group for realizing correction of residual aberration of the primary mirror and the secondary mirror, and the optical filter is used for realizing wavelength selection; and the focal plane is used for realizing imaging. The system is wide in wave band coverage range and covers visible light, near-infrared and short-wave infrared wave bands; the ratio of the total length to the focal length of the system is less than 0.25; the working temperature range is wide, the temperature range is-55 DEG C to + 70 DEG C, a focusing structure is not needed, and the system is miniaturized and light.