41results about How to "Fast image acquisition" patented technology

A device and a process for performing high temporal- and spatial-resolution MR imaging of the anatomy of a patient during intensity modulated radiation therapy (IMRT) to directly measure and control the highly conformal ionizing radiation dose delivered to the patient for the treatment of diseases caused by proliferative tissue disorders. This invention combines the technologies of open MRI, multileaf-collimator or compensating filter-based IMRT delivery, and cobalt teletherapy into a single co-registered and gantry mounted system.

Magnetic field and/or electrical current imaging systems utilizing magneto-optical indicator films (MOIF) based on magneto-optical material with in-plane single easy axis type of magnetic anisotropy provide improved magnetic field resolution and dynamic range with the use of specific illumination conditions. Methods that provide the two-dimensional distribution of the external magnetic field vectors are disclosed together with the methods of extraction of said information. The visualizing systems offer high spatial resolution and/or high magnetic field resolution combined with fast sampling rates and the capability of performing large-area imaging. The applications of such systems include nondestructive testing and damage assessment in metal structures via magnetic materials or induced currents, integrated circuit testing and quality control, general magnetic material and thin film research, permanent magnet quality control, superconductor research and many others.

The disclosure relates to methods and systems for automatically focusing multiple images of one or more objects on a substrate. The methods include obtaining, by a processor, a representative focal distance for a first location on the substrate based on a set of focal distances at known locations on the substrate. The methods also include acquiring, by an image acquisition device, a set of at least two images of the first location. The images are each acquired using a different focal distance at an offset from the representative focal distance. The methods further include estimating, by a processor, an ideal focal distance corresponding to the first location based on comparing a quality of focus for each of the images, and storing the estimated ideal focal distance and the first location in the set of focal distances at known locations.

A system and method for multi-spectral image capture of a first scene includes acquiring a first series of images of the first scene with one or more image acquisition systems and filtering each of the first series of images of the scene with a different non-interference filter, illuminating each image of the first series of images with a different illuminant, or acquiring each of the images of the first series of images with a different image acquisition system. Each of the image acquisition systems has at least one color channel, each of the non-interference filters has a different spectral transmittance, and each of the illuminants has a different spectral power distribution.

Provided are methods and systems for rapid MRI imaging-scanning that provides 2D or 3D coverage, high precision, and high-temporal efficiency, without exceeding SAR limits. In one embodiment, a pulse sequence process is performed that includes a T_1ρ preparation period, followed by a very rapid image acquisition process, which acquires multiple lines of k-space data. The combination of T_1ρ preparation and acquisition of multiple lines of k-space, allows scan times to be shortened by as much as 3- or 4-fold or more, over conventional MRI scanning methods.

The invention discloses a surface defect identification method based on image identification. Image recognition field. The detection of the surface appearance of an object on an existing production and processing assembly line is directly observed by naked eyes, so that the problems of large workload and low working efficiency exist, and the conditions of wrong detection and missed detection are easy to occur. A surface defect identification method based on image identification comprises the following steps: collecting a surface defect image as a sample, and carrying out data expansion; Denoising the surface defect image through a median filtering algorithm; Taking the point with the maximum gray value in the four points around the sampling point in the surface defect image as the gray value of the point, and carrying out scaling processing; Extracting a contour of a defect in the surface defect image and a contour between the surface defect image and a background, converting the graylevel image into a binarized surface defect image, and performing image classification on the binarized surface defect image; The surface defect of the object can be quickly identified, and the identification accuracy is high.

A composite gradient system is described, including a body gradient system and an insert gradient system, in which the body gradient system and the insert gradient system can be driven independently and simultaneously. The composite gradient system can provide an operator with the flexibility of imaging a subject using the body gradient system alone, the insert gradient system alone, or both gradient systems simultaneously, and therefore enjoy the advantages of each gradient system. In some embodiments, the body gradient system and the insert gradient system may be driven concurrently during an imaging sequence to produce composite magnetic field gradients having high amplitude and/or fast slew rate, resulting in high image resolution and/or fast image acquisition. In some embodiments, a subject may be imaged using the body gradient system alone while leaving the insert gradient system in place.

The invention provides a fluorescence microscopy method to generate multi-layer polished sections by utilizing a Fresnel biprism and a device. The device comprises parallel beams, a generating system of polished sections, a sample cell and an image acquisition system. The generating system of polished sections comprises a Fresnel biprism or a system composed of a Fresnel biprism, a telescope system and a phase shifting glass sheet; the sample cell is arranged at the rear part of the Fresnel biprism or at the rear part of the phase shifting glass sheet. As the parallel beams refract after passing through the Fresnel biprism, an interference field is generated in the beam overlaying region behind the prism, thus the light field of multi-layer polished sections is obtained. The invention solves the technical problems of ununiform luminance, small penetration depth of samples and slow rate of image acquisition in the existing mono-layer microscopy technology; the obtained multi-layer polished sections have great penetration depth, can be applied to fluorescence microscopy imaging of living entity samples; and the image acquisition rate is high.

Methods and systems for accurately locating buried defects previously detected by an inspection system are described herein. A physical mark is made on the surface of a wafer near a buried defect detected by an inspection system. In addition, the inspection system accurately measures the distance between the detected defect and the physical mark in at least two dimensions. The wafer, an indication of the nominal location of the mark, and an indication of the distance between the detected defect and the mark are transferred to a material removal tool. The material removal tool (e.g., a focused ion beam (FIB) machining tool) removes material from the surface of the wafer above the buried defect until the buried defect is made visible to an electron-beam based measurement system. The electron-beam based measurement system is subsequently employed to further analyze the defect.

The invention relates to a method for illuminating an object in a digital light microscope, to a digital light microscope, and to a bright field reflected-light illumination device for a digital light microscope. According to the invention, the bright field reflected-light illumination and the dark field reflected-light illumination are configured with light-emitting diodes as light sources and are individually or jointly drivable via a control unit. Both the bright field reflected-light illumination and the dark field reflected-light illumination are configured as “critical” illumination, in which the light source is imaged into the object plane.

The invention belongs to the technical field of power transformer detection, and particularly relates to a thermal image acquisition and communication system based on an infrared imaging power transformer inspection robot. An image acquisition unit is connected with an electrical device. The image acquisition unit is connected with a pre-processing unit. The pre-processing unit is connected with atemperature extraction unit and an image transmission unit. The temperature extraction unit is connected with a microprocessor. The microprocessor is connected with a state display unit. A signal conversion unit is connected with the microprocessor. The signal conversion unit is connected with the image acquisition unit. An operation panel is connected with the microprocessor. The image transmission unit is connected with a mobile terminal. The microprocessor is connected with a communication unit. The communication unit is connected with the mobile terminal. A reset unit is connected with the microprocessor. The thermal image acquisition and communication system provided by the invention has the advantages of simple operation, small operation and maintenance workload, fast image acquisition speed, high processing precision, fast response speed, safe and reliable data transmission and the like, and lays the foundation for the development of image acquisition, processing and transmission technologies of a power transformer.

A slope ecological restoration monitoring method comprises the following steps: S1, slope image data acquisition: acquiring two-dimensional time sequence visible light image data of a slope through an image device; S2, preprocessing the image, primarily screening the image data, and classifying according to the purposes of slope full view overall analysis, slope vegetation detail analysis and slope three-dimensional model reconstruction; and S3, vegetation image data analysis: extracting vegetation horizontal structure parameters through vegetation index inversion of two-dimensional image data, and extracting vegetation vertical structure parameters by reconstructing the three-dimensional model of the two-dimensional image. According to the method, specific and real vegetation evaluation index values can be obtained by using image data, and long-term tracking monitoring is performed on the slope, so that the specific effect and degree of slope ecological restoration can be reflected comprehensively, objectively and quantitatively.

The method first selects up the scan line in turn frmo image, the selected scan line scans each pixel at column scan frequency; the low pass filter whose cut-off frequency is Wn is made for each column pixel; the A/D conversion is made for the signal filtered with low pass filter. By using the invention, the cut-off frequency-Wn is much lower than column scan frequency, the frequency of A/D conversion also much lower than column scan frequency, so that the circuit can implement a high speed image acquisition with a low speed A/D conversion.

The invention pertains to a method of obtaining structural and functional information on proteins, based on polarization fluorescence microscopy, which comprises subjecting a protein tagged with a fluorophore to two- or multi-photon fluorescence microscopy, whereas the observed protein is irradiated with a laser beam with light of at least two different polarizations, which excites the fluorescence of the fluorophore, and wherein information on localization, intensities and polarizations of the fluorescence excited by the different polarizations of the excitation laser beam is used to identify, localize and quantify anisotropy of absorption and/or fluorescence, which information is then used to infer structural and functional properties of proteins. An example of a device for obtaining structural and functional information on proteins, based on polarization fluorescence microscopy, comprises a modulator (P) for rapid modulation of the excitation beam (1) for eliciting two- or multi-photon fluorescence, and a control unit (R), wherein the function of the modulator (P) and control unit (R) is synchronized with scanning of the microscope (M) such that information on fluorescence intensity acquired by the microscope (M) is attributable to a particular polarization state of the excitation beam (1) by virtue of knowing the temporal profile of the polarization modulation of the excitation beam (1) effected by the modulator (P). The method and device of the invention allow determining and monitoring structure and function of proteins, such as membrane proteins, and thereby observing physiological processes in living cells.

The invention provides a rapid land acquisition and demolition method based on ortho-image data. The technology that high-resolution and high-precision ortho-image data is produced based on the aerialsurvey technology of the unmanned aerial vehicle is researched. The land expropriation and demolition application method is simple in obtaining mode, short in production period, high in expressivity,safe and efficient, the geometrical position relation of a project station, a mixing station and a reinforcing steel bar processing factory in the actual geographical environment is truly and visually displayed, and the method has very high guiding significance for compiling and reporting of a temporary construction scheme. The land acquisition and removal period of the temporary construction project is shortened, the workload of technicians is reduced, and the construction efficiency of the temporary construction project is improved.

The embodiment of the invention relates to a device and a method for collecting a three-section construction image of wood. The device comprises: a light source module, configured to emit light to animage collection area on a three-section of the wood to be imaged; an optical imaging module, configured to receive reflected light on the image collection area to generate an optical image of the image collection area; a photoelectric conversion module, configured to convert the optical image into an electrical signal; a Bluetooth module, configured to transmit the electrical signal to a computerdevice; and a power supply module, configured to supply power to the light source module, the optical imaging module, the photoelectric conversion module and the Bluetooth module. Through the device,image collection can be performed on the three-section construction image of the wood can be achieved, and the device has the advantages of high collection speed, high image quality, convenient carrying, etc.

The invention discloses a seed appearance quality detection device and method. The seed appearance quality detection device comprises a touch display, a drawer objective table, a five-channel camera, a matched light source and a host area which form a case frame, the touch display is obliquely embedded in the top of the case frame, the drawer objective table is arranged in the middle of the case frame, the matched light source is arranged above the drawer objective table, a five-channel camera is arranged in the middle of the upper portion of the matched light source and at the bottom of the touch display, an LED backlight plate is arranged below the drawer objective table, and a host area used for power supply and data processing is arranged behind the case frame. According to the method, accurate and intelligent optimization and quality grading of batch seeds are achieved, detection efficiency is improved, data indexes such as the breakage rate, the lesion rate and the impurity rate of the batch seeds are comprehensively and objectively analyzed and judged, practicability is high, screening accuracy is high, automatic detection analysis is achieved, so production enterprises are helped to greatly save the detection cost and improve the seed source quality.