32results about How to "No reduction in lifespan" patented technology

The invention discloses capacitance test circuit and test method under a DC bias condition. The circuit comprises a DC voltage stabilizing power source, an inductor, a diverter switch, a first capacitor, a second capacitor, an impedance tester and a bidirectional diverter switch. The DC voltage stabilizing power source and the inductor are connected in series and then are connected with a capacitor to be tested through the diverter switch; the first capacitor and the second capacitor are connected with the two ends of the capacitor to be tested, and the impedance tester is connected between the first capacitor and the second capacitor through the bidirectional diverter switch. The method comprises: switching on the diverter switch, connecting the bidirectional diverter switch to one end of the second capacitor, and charging the capacitor to a stable value; and then connecting the bidirectional diverter switch to the impedance tester, switching to an impedance test state, adjusting the impedance tester to obtain impedance, and then calculating to obtain the impedance of the capacitor to be tested. According to the invention, a charging process and an impedance test process can be switched, the impedance characteristics with in a wide DC bias scope and a wide frequency scope can be measured, and the impact caused by charging and discharging currents of the capacitor to the impedance tester is eliminated.

The invention discloses a silver paste for a solar energy back passivation PERC battery back electrode. The silver paste is obtained by uniformly mixing silver powder, glass powder and an organic carrier; with a total amount being 100%, the silver paste comprises 55%-70% of the silver powder, 2%-5% of the glass powder and 25%-43% of the organic carrier. According to the silver paste for the solar energy back passivation PERC battery back electrode, the silver paste which is prepared by mixing the silver powder, glass powder and an organic carrier by a specified ratio is adopted; the silver paste is less than 10 [mu]m in fineness, 40-70 Pa.s in viscosity and greater than 4 N in pulling force; the silver paste increases by 1-2 mv in open voltage and increases by 5-10 mA in short current; the silver paste is 0.05%-0.12% greater than a conventional back silver paste in efficiency; the silver pastes is applied to a solar energy back passivation PERC batteries, the silver paste can accurately runs through an SiNx protection layer while not running through an AIOx passivation layer, that minority carrier lifetime of electrode points cannot be reduced can be effectively ensured, the open voltage is improved, and photoelectric conversion efficiency can be of battery sheets can be improved.

The invention discloses an electronic gun special for an electron beam bombardment furnace. The electronic gun is mainly composed of an electronic gun shell, lamp wires, a cathode, a beam-forming electrode assembly, an anode, a beam-forming electrode, a lamp wire head end electrode, a lamp wire tail end electrode, a cathode electrode, an electric reactor, an insulation assembly, insulation coolant oil and a high-voltage cable leading-out head, wherein the lamp wires, the cathode, the beam-forming electrode assembly, the anode, the beam-forming electrode, the lamp wire head end electrode, the lamp wire tail end electrode, the cathode electrode, the electric reactor, the insulation assembly, the insulation coolant oil and the high-voltage cable leading-out head are arranged in the electronic gun shell. The electric reactor which is additionally arranged is composed of an iron core and a winding wound on the iron core. The electric reactor is immersed in the insulation coolant oil. The head end of the winding of the electric reactor is connected with the beam-forming electrode, and the tail end of the winding of the electric reactor is connected with the cathode electrode. The electronic gun can restrain the transition of an electron beam, and therefore the beam passing rate of the electronic gun is improved.

A movable contact member (1) includes a swelling portion (11) that swells in the shape of a dome and can operates reverselywhen pressed, and a skirt portion (12) that is continuously formed from an outer peripheral edge portion (11a) of the swelling portion (11). The skirt portion (12) includes cut-out portions (32) cut out at four portions thereof, portions of the skirt portion (12) except for the cut-out portions (32) form contact portions (52), the cut-out portions (32) of the skirt portion (12) swell toward the swelling portion (11) so that portions of the skirt portion (12) except for the cut-out portions (32) form portions capable of being grounded, and a cut-out face shape (PS) of each of the cut-out portions (32) is a linear shape or a gently curved shape when the skirt portion (12) does not swell. Further, a switch device (201) is formed using the movable contact member (1).

The invention discloses a DC bias feature test circuit and test circuit of a capacitor. The circuit comprises a DC voltage-stabilizing power supply, a test instrument, a first capacitor, a second capacitor, a first switch and a second switch, wherein the first capacitor and the second capacitor are connected in parallel, one end of the DC voltage-stabilizing power supply is connected with one end of the first capacitor and one end of the second capacitor, the other end of the DC voltage-stabilizing power supply is connected with the other end of the first capacitor through the first switch, the other end of the first capacitor is connected with the other end of the second capacitor through the second switch, the test instrument is connected with the two ends of the second switch, and the first capacitor is a capacitor to be tested; and the second capacitor is a capacitor to be tested which has the same structure and performance as the first capacitor or a voltage source with known impedance or a capacitor with known parameters. According to the invention, the problem of testing a capacitor load under DC bias is overcome, measured capacitance data of the DC bias in a high-frequency circuit is particularly accurate and effect, and the measured data does not need complex operation.

The invention provides a method and device for image enhancement of an electronic endoscope. The method changes the output illumination brightness of the light source when two adjacent frames of the camera are imaged, and then synthesizes the two frames of images to realize the high dynamic range image of the endoscope. Enhanced to overcome the blurring of moving target imaging caused by increasing exposure time. According to the method of the present invention, there is provided an electronic endoscope device which realizes an improvement in the dynamic range of an image.

The invention discloses a data transmission scheduling method based on an unequal relay set in a wireless sensor network. The data transmission scheduling method is characterized in that the data transmission scheduling method a defect that same number of relay nodes is selected in a whole network in previous research according to characteristics of high energy consumption by near base stations, low energy consumption by remote base stations, and large amount of residual energy according to energy consumption of the wireless sensor network. According to the data transmission scheduling method, a relatively large number of relay nodes are selected for the node for data transmission at a remote base station area. Along with number increase of the selected relay nodes, waiting time of the node for waking-up of the relay node reduces. Therefore data transmission delay reduction is realized. Furthermore data transmission success rate is improved, and high data transmission reliably is realized. Therefore, compared with an existing method, the data transmission scheduling method has advantages of improving data transmission reliability and reducing data transmission relay on condition that network service does not reduce.

The invention discloses a marking method based on the unequal probabilities during log and migration trace source tracking in a wireless sensor network. According to the method, the unequal marking probabilities are adopted for nodes different distances away from base stations in the wireless sensor network adopting a log and migration trace source tracking strategy; lower marking probabilities are adopted for the nodes of near base station regions, and higher marking probabilities are adopted for the nodes of far base station regions. The marking probabilities of the nodes of the far base station regions are further improved based on existing strategies, the probability that the nodes are marked and the total marking amount of a system can be increased, and accordingly the safety performance of trace source tracking can be improved. The storage capacity of the nodes is not needed to be increased based on increase of the marking probabilities, and the service life of the network is not influenced.