The invention discloses a high-temperature test sorting machine, which comprises a rotating tower taking and releasing module, a transfer cooling module, a high-temperature taking and releasing module, a mobile platform module, a component feeding module, a correction and test station, a finished product output module and an equipment electrical cabinet, the machine is divided into a component releasing area, a normal temperature testing area, a transfer cooling area, a platform moving area, a high temperature testing area, a cooling testing area, a marking sub-plate area, an appearance testing area, a braided tape output area, and the like, thus semiconductor electronic components are on the same high-temperature test sorting machine, through a mechanical taking and releasing mechanism, the processes of normal temperature electrical test, high temperature electrical test, cooling electrical test, laser marking, appearance test, sorting classification, braid packaging and the like arerealized. By implementing the high-temperature test sorting machine, the functions that originally need multiple test devices to complete are integrated on one device to complete, the production efficiency is improved, and the cost is saved.