The invention relates to the technical field of
automatic testing, in particular to an MCU and DSP first sample
verification automatic testing system and method.The MCU and DSP first sample
verification automatic testing system comprises a main
control unit used for receiving a program issued by a console module and loading and storing the program, and it is ensured that the testing program is correctly received and stored; the connection module is used for carrying out
digital signal switching or
analog signal switching; the console module exchanges data with the main control and test unit through the connection module, controls the switch of the power supply module and reads current data; setting waveform measurement parameters, acquiring waveform data, and summarizing, calculating,
processing and storing the waveform data; and the test unit provides a
test point for high-precision measurement, generates sine,
square wave and pulse signals with amplitude and frequency adjustable, superposes the sine,
square wave and pulse signals into the direct-
current voltage, and tests the output waveform of the superposed alternating-current
signal. According to the invention, the
automation degree of first sample
verification after
chip tape-out is improved, the number of first sample verification is increased, and the first sample verification time is shortened.