The invention discloses a method for rapidly adjusting
overprinting offset of main and auxiliary grid patterns, and aims to solve the problems of tedious steps, long time consumption, generation of reworked pieces, high operation difficulty and the like in main and auxiliary grid
overprinting debugging in existing
solar cell screen printing. A plastic battery piece
simulation model consistent with a battery piece produced in a
production line in size is manufactured, and the surface of the plastic battery piece
simulation model is coated with a preset main
grid pattern. By means of the process of screen calibration,
simulation printing and offset debugging and repeated debugging, the offset condition of main grid printing is rapidly determined through a simulation model,
machine parameters are adjusted, and the steps of
drying and auxiliary grid printing in the prior art are omitted. According to the method, the debugging time is shortened to about 3 minutes, no reworked piece is generated, meanwhile, operation is easy and convenient, new employees are easy to master, the efficiency of main and auxiliary grid
overprinting debugging on the
solar cell production line is greatly improved, the production cost is reduced, and remarkable
economic benefits and application prospects are achieved.